Memory test mainboard and memory test system of inverted memory slot

The utility model discloses a memory test mainboard and a memory test system with an inverted memory slot, the memory test mainboard comprises a mainboard and the memory slot, the mainboard is provided with a front surface and a back surface which are opposite to each other, the front surface is pro...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Hauptverfasser: ZHAO JIYUN, LAI JUNSHENG
Format: Patent
Sprache:chi ; eng
Schlagworte:
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
container_end_page
container_issue
container_start_page
container_title
container_volume
creator ZHAO JIYUN
LAI JUNSHENG
description The utility model discloses a memory test mainboard and a memory test system with an inverted memory slot, the memory test mainboard comprises a mainboard and the memory slot, the mainboard is provided with a front surface and a back surface which are opposite to each other, the front surface is provided with a plurality of functional modules, and the back surface is provided with the memory slot. The memory test system comprises the memory test mainboard. The back surface of the mainboard is only provided with the memory slot, so that the installation space of the memory incubator is not limited, and the memory incubator and other test equipment are more convenient to install; the convenience of plugging and unplugging is greatly improved, the phenomenon that surrounding parts are collided in the plugging and unplugging process is avoided, and the probability that functional modules on the mainboard are damaged is greatly reduced. 本实用新型公开了一种反置内存插槽的内存测试主板及内存测试系统,所述内存测试主板,包括主板和内存插槽,主板具有相对的正面和背面,正面上设有若干个功能模块,背面
format Patent
fullrecord <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_CN220913915UU</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>CN220913915UU</sourcerecordid><originalsourceid>FETCH-epo_espacenet_CN220913915UU3</originalsourceid><addsrcrecordid>eNrjZHDxTc3NL6pUKEktLlHITczMS8pPLEpRSMxLUchFkimuLC5JzVXIT1PIzCtLLSpJhUsX5-SX8DCwpiXmFKfyQmluBiU31xBnD93Ugvz41OKCxOTUvNSSeGc_IyMDS0NjS0PT0FBjohQBAD_5M-c</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>Memory test mainboard and memory test system of inverted memory slot</title><source>esp@cenet</source><creator>ZHAO JIYUN ; LAI JUNSHENG</creator><creatorcontrib>ZHAO JIYUN ; LAI JUNSHENG</creatorcontrib><description>The utility model discloses a memory test mainboard and a memory test system with an inverted memory slot, the memory test mainboard comprises a mainboard and the memory slot, the mainboard is provided with a front surface and a back surface which are opposite to each other, the front surface is provided with a plurality of functional modules, and the back surface is provided with the memory slot. The memory test system comprises the memory test mainboard. The back surface of the mainboard is only provided with the memory slot, so that the installation space of the memory incubator is not limited, and the memory incubator and other test equipment are more convenient to install; the convenience of plugging and unplugging is greatly improved, the phenomenon that surrounding parts are collided in the plugging and unplugging process is avoided, and the probability that functional modules on the mainboard are damaged is greatly reduced. 本实用新型公开了一种反置内存插槽的内存测试主板及内存测试系统,所述内存测试主板,包括主板和内存插槽,主板具有相对的正面和背面,正面上设有若干个功能模块,背面</description><language>chi ; eng</language><subject>CALCULATING ; COMPUTING ; COUNTING ; ELECTRIC DIGITAL DATA PROCESSING ; INFORMATION STORAGE ; PHYSICS ; STATIC STORES</subject><creationdate>2024</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20240507&amp;DB=EPODOC&amp;CC=CN&amp;NR=220913915U$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25564,76547</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20240507&amp;DB=EPODOC&amp;CC=CN&amp;NR=220913915U$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>ZHAO JIYUN</creatorcontrib><creatorcontrib>LAI JUNSHENG</creatorcontrib><title>Memory test mainboard and memory test system of inverted memory slot</title><description>The utility model discloses a memory test mainboard and a memory test