Circuit board probe switching device with secondary female seat

Circuit board probe switching device with secondary female seat

The utility model discloses a circuit board probe switching device with a secondary seat, which comprises a mounting bottom plate, a secondary seat testboard is arranged on the mounting bottom plate, a secondary seat probe module hanger is arranged at one end of the secondary seat testboard, a secon...

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Hauptverfasser: DAI XIUPING, ZHAN XIANWEN, XIE ZHENAN
Format: Patent
Sprache:chi ; eng
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MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
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creator DAI XIUPING
ZHAN XIANWEN
XIE ZHENAN
description The utility model discloses a circuit board probe switching device with a secondary seat, which comprises a mounting bottom plate, a secondary seat testboard is arranged on the mounting bottom plate, a secondary seat probe module hanger is arranged at one end of the secondary seat testboard, a secondary seat probe module is arranged on the secondary seat probe module hanger, and a secondary seat probe module is arranged on the secondary seat probe module hanger. The child seat probe module is provided with a plurality of child seat test connection salient points, the outer side of the child seat probe module is provided with a mother seat probe module hanger, the child seat probe module hanger is parallel to the mother seat probe module hanger, the mother seat probe module hanger is provided with a mother seat probe module, the mother seat probe module is provided with a plurality of test probes, and the test probes are connected with the child seat probe module. And one end of the test probe is exposed out o
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fullrecord <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_CN219695257UU</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>CN219695257UU</sourcerecordid><originalsourceid>FETCH-epo_espacenet_CN219695257UU3</originalsourceid><addsrcrecordid>eNrjZLB3zixKLs0sUUjKTyxKUSgoyk9KVSguzyxJzsjMS1dISS3LTE5VAPIzFIpTk_PzUhKLKhXSUnMTc4DKUhNLeBhY0xJzilN5oTQ3g5Kba4izh25qQX58anFBYnJqXmpJvLOfkaGlmaWpkal5aKgxUYoAAogx5A</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>Circuit board probe switching device with secondary female seat</title><source>esp@cenet</source><creator>DAI XIUPING ; ZHAN XIANWEN ; XIE ZHENAN</creator><creatorcontrib>DAI XIUPING ; ZHAN XIANWEN ; XIE ZHENAN</creatorcontrib><description>The utility model discloses a circuit board probe switching device with a secondary seat, which comprises a mounting bottom plate, a secondary seat testboard is arranged on the mounting bottom plate, a secondary seat probe module hanger is arranged at one end of the secondary seat testboard, a secondary seat probe module is arranged on the secondary seat probe module hanger, and a secondary seat probe module is arranged on the secondary seat probe module hanger. The child seat probe module is provided with a plurality of child seat test connection salient points, the outer side of the child seat probe module is provided with a mother seat probe module hanger, the child seat probe module hanger is parallel to the mother seat probe module hanger, the mother seat probe module hanger is provided with a mother seat probe module, the mother seat probe module is provided with a plurality of test probes, and the test probes are connected with the child seat probe module. And one end of the test probe is exposed out o</description><language>chi ; eng</language><subject>MEASURING ; MEASURING ELECTRIC VARIABLES ; MEASURING MAGNETIC VARIABLES ; PHYSICS ; TESTING</subject><creationdate>2023</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20230915&amp;DB=EPODOC&amp;CC=CN&amp;NR=219695257U$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,777,882,25545,76296</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20230915&amp;DB=EPODOC&amp;CC=CN&amp;NR=219695257U$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>DAI XIUPING</creatorcontrib><creatorcontrib>ZHAN XIANWEN</creatorcontrib><creatorcontrib>XIE ZHENAN</creatorcontrib><title>Circuit board probe switching device with secondary female seat</title><description>The utility model discloses a circuit board probe switching device with a secondary seat, which comprises a mounting bottom plate, a secondary seat testboard is arranged on the mounting bottom plate, a secondary seat probe module hanger is arranged at one end of the secondary seat testboard, a secondary seat probe module is arranged on the secondary seat probe module hanger, and a secondary seat probe module is arranged on the secondary seat probe module hanger. The child seat probe module is provided with a plurality of child seat test connection salient points, the outer side of the child seat probe module is provided with a mother seat probe module hanger, the child seat probe module hanger is parallel to the mother seat probe module hanger, the mother seat probe module hanger is provided with a mother seat probe module, the mother seat probe module is provided with a plurality of test probes, and the test probes are connected with the child seat probe module. And one end of the test probe is exposed out o</description><subject>MEASURING</subject><subject>MEASURING ELECTRIC VARIABLES</subject><subject>MEASURING MAGNETIC VARIABLES</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2023</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZLB3zixKLs0sUUjKTyxKUSgoyk9KVSguzyxJzsjMS1dISS3LTE5VAPIzFIpTk_PzUhKLKhXSUnMTc4DKUhNLeBhY0xJzilN5oTQ3g5Kba4izh25qQX58anFBYnJqXmpJvLOfkaGlmaWpkal5aKgxUYoAAogx5A</recordid><startdate>20230915</startdate><enddate>20230915</enddate><creator>DAI XIUPING</creator><creator>ZHAN XIANWEN</creator><creator>XIE ZHENAN</creator><scope>EVB</scope></search><sort><creationdate>20230915</creationdate><title>Circuit board probe switching device with secondary female seat</title><author>DAI XIUPING ; ZHAN XIANWEN ; XIE ZHENAN</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_CN219695257UU3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>chi ; eng</language><creationdate>2023</creationdate><topic>MEASURING</topic><topic>MEASURING ELECTRIC VARIABLES</topic><topic>MEASURING MAGNETIC VARIABLES</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>DAI XIUPING</creatorcontrib><creatorcontrib>ZHAN XIANWEN</creatorcontrib><creatorcontrib>XIE ZHENAN</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>DAI XIUPING</au><au>ZHAN XIANWEN</au><au>XIE ZHENAN</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Circuit board probe switching device with secondary female seat</title><date>2023-09-15</date><risdate>2023</risdate><abstract>The utility model discloses a circuit board probe switching device with a secondary seat, which comprises a mounting bottom plate, a secondary seat testboard is arranged on the mounting bottom plate, a secondary seat probe module hanger is arranged at one end of the secondary seat testboard, a secondary seat probe module is arranged on the secondary seat probe module hanger, and a secondary seat probe module is arranged on the secondary seat probe module hanger. The child seat probe module is provided with a plurality of child seat test connection salient points, the outer side of the child seat probe module is provided with a mother seat probe module hanger, the child seat probe module hanger is parallel to the mother seat probe module hanger, the mother seat probe module hanger is provided with a mother seat probe module, the mother seat probe module is provided with a plurality of test probes, and the test probes are connected with the child seat probe module. And one end of the test probe is exposed out o</abstract><oa>free_for_read</oa></addata></record>
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subjects MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
title Circuit board probe switching device with secondary female seat
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