LED chip aging test device

LED chip aging test device

The utility model discloses an LED chip aging test device, which comprises a bottom box, an N-shaped frame is welded on the baking rear side of the top of the bottom box, a rod frame is transversely arranged on the top of the N-shaped frame in a sliding manner, an electric telescopic rod is mounted...

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Hauptverfasser: HE XIJIANG, HE XISHAN
Format: Patent
Sprache:chi ; eng
Schlagworte:
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
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creator HE XIJIANG
HE XISHAN
description The utility model discloses an LED chip aging test device, which comprises a bottom box, an N-shaped frame is welded on the baking rear side of the top of the bottom box, a rod frame is transversely arranged on the top of the N-shaped frame in a sliding manner, an electric telescopic rod is mounted in the rod frame, the movable end of the electric telescopic rod is positioned below the rod frame and is provided with a lifting plate, and the lifting plate is connected with the N-shaped frame. The bottom of the lifting plate is detachably provided with a connecting block, and the bottom of the connecting block is provided with an aging seat upper seat. According to the LED chip aging test device, the two lower aging bases are arranged on the left side and the right side, the two lower aging bases are used alternately, when one lower aging base is used for chip testing, the other lower aging base is located on the front side, a worker can carry out chip feeding and discharging operation on the lower aging base,
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The bottom of the lifting plate is detachably provided with a connecting block, and the bottom of the connecting block is provided with an aging seat upper seat. 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subjects MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
title LED chip aging test device
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