Phenotype measuring device for elymus grains
The utility model discloses a phenotype measuring device for elymus grains, and relates to the technical field of measuring devices. A phenotype measuring device for elymus grains comprises a lower box body provided with an upper cover, and further comprises a light source component arranged in the...
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| creator | TANG LIUBAN QIU YONGSEN WANG HUIZHI LIAO HAOQIN XIE WENGANG LU HUANHUAN ZHENG YUYING |
| description | The utility model discloses a phenotype measuring device for elymus grains, and relates to the technical field of measuring devices. A phenotype measuring device for elymus grains comprises a lower box body provided with an upper cover, and further comprises a light source component arranged in the lower box body and used for distinguishing the fullness degree of the grains; the image acquisition equipment is arranged in the lower box body and is used for acquiring the shapes of the grains on the light source part; the clamping component is connected in the lower box body and is used for clamping the image acquisition equipment; the elymus grains are placed on the backlight plate in batches, the light source of the backlight plate is utilized to irradiate the elymus grains, so that the elymus grains are clearer, higher in resolution ratio and more accurate in measurement under the image acquisition equipment, and the equipment is mounted in the lower box body, so that the size of the measuring device is reduc |
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A phenotype measuring device for elymus grains comprises a lower box body provided with an upper cover, and further comprises a light source component arranged in the lower box body and used for distinguishing the fullness degree of the grains; the image acquisition equipment is arranged in the lower box body and is used for acquiring the shapes of the grains on the light source part; the clamping component is connected in the lower box body and is used for clamping the image acquisition equipment; the elymus grains are placed on the backlight plate in batches, the light source of the backlight plate is utilized to irradiate the elymus grains, so that the elymus grains are clearer, higher in resolution ratio and more accurate in measurement under the image acquisition equipment, and the equipment is mounted in the lower box body, so that the size of the measuring device is reduc</description><language>chi ; eng</language><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES ; MEASURING ; MEASURING ANGLES ; MEASURING AREAS ; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS ; MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS ; PHYSICS ; TESTING</subject><creationdate>2023</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20231215&DB=EPODOC&CC=CN&NR=220188373U$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25555,76308</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20231215&DB=EPODOC&CC=CN&NR=220188373U$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>TANG LIUBAN</creatorcontrib><creatorcontrib>QIU YONGSEN</creatorcontrib><creatorcontrib>WANG HUIZHI</creatorcontrib><creatorcontrib>LIAO HAOQIN</creatorcontrib><creatorcontrib>XIE WENGANG</creatorcontrib><creatorcontrib>LU HUANHUAN</creatorcontrib><creatorcontrib>ZHENG YUYING</creatorcontrib><title>Phenotype measuring device for elymus grains</title><description>The utility model discloses a phenotype measuring device for elymus grains, and relates to the technical field of measuring devices. 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| language | chi ; eng |
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| subjects | INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS PHYSICS TESTING |
| title | Phenotype measuring device for elymus grains |
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