Automatic test equipment for low-temperature device

The utility model discloses a low-temperature device automatic test equipment, including base and low-temperature test equipment body fixedly installed on the surface of base, the inside of base is provided with adjusting plate in a sliding manner, the output end of a double-shaft motor rotates forw...

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Hauptverfasser: HU YINWU, SUN KAI, CHENG QIHANG
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creator HU YINWU
SUN KAI
CHENG QIHANG
description The utility model discloses a low-temperature device automatic test equipment, including base and low-temperature test equipment body fixedly installed on the surface of base, the inside of base is provided with adjusting plate in a sliding manner, the output end of a double-shaft motor rotates forward to drive two sets of threaded rods to rotate, then two sets of threaded sleeves move towards the opposite side, and the low-temperature test equipment body is fixed on the base. A first movable shell is arranged on the base, so that a connecting plate drives an adjusting rod in the first movable shell to be downwards supported, an adjusting plate and buffer moving assemblies on the adjusting plate are supported, the four buffer moving assemblies extend out of the base, and therefore the device can be conveniently moved through cooperation of universal wheels in the four buffer moving assemblies; the two sets of threaded sleeves move towards the opposite sides, then universal wheels in the four sets of buffer mo
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fullrecord <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_CN220188403UU</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>CN220188403UU</sourcerecordid><originalsourceid>FETCH-epo_espacenet_CN220188403UU3</originalsourceid><addsrcrecordid>eNrjZDB2LC3Jz00syUxWKEktLlFILSzNLMhNzStRSMsvUsjJL9ctSc0tSC1KLCktSlVISS3LTE7lYWBNS8wpTuWF0twMSm6uIc4euqkF-fGpxQWJyal5qSXxzn5GRgaGFhYmBsahocZEKQIAkEctqQ</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>Automatic test equipment for low-temperature device</title><source>esp@cenet</source><creator>HU YINWU ; SUN KAI ; CHENG QIHANG</creator><creatorcontrib>HU YINWU ; SUN KAI ; CHENG QIHANG</creatorcontrib><description>The utility model discloses a low-temperature device automatic test equipment, including base and low-temperature test equipment body fixedly installed on the surface of base, the inside of base is provided with adjusting plate in a sliding manner, the output end of a double-shaft motor rotates forward to drive two sets of threaded rods to rotate, then two sets of threaded sleeves move towards the opposite side, and the low-temperature test equipment body is fixed on the base. A first movable shell is arranged on the base, so that a connecting plate drives an adjusting rod in the first movable shell to be downwards supported, an adjusting plate and buffer moving assemblies on the adjusting plate are supported, the four buffer moving assemblies extend out of the base, and therefore the device can be conveniently moved through cooperation of universal wheels in the four buffer moving assemblies; the two sets of threaded sleeves move towards the opposite sides, then universal wheels in the four sets of buffer mo</description><language>chi ; eng</language><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES ; MEASURING ; PHYSICS ; TESTING</subject><creationdate>2023</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20231215&amp;DB=EPODOC&amp;CC=CN&amp;NR=220188403U$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25564,76547</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20231215&amp;DB=EPODOC&amp;CC=CN&amp;NR=220188403U$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>HU YINWU</creatorcontrib><creatorcontrib>SUN KAI</creatorcontrib><creatorcontrib>CHENG QIHANG</creatorcontrib><title>Automatic test equipment for low-temperature device</title><description>The utility model discloses a low-temperature device automatic test equipment, including base and low-temperature test equipment body fixedly installed on the surface of base, the inside of base is provided with adjusting plate in a sliding manner, the output end of a double-shaft motor rotates forward to drive two sets of threaded rods to rotate, then two sets of threaded sleeves move towards the opposite side, and the low-temperature test equipment body is fixed on the base. A first movable shell is arranged on the base, so that a connecting plate drives an adjusting rod in the first movable shell to be downwards supported, an adjusting plate and buffer moving assemblies on the adjusting plate are supported, the four buffer moving assemblies extend out of the base, and therefore the device can be conveniently moved through cooperation of universal wheels in the four buffer moving assemblies; the two sets of threaded sleeves move towards the opposite sides, then universal wheels in the four sets of buffer mo</description><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</subject><subject>MEASURING</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2023</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZDB2LC3Jz00syUxWKEktLlFILSzNLMhNzStRSMsvUsjJL9ctSc0tSC1KLCktSlVISS3LTE7lYWBNS8wpTuWF0twMSm6uIc4euqkF-fGpxQWJyal5qSXxzn5GRgaGFhYmBsahocZEKQIAkEctqQ</recordid><startdate>20231215</startdate><enddate>20231215</enddate><creator>HU YINWU</creator><creator>SUN KAI</creator><creator>CHENG QIHANG</creator><scope>EVB</scope></search><sort><creationdate>20231215</creationdate><title>Automatic test equipment for low-temperature device</title><author>HU YINWU ; SUN KAI ; CHENG QIHANG</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_CN220188403UU3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>chi ; eng</language><creationdate>2023</creationdate><topic>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</topic><topic>MEASURING</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>HU YINWU</creatorcontrib><creatorcontrib>SUN KAI</creatorcontrib><creatorcontrib>CHENG QIHANG</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>HU YINWU</au><au>SUN KAI</au><au>CHENG QIHANG</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Automatic test equipment for low-temperature device</title><date>2023-12-15</date><risdate>2023</risdate><abstract>The utility model discloses a low-temperature device automatic test equipment, including base and low-temperature test equipment body fixedly installed on the surface of base, the inside of base is provided with adjusting plate in a sliding manner, the output end of a double-shaft motor rotates forward to drive two sets of threaded rods to rotate, then two sets of threaded sleeves move towards the opposite side, and the low-temperature test equipment body is fixed on the base. A first movable shell is arranged on the base, so that a connecting plate drives an adjusting rod in the first movable shell to be downwards supported, an adjusting plate and buffer moving assemblies on the adjusting plate are supported, the four buffer moving assemblies extend out of the base, and therefore the device can be conveniently moved through cooperation of universal wheels in the four buffer moving assemblies; the two sets of threaded sleeves move towards the opposite sides, then universal wheels in the four sets of buffer mo</abstract><oa>free_for_read</oa></addata></record>
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subjects INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
PHYSICS
TESTING
title Automatic test equipment for low-temperature device
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2024-12-24T19%3A08%3A40IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=HU%20YINWU&rft.date=2023-12-15&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3ECN220188403UU%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true