Adjusting mechanism for fixing nondestructive inspection radiation source
The utility model discloses an adjusting mechanism, belongs to the technical field of flaw detection radiation sources, and particularly relates to an adjusting mechanism for fixing a nondestructive flaw detection radiation source, which comprises a supporting part, a rotating part and a multi-angle...
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| creator | HUANG CHENG LIU BIN ZHANG HONGWEI WANG XIAOJIA LI YEBO BI XIAONAN YU YANG DIAO ZHIFENG CHENG LI GU YUANZE |
| description | The utility model discloses an adjusting mechanism, belongs to the technical field of flaw detection radiation sources, and particularly relates to an adjusting mechanism for fixing a nondestructive flaw detection radiation source, which comprises a supporting part, a rotating part and a multi-angle adjusting part, the rotating part is movably mounted on the supporting part; the multi-angle adjusting part is movably mounted on the rotating part; the height of the whole flaw detection ray device can be adjusted through the supporting part, the direction of the whole flaw detection ray device is adjusted through the rotating part, and the angle of the whole flaw detection ray device is adjusted through the multi-angle adjusting part, so that simultaneous adjustment of different heights, directions and angles can be realized; the device can be suitable for different flaw detection occasions, so that the applicability is high, and the detection efficiency can be improved.
本实用新型公开了一种调节机构，属于探伤射线源技术领域，具体涉及一种用于无损探伤射线 |
| format | Patent |
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本实用新型公开了一种调节机构，属于探伤射线源技术领域，具体涉及一种用于无损探伤射线</description><language>chi ; eng</language><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES ; MEASURING ; PHYSICS ; TESTING</subject><creationdate>2024</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20240409&DB=EPODOC&CC=CN&NR=220751992U$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25564,76547</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20240409&DB=EPODOC&CC=CN&NR=220751992U$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>HUANG CHENG</creatorcontrib><creatorcontrib>LIU BIN</creatorcontrib><creatorcontrib>ZHANG HONGWEI</creatorcontrib><creatorcontrib>WANG XIAOJIA</creatorcontrib><creatorcontrib>LI YEBO</creatorcontrib><creatorcontrib>BI XIAONAN</creatorcontrib><creatorcontrib>YU YANG</creatorcontrib><creatorcontrib>DIAO ZHIFENG</creatorcontrib><creatorcontrib>CHENG LI</creatorcontrib><creatorcontrib>GU YUANZE</creatorcontrib><title>Adjusting mechanism for fixing nondestructive inspection radiation source</title><description>The utility model discloses an adjusting mechanism, belongs to the technical field of flaw detection radiation sources, and particularly relates to an adjusting mechanism for fixing a nondestructive flaw detection radiation source, which comprises a supporting part, a rotating part and a multi-angle adjusting part, the rotating part is movably mounted on the supporting part; the multi-angle adjusting part is movably mounted on the rotating part; the height of the whole flaw detection ray device can be adjusted through the supporting part, the direction of the whole flaw detection ray device is adjusted through the rotating part, and the angle of the whole flaw detection ray device is adjusted through the multi-angle adjusting part, so that simultaneous adjustment of different heights, directions and angles can be realized; the device can be suitable for different flaw detection occasions, so that the applicability is high, and the detection efficiency can be improved.
本实用新型公开了一种调节机构，属于探伤射线源技术领域，具体涉及一种用于无损探伤射线</description><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</subject><subject>MEASURING</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2024</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZPB0TMkqLS7JzEtXyE1NzkjMyyzOVUjLL1JIy6wACebl56WkFpcUlSaXZJalKmTmFRekApn5eQpFiSmZiWBWcX5pUXIqDwNrWmJOcSovlOZmUHJzDXH20E0tyI9PLS5ITE7NSy2Jd_YzMjIwNzW0tDQKDTUmShEA1QQ2nQ</recordid><startdate>20240409</startdate><enddate>20240409</enddate><creator>HUANG CHENG</creator><creator>LIU BIN</creator><creator>ZHANG HONGWEI</creator><creator>WANG XIAOJIA</creator><creator>LI YEBO</creator><creator>BI XIAONAN</creator><creator>YU YANG</creator><creator>DIAO ZHIFENG</creator><creator>CHENG LI</creator><creator>GU YUANZE</creator><scope>EVB</scope></search><sort><creationdate>20240409</creationdate><title>Adjusting mechanism for fixing nondestructive inspection radiation source</title><author>HUANG CHENG ; LIU BIN ; ZHANG HONGWEI ; WANG XIAOJIA ; LI YEBO ; BI XIAONAN ; YU YANG ; DIAO ZHIFENG ; CHENG LI ; GU YUANZE</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_CN220751992UU3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>chi ; eng</language><creationdate>2024</creationdate><topic>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</topic><topic>MEASURING</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>HUANG CHENG</creatorcontrib><creatorcontrib>LIU BIN</creatorcontrib><creatorcontrib>ZHANG HONGWEI</creatorcontrib><creatorcontrib>WANG XIAOJIA</creatorcontrib><creatorcontrib>LI YEBO</creatorcontrib><creatorcontrib>BI XIAONAN</creatorcontrib><creatorcontrib>YU YANG</creatorcontrib><creatorcontrib>DIAO ZHIFENG</creatorcontrib><creatorcontrib>CHENG LI</creatorcontrib><creatorcontrib>GU YUANZE</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>HUANG CHENG</au><au>LIU BIN</au><au>ZHANG HONGWEI</au><au>WANG XIAOJIA</au><au>LI YEBO</au><au>BI XIAONAN</au><au>YU YANG</au><au>DIAO ZHIFENG</au><au>CHENG LI</au><au>GU YUANZE</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Adjusting mechanism for fixing nondestructive inspection radiation source</title><date>2024-04-09</date><risdate>2024</risdate><abstract>The utility model discloses an adjusting mechanism, belongs to the technical field of flaw detection radiation sources, and particularly relates to an adjusting mechanism for fixing a nondestructive flaw detection radiation source, which comprises a supporting part, a rotating part and a multi-angle adjusting part, the rotating part is movably mounted on the supporting part; the multi-angle adjusting part is movably mounted on the rotating part; the height of the whole flaw detection ray device can be adjusted through the supporting part, the direction of the whole flaw detection ray device is adjusted through the rotating part, and the angle of the whole flaw detection ray device is adjusted through the multi-angle adjusting part, so that simultaneous adjustment of different heights, directions and angles can be realized; the device can be suitable for different flaw detection occasions, so that the applicability is high, and the detection efficiency can be improved.
本实用新型公开了一种调节机构，属于探伤射线源技术领域，具体涉及一种用于无损探伤射线</abstract><oa>free_for_read</oa></addata></record> |
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| subjects | INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING PHYSICS TESTING |
| title | Adjusting mechanism for fixing nondestructive inspection radiation source |
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