Test carrier for edge impact of large sample
The utility model discloses a test carrier for edge impact of a large sample, which is characterized in that a bottom plate is fixedly connected with an adjusting fixing plate, and connecting holes are distributed on the adjusting fixing plate; the carrying frame comprises a connecting rod, a first...
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creator | LIU YUAN XIA HUA LIU YI DU YANCHUN XU PENG WANG HONGDA LI SHIJUN DENG LINJUAN YE CHAO |
description | The utility model discloses a test carrier for edge impact of a large sample, which is characterized in that a bottom plate is fixedly connected with an adjusting fixing plate, and connecting holes are distributed on the adjusting fixing plate; the carrying frame comprises a connecting rod, a first carrying frame and a second carrying frame, the connecting rod is rotationally connected with the adjusting fixing plate, the first carrying frame is fixedly connected to the right end of the connecting rod, the second carrying frame is fixed to the top of the connecting rod, and the clamp is detachably connected to the top of the first carrying frame and used for fixing a test sample to the first carrying frame; when the first carrying frame is in a horizontal state or in a state that the anticlockwise turning angle alpha is more than 0 and less than or equal to 90 degrees, the first side hole corresponds to one of the plurality of connecting holes; the first locking piece is matched with the first side hole and t |
format | Patent |
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XIA HUA ; LIU YI ; DU YANCHUN ; XU PENG ; WANG HONGDA ; LI SHIJUN ; DENG LINJUAN ; YE CHAO</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_CN221302698UU3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>chi ; eng</language><creationdate>2024</creationdate><topic>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</topic><topic>MEASURING</topic><topic>PHYSICS</topic><topic>TESTING</topic><topic>TESTING STATIC OR DYNAMIC BALANCE OF MACHINES ORSTRUCTURES</topic><topic>TESTING STRUCTURES OR APPARATUS NOT OTHERWISE PROVIDED FOR</topic><toplevel>online_resources</toplevel><creatorcontrib>LIU YUAN</creatorcontrib><creatorcontrib>XIA HUA</creatorcontrib><creatorcontrib>LIU YI</creatorcontrib><creatorcontrib>DU YANCHUN</creatorcontrib><creatorcontrib>XU PENG</creatorcontrib><creatorcontrib>WANG HONGDA</creatorcontrib><creatorcontrib>LI SHIJUN</creatorcontrib><creatorcontrib>DENG LINJUAN</creatorcontrib><creatorcontrib>YE CHAO</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>LIU YUAN</au><au>XIA HUA</au><au>LIU YI</au><au>DU YANCHUN</au><au>XU PENG</au><au>WANG HONGDA</au><au>LI SHIJUN</au><au>DENG LINJUAN</au><au>YE CHAO</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Test carrier for edge impact of large sample</title><date>2024-07-09</date><risdate>2024</risdate><abstract>The utility model discloses a test carrier for edge impact of a large sample, which is characterized in that a bottom plate is fixedly connected with an adjusting fixing plate, and connecting holes are distributed on the adjusting fixing plate; the carrying frame comprises a connecting rod, a first carrying frame and a second carrying frame, the connecting rod is rotationally connected with the adjusting fixing plate, the first carrying frame is fixedly connected to the right end of the connecting rod, the second carrying frame is fixed to the top of the connecting rod, and the clamp is detachably connected to the top of the first carrying frame and used for fixing a test sample to the first carrying frame; when the first carrying frame is in a horizontal state or in a state that the anticlockwise turning angle alpha is more than 0 and less than or equal to 90 degrees, the first side hole corresponds to one of the plurality of connecting holes; the first locking piece is matched with the first side hole and t</abstract><oa>free_for_read</oa></addata></record> |
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language | chi ; eng |
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subjects | INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING PHYSICS TESTING TESTING STATIC OR DYNAMIC BALANCE OF MACHINES ORSTRUCTURES TESTING STRUCTURES OR APPARATUS NOT OTHERWISE PROVIDED FOR |
title | Test carrier for edge impact of large sample |
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