Thin film ferromagnetic resonance line width test fixture
The utility model provides a thin film ferromagnetic resonance line width test fixture, which comprises a central support rod, a test board for fixing a waveguide and a shell, the central supporting rod comprises a central probe station, a central probe support, a control latch and a rod. The centra...
Gespeichert in:
Hauptverfasser: | , , , , |
---|---|
Format: | Patent |
Sprache: | chi ; eng |
Schlagworte: | |
Online-Zugang: | Volltext bestellen |
Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
container_end_page | |
---|---|
container_issue | |
container_start_page | |
container_title | |
container_volume | |
creator | ZHANG HUAIWU FU CHENGHUI ZANG BAIFEI JIN LICHUAN YUE HUAWEI |
description | The utility model provides a thin film ferromagnetic resonance line width test fixture, which comprises a central support rod, a test board for fixing a waveguide and a shell, the central supporting rod comprises a central probe station, a central probe support, a control latch and a rod. The central probe station is arranged at the uppermost part of the rod; the central probe support is used for supporting and fixing the test bench from the central position of the test bench. The control latch is used for fixing the position of the center probe support and controlling the center probe support to ascend and descend on the rod. The test board is a disc with a hole in the center; the shell comprises a shell main body, an edge probe station and an edge probe bracket; the shell main body is a cylinder with a clamping groove and is used for fixing the test board from the outer edge position of the test board; the edge probe bracket is fixed on the outer edge of the shell main body and is used for supporting the ed |
format | Patent |
fullrecord | <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_CN219465991UU</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>CN219465991UU</sourcerecordid><originalsourceid>FETCH-epo_espacenet_CN219465991UU3</originalsourceid><addsrcrecordid>eNrjZLAMycjMU0jLzMlVSEstKsrPTUzPSy3JTFYoSi3Oz0vMS05VyMnMS1Uoz0wpyVAoSS0uASquKCktSuVhYE1LzClO5YXS3AxKbq4hzh66qQX58anFBYnJqUCT4p39jAwtTcxMLS0NQ0ONiVIEAMJIL94</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>Thin film ferromagnetic resonance line width test fixture</title><source>esp@cenet</source><creator>ZHANG HUAIWU ; FU CHENGHUI ; ZANG BAIFEI ; JIN LICHUAN ; YUE HUAWEI</creator><creatorcontrib>ZHANG HUAIWU ; FU CHENGHUI ; ZANG BAIFEI ; JIN LICHUAN ; YUE HUAWEI</creatorcontrib><description>The utility model provides a thin film ferromagnetic resonance line width test fixture, which comprises a central support rod, a test board for fixing a waveguide and a shell, the central supporting rod comprises a central probe station, a central probe support, a control latch and a rod. The central probe station is arranged at the uppermost part of the rod; the central probe support is used for supporting and fixing the test bench from the central position of the test bench. The control latch is used for fixing the position of the center probe support and controlling the center probe support to ascend and descend on the rod. The test board is a disc with a hole in the center; the shell comprises a shell main body, an edge probe station and an edge probe bracket; the shell main body is a cylinder with a clamping groove and is used for fixing the test board from the outer edge position of the test board; the edge probe bracket is fixed on the outer edge of the shell main body and is used for supporting the ed</description><language>chi ; eng</language><subject>HAND TOOLS ; MANIPULATORS ; MEASURING ; MEASURING ELECTRIC VARIABLES ; MEASURING MAGNETIC VARIABLES ; PERFORMING OPERATIONS ; PHYSICS ; PORTABLE POWER-DRIVEN TOOLS ; TESTING ; TOOLS OR BENCH DEVICES NOT OTHERWISE PROVIDED FOR, FORFASTENING, CONNECTING, DISENGAGING OR HOLDING ; TRANSPORTING</subject><creationdate>2023</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20230804&DB=EPODOC&CC=CN&NR=219465991U$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,778,883,25551,76302</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20230804&DB=EPODOC&CC=CN&NR=219465991U$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>ZHANG HUAIWU</creatorcontrib><creatorcontrib>FU CHENGHUI</creatorcontrib><creatorcontrib>ZANG BAIFEI</creatorcontrib><creatorcontrib>JIN LICHUAN</creatorcontrib><creatorcontrib>YUE HUAWEI</creatorcontrib><title>Thin film ferromagnetic resonance line width test fixture</title><description>The utility model provides a thin film ferromagnetic resonance line width test fixture, which comprises a central support rod, a test board for fixing a waveguide and a shell, the central supporting rod comprises a central probe station, a central probe support, a control latch and a rod. The central probe station is arranged