High-precision dust testing device adopting light scattering method
The utility model provides a high-precision dust testing device adopting a light scattering method. The high-precision dust testing device comprises an upper shell and a lower shell, a lower housing; comprising a first shell hinged to the upper shell and a second shell connected with the first shell...
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creator | CHEN WEIXIONG LI GANGSHENG WU RONGQIANG WANG BIWEN WANG MINFENG LIN ZHIWEI |
description | The utility model provides a high-precision dust testing device adopting a light scattering method. The high-precision dust testing device comprises an upper shell and a lower shell, a lower housing; comprising a first shell hinged to the upper shell and a second shell connected with the first shell. The laser unit is arranged on the upper shell; the blowback unit is arranged on the lower shell and comprises a first annular groove and a plurality of first blowback holes, the first annular groove is formed in the side wall of the first shell in the axial direction of the first shell, and the first blowback holes are formed in the inner side wall of the first shell; the second annular groove is formed in the side wall of the second shell and communicated with the first annular groove, the second blowback holes are formed in the inner side wall of the second shell, and the blowback connector is formed in the outer side wall of the second shell. And the discharge electrode and the polar plate are arranged between |
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fullrecord | <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_CN219369493UU</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>CN219369493UU</sourcerecordid><originalsourceid>FETCH-epo_espacenet_CN219369493UU3</originalsourceid><addsrcrecordid>eNrjZHD2yEzP0C0oSk3OLM7Mz1NIKS0uUShJLS7JzEtXSEkty0xOVUhMyS8A83OAaksUipMTS0pSi0ACuaklGfkpPAysaYk5xam8UJqbQcnNNcTZQze1ID8-tbggMTk1L7Uk3tnPyNDS2MzSxNI4NNSYKEUAFukzxA</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>High-precision dust testing device adopting light scattering method</title><source>esp@cenet</source><creator>CHEN WEIXIONG ; LI GANGSHENG ; WU RONGQIANG ; WANG BIWEN ; WANG MINFENG ; LIN ZHIWEI</creator><creatorcontrib>CHEN WEIXIONG ; LI GANGSHENG ; WU RONGQIANG ; WANG BIWEN ; WANG MINFENG ; LIN ZHIWEI</creatorcontrib><description>The utility model provides a high-precision dust testing device adopting a light scattering method. The high-precision dust testing device comprises an upper shell and a lower shell, a lower housing; comprising a first shell hinged to the upper shell and a second shell connected with the first shell. The laser unit is arranged on the upper shell; the blowback unit is arranged on the lower shell and comprises a first annular groove and a plurality of first blowback holes, the first annular groove is formed in the side wall of the first shell in the axial direction of the first shell, and the first blowback holes are formed in the inner side wall of the first shell; the second annular groove is formed in the side wall of the second shell and communicated with the first annular groove, the second blowback holes are formed in the inner side wall of the second shell, and the blowback connector is formed in the outer side wall of the second shell. And the discharge electrode and the polar plate are arranged between</description><language>chi ; eng</language><subject>CLEANING ; CLEANING IN GENERAL ; INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES ; MEASURING ; PERFORMING OPERATIONS ; PHYSICS ; PREVENTION OF FOULING IN GENERAL ; TESTING ; TRANSPORTING</subject><creationdate>2023</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20230718&DB=EPODOC&CC=CN&NR=219369493U$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25543,76293</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20230718&DB=EPODOC&CC=CN&NR=219369493U$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>CHEN WEIXIONG</creatorcontrib><creatorcontrib>LI GANGSHENG</creatorcontrib><creatorcontrib>WU RONGQIANG</creatorcontrib><creatorcontrib>WANG BIWEN</creatorcontrib><creatorcontrib>WANG MINFENG</creatorcontrib><creatorcontrib>LIN ZHIWEI</creatorcontrib><title>High-precision dust testing device adopting light scattering method</title><description>The utility model provides a high-precision dust testing device adopting a light scattering method. The high-precision dust testing device comprises an upper shell and a lower shell, a lower housing; comprising