Radio frequency chip test system
The utility model discloses a radio frequency chip test system, which comprises a test signal input end, a first test module, a test board, a control module, a second test module and a test signal output end, and is characterized in that the control module controls the first test module and the seco...
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Format: | Patent |
Sprache: | chi ; eng |
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Zusammenfassung: | The utility model discloses a radio frequency chip test system, which comprises a test signal input end, a first test module, a test board, a control module, a second test module and a test signal output end, and is characterized in that the control module controls the first test module and the second test module to be switched to a corresponding front-stage test channel and a corresponding rear-stage test channel; the multiple preceding-stage test channels in the first test module and the multiple backward-stage test channels in the second test module are used for replacing the operation of manually replacing the radio frequency lines to select the test ends, so that the test efficiency and the test stability are improved.
本实用新型公开了一种射频芯片测试系统,其包括测试信号输入端、第一测试模块、测试板、控制模块、第二测试模块和测试信号输出端,通过控制模块控制第一测试模块和第二测试模块切换到对应的前级测试通道和后级测试通道,利用第一测试模块中的多条前级测试通道和第二测试模块中的多条后级测试通道替代人工手动更换射频线选择测试端的操作,提高了测试效率及测试稳定性。 |
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