Micrometer detection tool
The utility model discloses a micrometer detection tool, which belongs to the technical field of circuit board detection and comprises a plane supporting plate, an opening is arranged on the upper surface of the plane supporting plate, a sliding shell is slidably mounted on the upper surface of the...
Gespeichert in:
Hauptverfasser: | , |
---|---|
Format: | Patent |
Sprache: | chi ; eng |
Schlagworte: | |
Online-Zugang: | Volltext bestellen |
Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
container_end_page | |
---|---|
container_issue | |
container_start_page | |
container_title | |
container_volume | |
creator | NOH SUN-YONG DENG HUAN |
description | The utility model discloses a micrometer detection tool, which belongs to the technical field of circuit board detection and comprises a plane supporting plate, an opening is arranged on the upper surface of the plane supporting plate, a sliding shell is slidably mounted on the upper surface of the plane supporting plate, a first rotating shaft is rotatably mounted in the sliding shell, and a second rotating shaft is rotatably mounted in the first rotating shaft. A gear is fixedly mounted on the outer surface of the first rotating shaft; the sliding shell is arranged to be used in cooperation with the clamping plates, the two clamping plates are used for fixing and clamping a circuit board workpiece, the sliding shell can move front and back, then the clamped circuit board is driven to move front and back, and the fixing support can drive the micrometer to move left and right. Therefore, multi-point measurement can be carried out on the circuit board at the front-back position and the left-right position, det |
format | Patent |
fullrecord | <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_CN220853372UU</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>CN220853372UU</sourcerecordid><originalsourceid>FETCH-epo_espacenet_CN220853372UU3</originalsourceid><addsrcrecordid>eNrjZJD0zUwuys9NLUktUkgBksklmfl5CiX5-Tk8DKxpiTnFqbxQmptByc01xNlDN7UgPz61uCAxOTUvtSTe2c_IyMDC1NjY3Cg01JgoRQB_cyOo</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>Micrometer detection tool</title><source>esp@cenet</source><creator>NOH SUN-YONG ; DENG HUAN</creator><creatorcontrib>NOH SUN-YONG ; DENG HUAN</creatorcontrib><description>The utility model discloses a micrometer detection tool, which belongs to the technical field of circuit board detection and comprises a plane supporting plate, an opening is arranged on the upper surface of the plane supporting plate, a sliding shell is slidably mounted on the upper surface of the plane supporting plate, a first rotating shaft is rotatably mounted in the sliding shell, and a second rotating shaft is rotatably mounted in the first rotating shaft. A gear is fixedly mounted on the outer surface of the first rotating shaft; the sliding shell is arranged to be used in cooperation with the clamping plates, the two clamping plates are used for fixing and clamping a circuit board workpiece, the sliding shell can move front and back, then the clamped circuit board is driven to move front and back, and the fixing support can drive the micrometer to move left and right. Therefore, multi-point measurement can be carried out on the circuit board at the front-back position and the left-right position, det</description><language>chi ; eng</language><subject>MEASURING ; MEASURING ANGLES ; MEASURING AREAS ; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS ; MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS ; PHYSICS ; TESTING</subject><creationdate>2024</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20240426&DB=EPODOC&CC=CN&NR=220853372U$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25542,76290</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20240426&DB=EPODOC&CC=CN&NR=220853372U$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>NOH SUN-YONG</creatorcontrib><creatorcontrib>DENG HUAN</creatorcontrib><title>Micrometer detection tool</title><description>The utility model discloses a micrometer detection tool, which belongs to the technical field of circuit board detection and comprises a plane supporting plate, an opening is arranged on the upper surface of the plane supporting plate, a sliding shell is slidably mounted on the upper surface of the plane supporting plate, a first rotating shaft is rotatably mounted in the sliding shell, and a second rotating shaft is rotatably mounted in the first rotating shaft. A gear is fixedly mounted on the outer surface of the first rotating shaft; the sliding shell is arranged to be used in cooperation with the clamping plates, the two clamping plates are used for fixing and clamping a circuit board workpiece, the sliding shell can move front and back, then the clamped circuit board is driven to move front and back, and the fixing support can drive the micrometer to move left and right. Therefore, multi-point measurement can be carried out on the circuit board at the front-back position and the left-right position, det</description><subject>MEASURING</subject><subject>MEASURING ANGLES</subject><subject>MEASURING AREAS</subject><subject>MEASURING IRREGULARITIES OF SURFACES OR CONTOURS</subject><subject>MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2024</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZJD0zUwuys9NLUktUkgBksklmfl5CiX5-Tk8DKxpiTnFqbxQmptByc01xNlDN7UgPz61uCAxOTUvtSTe2c_IyMDC1NjY3Cg01JgoRQB_cyOo</recordid><startdate>20240426</startdate><enddate>20240426</enddate><creator>NOH SUN-YONG</creator><creator>DENG HUAN</creator><scope>EVB</scope></search><sort><creationdate>20240426</creationdate><title>Micrometer detection tool</title><author>NOH SUN-YONG ; DENG HUAN</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_CN220853372UU3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>chi ; eng</language><creationdate>2024</creationdate><topic>MEASURING</topic><topic>MEASURING ANGLES</topic><topic>MEASURING AREAS</topic><topic>MEASURING IRREGULARITIES OF SURFACES OR CONTOURS</topic><topic>MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>NOH SUN-YONG</creatorcontrib><creatorcontrib>DENG HUAN</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>NOH SUN-YONG</au><au>DENG HUAN</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Micrometer detection tool</title><date>2024-04-26</date><risdate>2024</risdate><abstract>The utility model discloses a micrometer detection tool, which belongs to the technical field of circuit board detection and comprises a plane supporting plate, an opening is arranged on the upper surface of the plane supporting plate, a sliding shell is slidably mounted on the upper surface of the plane supporting plate, a first rotating shaft is rotatably mounted in the sliding shell, and a second rotating shaft is rotatably mounted in the first rotating shaft. A gear is fixedly mounted on the outer surface of the first rotating shaft; the sliding shell is arranged to be used in cooperation with the clamping plates, the two clamping plates are used for fixing and clamping a circuit board workpiece, the sliding shell can move front and back, then the clamped circuit board is driven to move front and back, and the fixing support can drive the micrometer to move left and right. Therefore, multi-point measurement can be carried out on the circuit board at the front-back position and the left-right position, det</abstract><oa>free_for_read</oa></addata></record> |
fulltext | fulltext_linktorsrc |
identifier | |
ispartof | |
issn | |
language | chi ; eng |
recordid | cdi_epo_espacenet_CN220853372UU |
source | esp@cenet |
subjects | MEASURING MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS PHYSICS TESTING |
title | Micrometer detection tool |
url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-30T23%3A03%3A20IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=NOH%20SUN-YONG&rft.date=2024-04-26&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3ECN220853372UU%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true |