Device for testing high temperature resistance of PPTC (polymeric positive temperature coefficient) chip

Device for testing high temperature resistance of PPTC (polymeric positive temperature coefficient) chip

The utility model discloses a PPTC chip high temperature resistance testing device, and particularly relates to the field of high temperature resistance testing, comprising a box body, an inner cavity of the box body is divided into a test cavity and an equipment cavity through a partition plate, a...

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Hauptverfasser: BIAO QINGXIN, YING XINYUAN, LI FENGJI
Format: Patent
Sprache:chi ; eng
Schlagworte:
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
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creator BIAO QINGXIN
YING XINYUAN
LI FENGJI
description The utility model discloses a PPTC chip high temperature resistance testing device, and particularly relates to the field of high temperature resistance testing, comprising a box body, an inner cavity of the box body is divided into a test cavity and an equipment cavity through a partition plate, a support plate is fixedly connected in the test cavity of the box body, a clamping groove is arranged at the top of the support plate, a support frame is arranged in the middle of the clamping groove, and the support frame is connected with the equipment cavity. A perforated plate and a limiting frame are fixedly connected to the middle of the supporting frame, and a lifting plate is arranged on the top of the supporting plate. According to the utility model, firstly, the air pump is started and is matched with the automatic plugging mechanism, so that high-temperature gas can be conveniently discharged from the interior of the test cavity of the box body, the cooling effect is realized, and the interior of the test
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subjects MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
title Device for testing high temperature resistance of PPTC (polymeric positive temperature coefficient) chip
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