a first shell hinged to the upper shell and a second shell connected with the first shell. The laser unit is arranged on the upper shell; the blowback unit is arranged on the lower shell and comprises a first annular groove and a plurality of first blowback holes, the first annular groove is formed in the side wall of the first shell in the axial direction of the first shell, and the first blowback holes are formed in the inner side wall of the first shell; the second annular groove is formed in the side wall of the second shell and communicated with the first annular groove, the second blowback holes are formed in the inner side wall of the second shell, and the blowback connector is formed in the outer side wall of the second shell. And the discharge electrode and the polar plate are arranged between</description><subject>CLEANING</subject><subject>CLEANING IN GENERAL</subject><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</subject><subject>MEASURING</subject><subject>PERFORMING OPERATIONS</subject><subject>PHYSICS</subject><subject>PREVENTION OF FOULING IN GENERAL</subject><subject>TESTING</subject><subject>TRANSPORTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2023</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZHD2yEzP0C0oSk3OLM7Mz1NIKS0uUShJLS7JzEtXSEkty0xOVUhMyS8A83OAaksUipMTS0pSi0ACuaklGfkpPAysaYk5xam8UJqbQcnNNcTZQze1ID8-tbggMTk1L7Uk3tnPyNDS2MzSxNI4NNSYKEUAFukzxA</recordid><startdate>20230718</startdate><enddate>20230718</enddate><creator>CHEN WEIXIONG</creator><creator>LI GANGSHENG</creator><creator>WU RONGQIANG</creator><creator>WANG BIWEN</creator><creator>WANG MINFENG</creator><creator>LIN ZHIWEI</creator><scope>EVB</scope></search><sort><creationdate>20230718</creationdate><title>High-precision dust testing device adopting light scattering method</title><author>CHEN WEIXIONG ; LI GANGSHENG ; WU RONGQIANG ; WANG BIWEN ; WANG MINFENG ; LIN ZHIWEI</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_CN219369493UU3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>chi ; eng</language><creationdate>2023</creationdate><topic>CLEANING</topic><topic>CLEANING IN GENERAL</topic><topic>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</topic><topic>MEASURING</topic><topic>PERFORMING OPERATIONS</topic><topic>PHYSICS</topic><topic>PREVENTION OF FOULING IN GENERAL</topic><topic>TESTING</topic><topic>TRANSPORTING</topic><toplevel>online_resources</toplevel><creatorcontrib>CHEN WEIXIONG</creatorcontrib><creatorcontrib>LI GANGSHENG</creatorcontrib><creatorcontrib>WU RONGQIANG</creatorcontrib><creatorcontrib>WANG BIWEN</creatorcontrib><creatorcontrib>WANG MINFENG</creatorcontrib><creatorcontrib>LIN ZHIWEI</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>CHEN WEIXIONG</au><au>LI GANGSHENG</au><au>WU RONGQIANG</au><au>WANG BIWEN</au><au>WANG MINFENG</au><au>LIN ZHIWEI</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>High-precision dust testing device adopting light scattering method</title><date>2023-07-18</date><risdate>2023</risdate><abstract>The utility model provides a high-precision dust testing device adopting a light scattering method. The high-precision dust testing device comprises an upper shell and a lower shell, a lower housing; comprising a first shell hinged to the upper shell and a second shell connected with the first shell. The laser unit is arranged on the upper shell; the blowback unit is arranged on the lower shell and comprises a first annular groove and a plurality of first blowback holes, the first annular groove is formed in the side wall of the first shell in the axial direction of the first shell, and the first blowback holes are formed in the inner side wall of the first shell; the second annular groove is formed in the side wall of the second shell and communicated with the first annular groove, the second blowback holes are formed in the inner side wall of the second shell, and the blowback connector is formed in the outer side wall of the second shell. And the discharge electrode and the polar plate are arranged between</abstract><oa>free_for_read</oa></addata></record> |
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language | chi ; eng |
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subjects | CLEANING CLEANING IN GENERAL INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING PERFORMING OPERATIONS PHYSICS PREVENTION OF FOULING IN GENERAL TESTING TRANSPORTING |
title | High-precision dust testing device adopting light scattering method |
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