at the uppermost part of the rod; the central probe support is used for supporting and fixing the test bench from the central position of the test bench. The control latch is used for fixing the position of the center probe support and controlling the center probe support to ascend and descend on the rod. The test board is a disc with a hole in the center; the shell comprises a shell main body, an edge probe station and an edge probe bracket; the shell main body is a cylinder with a clamping groove and is used for fixing the test board from the outer edge position of the test board; the edge probe bracket is fixed on the outer edge of the shell main body and is used for supporting the ed</description><subject>HAND TOOLS</subject><subject>MANIPULATORS</subject><subject>MEASURING</subject><subject>MEASURING ELECTRIC VARIABLES</subject><subject>MEASURING MAGNETIC VARIABLES</subject><subject>PERFORMING OPERATIONS</subject><subject>PHYSICS</subject><subject>PORTABLE POWER-DRIVEN TOOLS</subject><subject>TESTING</subject><subject>TOOLS OR BENCH DEVICES NOT OTHERWISE PROVIDED FOR, FORFASTENING, CONNECTING, DISENGAGING OR HOLDING</subject><subject>TRANSPORTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2023</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZLAMycjMU0jLzMlVSEstKsrPTUzPSy3JTFYoSi3Oz0vMS05VyMnMS1Uoz0wpyVAoSS0uASquKCktSuVhYE1LzClO5YXS3AxKbq4hzh66qQX58anFBYnJqUCT4p39jAwtTcxMLS0NQ0ONiVIEAMJIL94</recordid><startdate>20230804</startdate><enddate>20230804</enddate><creator>ZHANG HUAIWU</creator><creator>FU CHENGHUI</creator><creator>ZANG BAIFEI</creator><creator>JIN LICHUAN</creator><creator>YUE HUAWEI</creator><scope>EVB</scope></search><sort><creationdate>20230804</creationdate><title>Thin film ferromagnetic resonance line width test fixture</title><author>ZHANG HUAIWU ; FU CHENGHUI ; ZANG BAIFEI ; JIN LICHUAN ; YUE HUAWEI</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_CN219465991UU3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>chi ; eng</language><creationdate>2023</creationdate><topic>HAND TOOLS</topic><topic>MANIPULATORS</topic><topic>MEASURING</topic><topic>MEASURING ELECTRIC VARIABLES</topic><topic>MEASURING MAGNETIC VARIABLES</topic><topic>PERFORMING OPERATIONS</topic><topic>PHYSICS</topic><topic>PORTABLE POWER-DRIVEN TOOLS</topic><topic>TESTING</topic><topic>TOOLS OR BENCH DEVICES NOT OTHERWISE PROVIDED FOR, FORFASTENING, CONNECTING, DISENGAGING OR HOLDING</topic><topic>TRANSPORTING</topic><toplevel>online_resources</toplevel><creatorcontrib>ZHANG HUAIWU</creatorcontrib><creatorcontrib>FU CHENGHUI</creatorcontrib><creatorcontrib>ZANG BAIFEI</creatorcontrib><creatorcontrib>JIN LICHUAN</creatorcontrib><creatorcontrib>YUE HUAWEI</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>ZHANG HUAIWU</au><au>FU CHENGHUI</au><au>ZANG BAIFEI</au><au>JIN LICHUAN</au><au>YUE HUAWEI</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Thin film ferromagnetic resonance line width test fixture</title><date>2023-08-04</date><risdate>2023</risdate><abstract>The utility model provides a thin film ferromagnetic resonance line width test fixture, which comprises a central support rod, a test board for fixing a waveguide and a shell, the central supporting rod comprises a central probe station, a central probe support, a control latch and a rod. The central probe station is arranged at the uppermost part of the rod; the central probe support is used for supporting and fixing the test bench from the central position of the test bench. The control latch is used for fixing the position of the center probe support and controlling the center probe support to ascend and descend on the rod. The test board is a disc with a hole in the center; the shell comprises a shell main body, an edge probe station and an edge probe bracket; the shell main body is a cylinder with a clamping groove and is used for fixing the test board from the outer edge position of the test board; the edge probe bracket is fixed on the outer edge of the shell main body and is used for supporting the ed</abstract><oa>free_for_read</oa></addata></record> |
fulltext | fulltext_linktorsrc |
identifier | |
ispartof | |
issn | |
language | chi ; eng |
recordid | cdi_epo_espacenet_CN219465991UU |
source | esp@cenet |
subjects | HAND TOOLS MANIPULATORS MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PERFORMING OPERATIONS PHYSICS PORTABLE POWER-DRIVEN TOOLS TESTING TOOLS OR BENCH DEVICES NOT OTHERWISE PROVIDED FOR, FORFASTENING, CONNECTING, DISENGAGING OR HOLDING TRANSPORTING |
title | Thin film ferromagnetic resonance line width test fixture |
url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-15T19%3A37%3A40IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=ZHANG%20HUAIWU&rft.date=2023-08-04&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3ECN219465991UU%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true |