system with an inverted memory slot, the memory test mainboard comprises a mainboard and the memory slot, the mainboard is provided with a front surface and a back surface which are opposite to each other, the front surface is provided with a plurality of functional modules, and the back surface is provided with the memory slot. The memory test system comprises the memory test mainboard. The back surface of the mainboard is only provided with the memory slot, so that the installation space of the memory incubator is not limited, and the memory incubator and other test equipment are more convenient to install; the convenience of plugging and unplugging is greatly improved, the phenomenon that surrounding parts are collided in the plugging and unplugging process is avoided, and the probability that functional modules on the mainboard are damaged is greatly reduced. 本实用新型公开了一种反置内存插槽的内存测试主板及内存测试系统,所述内存测试主板,包括主板和内存插槽,主板具有相对的正面和背面,正面上设有若干个功能模块,背面</description><subject>CALCULATING</subject><subject>COMPUTING</subject><subject>COUNTING</subject><subject>ELECTRIC DIGITAL DATA PROCESSING</subject><subject>INFORMATION STORAGE</subject><subject>PHYSICS</subject><subject>STATIC STORES</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2024</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZHDxTc3NL6pUKEktLlHITczMS8pPLEpRSMxLUchFkimuLC5JzVXIT1PIzCtLLSpJhUsX5-SX8DCwpiXmFKfyQmluBiU31xBnD93Ugvz41OKCxOTUvNSSeGc_IyMDS0NjS0PT0FBjohQBAD_5M-c</recordid><startdate>20240507</startdate><enddate>20240507</enddate><creator>ZHAO JIYUN</creator><creator>LAI JUNSHENG</creator><scope>EVB</scope></search><sort><creationdate>20240507</creationdate><title>Memory test mainboard and memory test system of inverted memory slot</title><author>ZHAO JIYUN ; LAI JUNSHENG</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_CN220913915UU3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>chi ; eng</language><creationdate>2024</creationdate><topic>CALCULATING</topic><topic>COMPUTING</topic><topic>COUNTING</topic><topic>ELECTRIC DIGITAL DATA PROCESSING</topic><topic>INFORMATION STORAGE</topic><topic>PHYSICS</topic><topic>STATIC STORES</topic><toplevel>online_resources</toplevel><creatorcontrib>ZHAO JIYUN</creatorcontrib><creatorcontrib>LAI JUNSHENG</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>ZHAO JIYUN</au><au>LAI JUNSHENG</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Memory test mainboard and memory test system of inverted memory slot</title><date>2024-05-07</date><risdate>2024</risdate><abstract>The utility model discloses a memory test mainboard and a memory test system with an inverted memory slot, the memory test mainboard comprises a mainboard and the memory slot, the mainboard is provided with a front surface and a back surface which are opposite to each other, the front surface is provided with a plurality of functional modules, and the back surface is provided with the memory slot. The memory test system comprises the memory test mainboard. The back surface of the mainboard is only provided with the memory slot, so that the installation space of the memory incubator is not limited, and the memory incubator and other test equipment are more convenient to install; the convenience of plugging and unplugging is greatly improved, the phenomenon that surrounding parts are collided in the plugging and unplugging process is avoided, and the probability that functional modules on the mainboard are damaged is greatly reduced. 本实用新型公开了一种反置内存插槽的内存测试主板及内存测试系统,所述内存测试主板,包括主板和内存插槽,主板具有相对的正面和背面,正面上设有若干个功能模块,背面</abstract><oa>free_for_read</oa></addata></record>
fulltext fulltext_linktorsrc
identifier
ispartof
issn
language chi ; eng
recordid cdi_epo_espacenet_CN220913915UU
source esp@cenet
subjects CALCULATING
COMPUTING
COUNTING
ELECTRIC DIGITAL DATA PROCESSING
INFORMATION STORAGE
PHYSICS
STATIC STORES
title Memory test mainboard and memory test system of inverted memory slot
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-06T09%3A05%3A08IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=ZHAO%20JIYUN&rft.date=2024-05-07&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3ECN220913915UU%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true