Tiny-spacing ABF carrier plate test fixture

Tiny-spacing ABF carrier plate test fixture

The utility model discloses a micro-spacing ABF carrier plate test fixture, which comprises a bottom frame, a base is fixedly arranged above the bottom frame, and a first electric slide rail is arranged above the base; according to the micro-spacing ABF carrier plate test fixture, the base, the firs...

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Hauptverfasser: GUO PENGJUN, ZOU YAN, SU JUNMEI, JIA DONGFANG
Format: Patent
Sprache:chi ; eng
Schlagworte:
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
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creator GUO PENGJUN
ZOU YAN
SU JUNMEI
JIA DONGFANG
description The utility model discloses a micro-spacing ABF carrier plate test fixture, which comprises a bottom frame, a base is fixedly arranged above the bottom frame, and a first electric slide rail is arranged above the base; according to the micro-spacing ABF carrier plate test fixture, the base, the first electric slide rail, the first electric slide block, the second electric slide rail, the second electric slide block, the electric lifting rod, the probe, the test plate and the test holes are arranged, and the plurality of test holes are formed in the test plate, so that the spacing between the minimum two test holes can reach 7 microns; the distance between the two test holes is well controlled, the PASS range is increased, the error test rate is reduced, the tiny distance design is adopted, ABF carrier plate testing can be accurately carried out, the probe can slide through the second electric sliding rail and the second electric sliding block, the ABF carrier plate can be accurately tested in a moving mode, t
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subjects MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
title Tiny-spacing ABF carrier plate test fixture
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