Aging test bench for charger processing
The utility model discloses an aging test bench for charger processing, which relates to the technical field of electronic and electric appliance processing detection and comprises a base, a detection box is fixedly connected to the upper end of the base, a supporting plate is fixedly connected to o...
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creator | ZHU QIMEI DU HONGXIANG ZHAO XUEYOU YANG LINLIN SHENG MEIFENG |
description | The utility model discloses an aging test bench for charger processing, which relates to the technical field of electronic and electric appliance processing detection and comprises a base, a detection box is fixedly connected to the upper end of the base, a supporting plate is fixedly connected to one side of the detection box, and a first supporting frame is fixedly connected to the upper end of the supporting plate. And a motor is fixedly installed on one side of the middle of the first supporting frame, the output end of the motor is fixedly connected with a screw rod, the middle of the screw rod is in threaded connection with supporting rods, and a chuck is fixedly connected between the two supporting rods. According to the utility model, through the arrangement of the chuck, when the detection head is used for a long time, the detection head can not tightly clamp the charger to cause poor contact between the charger and the detection head, the motor can be started to enable the screw rod to push the chuc |
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fullrecord | <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_CN219871474UU</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>CN219871474UU</sourcerecordid><originalsourceid>FETCH-epo_espacenet_CN219871474UU3</originalsourceid><addsrcrecordid>eNrjZFB3TM_MS1coSS0uUUhKzUvOUEjLL1JIzkgsSk8tUigoyk9OLS4GquBhYE1LzClO5YXS3AxKbq4hzh66qQX58anFBYnJqXmpJfHOfkaGlhbmhibmJqGhxkQpAgDZ5yie</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>Aging test bench for charger processing</title><source>esp@cenet</source><creator>ZHU QIMEI ; DU HONGXIANG ; ZHAO XUEYOU ; YANG LINLIN ; SHENG MEIFENG</creator><creatorcontrib>ZHU QIMEI ; DU HONGXIANG ; ZHAO XUEYOU ; YANG LINLIN ; SHENG MEIFENG</creatorcontrib><description>The utility model discloses an aging test bench for charger processing, which relates to the technical field of electronic and electric appliance processing detection and comprises a base, a detection box is fixedly connected to the upper end of the base, a supporting plate is fixedly connected to one side of the detection box, and a first supporting frame is fixedly connected to the upper end of the supporting plate. And a motor is fixedly installed on one side of the middle of the first supporting frame, the output end of the motor is fixedly connected with a screw rod, the middle of the screw rod is in threaded connection with supporting rods, and a chuck is fixedly connected between the two supporting rods. According to the utility model, through the arrangement of the chuck, when the detection head is used for a long time, the detection head can not tightly clamp the charger to cause poor contact between the charger and the detection head, the motor can be started to enable the screw rod to push the chuc</description><language>chi ; eng</language><subject>MEASURING ; MEASURING ELECTRIC VARIABLES ; MEASURING MAGNETIC VARIABLES ; PHYSICS ; TESTING</subject><creationdate>2023</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20231020&DB=EPODOC&CC=CN&NR=219871474U$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25542,76289</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20231020&DB=EPODOC&CC=CN&NR=219871474U$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>ZHU QIMEI</creatorcontrib><creatorcontrib>DU HONGXIANG</creatorcontrib><creatorcontrib>ZHAO XUEYOU</creatorcontrib><creatorcontrib>YANG LINLIN</creatorcontrib><creatorcontrib>SHENG MEIFENG</creatorcontrib><title>Aging test bench for charger processing</title><description>The utility model discloses an aging test bench for charger processing, which relates to the technical field of electronic and electric appliance processing detection and comprises a base, a detection box is fixedly connected to the upper end of the base, a supporting plate is fixedly connected to one side of the detection box, and a first supporting frame is fixedly connected to the upper end of the supporting plate. And a motor is fixedly installed on one side of the middle of the first supporting frame, the output end of the motor is fixedly connected with a screw rod, the middle of the screw rod is in threaded connection with supporting rods, and a chuck is fixedly connected between the two supporting rods. According to the utility model, through the arrangement of the chuck, when the detection head is used for a long time, the detection head can not tightly clamp the charger to cause poor contact between the charger and the detection head, the motor can be started to enable the screw rod to push the chuc</description><subject>MEASURING</subject><subject>MEASURING ELECTRIC VARIABLES</subject><subject>MEASURING MAGNETIC VARIABLES</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2023</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZFB3TM_MS1coSS0uUUhKzUvOUEjLL1JIzkgsSk8tUigoyk9OLS4GquBhYE1LzClO5YXS3AxKbq4hzh66qQX58anFBYnJqXmpJfHOfkaGlhbmhibmJqGhxkQpAgDZ5yie</recordid><startdate>20231020</startdate><enddate>20231020</enddate><creator>ZHU QIMEI</creator><creator>DU HONGXIANG</creator><creator>ZHAO XUEYOU</creator><creator>YANG LINLIN</creator><creator>SHENG MEIFENG</creator><scope>EVB</scope></search><sort><creationdate>20231020</creationdate><title>Aging test bench for charger processing</title><author>ZHU QIMEI ; DU HONGXIANG ; ZHAO XUEYOU ; YANG LINLIN ; SHENG MEIFENG</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_CN219871474UU3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>chi ; eng</language><creationdate>2023</creationdate><topic>MEASURING</topic><topic>MEASURING ELECTRIC VARIABLES</topic><topic>MEASURING MAGNETIC VARIABLES</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>ZHU QIMEI</creatorcontrib><creatorcontrib>DU HONGXIANG</creatorcontrib><creatorcontrib>ZHAO XUEYOU</creatorcontrib><creatorcontrib>YANG LINLIN</creatorcontrib><creatorcontrib>SHENG MEIFENG</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>ZHU QIMEI</au><au>DU HONGXIANG</au><au>ZHAO XUEYOU</au><au>YANG LINLIN</au><au>SHENG MEIFENG</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Aging test bench for charger processing</title><date>2023-10-20</date><risdate>2023</risdate><abstract>The utility model discloses an aging test bench for charger processing, which relates to the technical field of electronic and electric appliance processing detection and comprises a base, a detection box is fixedly connected to the upper end of the base, a supporting plate is fixedly connected to one side of the detection box, and a first supporting frame is fixedly connected to the upper end of the supporting plate. And a motor is fixedly installed on one side of the middle of the first supporting frame, the output end of the motor is fixedly connected with a screw rod, the middle of the screw rod is in threaded connection with supporting rods, and a chuck is fixedly connected between the two supporting rods. According to the utility model, through the arrangement of the chuck, when the detection head is used for a long time, the detection head can not tightly clamp the charger to cause poor contact between the charger and the detection head, the motor can be started to enable the screw rod to push the chuc</abstract><oa>free_for_read</oa></addata></record> |
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language | chi ; eng |
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subjects | MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS TESTING |
title | Aging test bench for charger processing |
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