Memory test mainboard and memory test system of inverted memory slot
The utility model discloses a memory test mainboard and a memory test system with an inverted memory slot, the memory test mainboard comprises a mainboard and the memory slot, the mainboard is provided with a front surface and a back surface which are opposite to each other, the front surface is pro...
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creator | ZHAO JIYUN LAI JUNSHENG |
description | The utility model discloses a memory test mainboard and a memory test system with an inverted memory slot, the memory test mainboard comprises a mainboard and the memory slot, the mainboard is provided with a front surface and a back surface which are opposite to each other, the front surface is provided with a plurality of functional modules, and the back surface is provided with the memory slot. The memory test system comprises the memory test mainboard. The back surface of the mainboard is only provided with the memory slot, so that the installation space of the memory incubator is not limited, and the memory incubator and other test equipment are more convenient to install; the convenience of plugging and unplugging is greatly improved, the phenomenon that surrounding parts are collided in the plugging and unplugging process is avoided, and the probability that functional modules on the mainboard are damaged is greatly reduced.
本实用新型公开了一种反置内存插槽的内存测试主板及内存测试系统,所述内存测试主板,包括主板和内存插槽,主板具有相对的正面和背面,正面上设有若干个功能模块,背面 |
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本实用新型公开了一种反置内存插槽的内存测试主板及内存测试系统,所述内存测试主板,包括主板和内存插槽,主板具有相对的正面和背面,正面上设有若干个功能模块,背面</description><language>chi ; eng</language><subject>CALCULATING ; COMPUTING ; COUNTING ; ELECTRIC DIGITAL DATA PROCESSING ; INFORMATION STORAGE ; PHYSICS ; STATIC STORES</subject><creationdate>2024</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20240507&DB=EPODOC&CC=CN&NR=220913915U$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25564,76547</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20240507&DB=EPODOC&CC=CN&NR=220913915U$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>ZHAO JIYUN</creatorcontrib><creatorcontrib>LAI JUNSHENG</creatorcontrib><title>Memory test mainboard and memory test system of inverted memory slot</title><description>The utility model discloses a memory test mainboard and a memory test system with an inverted memory slot, the memory test mainboard comprises a mainboard and the memory slot, the mainboard is provided with a front surface and a back surface which are opposite to each other, the front surface is provided with a plurality of functional modules, and the back surface is provided with the memory slot. The memory test system comprises the memory test mainboard. The back surface of the mainboard is only provided with the memory slot, so that the installation space of the memory incubator is not limited, and the memory incubator and other test equipment are more convenient to install; the convenience of plugging and unplugging is greatly improved, the phenomenon that surrounding parts are collided in the plugging and unplugging process is avoided, and the probability that functional modules on the mainboard are damaged is greatly reduced.
本实用新型公开了一种反置内存插槽的内存测试主板及内存测试系统,所述内存测试主板,包括主板和内存插槽,主板具有相对的正面和背面,正面上设有若干个功能模块,背面</description><subject>CALCULATING</subject><subject>COMPUTING</subject><subject>COUNTING</subject><subject>ELECTRIC DIGITAL DATA PROCESSING</subject><subject>INFORMATION STORAGE</subject><subject>PHYSICS</subject><subject>STATIC STORES</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2024</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZHDxTc3NL6pUKEktLlHITczMS8pPLEpRSMxLUchFkimuLC5JzVXIT1PIzCtLLSpJhUsX5-SX8DCwpiXmFKfyQmluBiU31xBnD93Ugvz41OKCxOTUvNSSeGc_IyMDS0NjS0PT0FBjohQBAD_5M-c</recordid><startdate>20240507</startdate><enddate>20240507</enddate><creator>ZHAO JIYUN</creator><creator>LAI JUNSHENG</creator><scope>EVB</scope></search><sort><creationdate>20240507</creationdate><title>Memory test mainboard and memory test system of inverted memory slot</title><author>ZHAO JIYUN ; LAI JUNSHENG</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_CN220913915UU3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>chi ; eng</language><creationdate>2024</creationdate><topic>CALCULATING</topic><topic>COMPUTING</topic><topic>COUNTING</topic><topic>ELECTRIC DIGITAL DATA PROCESSING</topic><topic>INFORMATION STORAGE</topic><topic>PHYSICS</topic><topic>STATIC STORES</topic><toplevel>online_resources</toplevel><creatorcontrib>ZHAO JIYUN</creatorcontrib><creatorcontrib>LAI JUNSHENG</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>ZHAO JIYUN</au><au>LAI JUNSHENG</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Memory test mainboard and memory test system of inverted memory slot</title><date>2024-05-07</date><risdate>2024</risdate><abstract>The utility model discloses a memory test mainboard and a memory test system with an inverted memory slot, the memory test mainboard comprises a mainboard and the memory slot, the mainboard is provided with a front surface and a back surface which are opposite to each other, the front surface is provided with a plurality of functional modules, and the back surface is provided with the memory slot. The memory test system comprises the memory test mainboard. The back surface of the mainboard is only provided with the memory slot, so that the installation space of the memory incubator is not limited, and the memory incubator and other test equipment are more convenient to install; the convenience of plugging and unplugging is greatly improved, the phenomenon that surrounding parts are collided in the plugging and unplugging process is avoided, and the probability that functional modules on the mainboard are damaged is greatly reduced.
本实用新型公开了一种反置内存插槽的内存测试主板及内存测试系统,所述内存测试主板,包括主板和内存插槽,主板具有相对的正面和背面,正面上设有若干个功能模块,背面</abstract><oa>free_for_read</oa></addata></record> |
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language | chi ; eng |
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subjects | CALCULATING COMPUTING COUNTING ELECTRIC DIGITAL DATA PROCESSING INFORMATION STORAGE PHYSICS STATIC STORES |
title | Memory test mainboard and memory test system of inverted memory slot |
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