Instrument control system inspection device
The utility model relates to an instrument control system inspection device, which comprises a control box and a wiring board arranged on the control box, the wiring board is electrically connected with the control box, the wiring board is connected with at least one connecting line, the connecting...
Gespeichert in:
Hauptverfasser: | , , , , |
---|---|
Format: | Patent |
Sprache: | chi ; eng |
Schlagworte: | |
Online-Zugang: | Volltext bestellen |
Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
container_end_page | |
---|---|
container_issue | |
container_start_page | |
container_title | |
container_volume | |
creator | YUAN PENGRONG JING JIANZHENG WANG QINGWEI CHEN NAN MAO BIN |
description | The utility model relates to an instrument control system inspection device, which comprises a control box and a wiring board arranged on the control box, the wiring board is electrically connected with the control box, the wiring board is connected with at least one connecting line, the connecting line is electrically connected with a detection instrument, the side surface of the detection instrument is provided with a fixed plate, and the fixed plate is fixedly connected with the control box. The two ends of the outer edge face of the fixing plate are bent towards the detection instrument to form an arc-shaped opening, an inserting cylinder is arranged on the side face, away from the detection instrument, of the fixing plate, a limiting groove is formed in the inner side face of the inserting cylinder in the circumferential direction, a positioning disc with a fixing disc is inserted into the inserting cylinder, and the positioning disc is provided with a protruding ring located in the limiting groove; the |
format | Patent |
fullrecord | <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_CN219223796UU</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>CN219223796UU</sourcerecordid><originalsourceid>FETCH-epo_espacenet_CN219223796UU3</originalsourceid><addsrcrecordid>eNrjZND2zCsuKSrNTc0rUUjOzyspys9RKK4sLknNVcjMKy5ITS7JzM9TSEkty0xO5WFgTUvMKU7lhdLcDEpuriHOHrqpBfnxqcUFicmpeakl8c5-RoaWRkbG5pZmoaHGRCkCABEtKwM</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>Instrument control system inspection device</title><source>esp@cenet</source><creator>YUAN PENGRONG ; JING JIANZHENG ; WANG QINGWEI ; CHEN NAN ; MAO BIN</creator><creatorcontrib>YUAN PENGRONG ; JING JIANZHENG ; WANG QINGWEI ; CHEN NAN ; MAO BIN</creatorcontrib><description>The utility model relates to an instrument control system inspection device, which comprises a control box and a wiring board arranged on the control box, the wiring board is electrically connected with the control box, the wiring board is connected with at least one connecting line, the connecting line is electrically connected with a detection instrument, the side surface of the detection instrument is provided with a fixed plate, and the fixed plate is fixedly connected with the control box. The two ends of the outer edge face of the fixing plate are bent towards the detection instrument to form an arc-shaped opening, an inserting cylinder is arranged on the side face, away from the detection instrument, of the fixing plate, a limiting groove is formed in the inner side face of the inserting cylinder in the circumferential direction, a positioning disc with a fixing disc is inserted into the inserting cylinder, and the positioning disc is provided with a protruding ring located in the limiting groove; the</description><language>chi ; eng</language><subject>ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVEREDIN A SINGLE OTHER SUBCLASS ; MEASURING ; MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE ; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR ; PHYSICS ; TARIFF METERING APPARATUS ; TESTING</subject><creationdate>2023</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20230620&DB=EPODOC&CC=CN&NR=219223796U$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25564,76547</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20230620&DB=EPODOC&CC=CN&NR=219223796U$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>YUAN PENGRONG</creatorcontrib><creatorcontrib>JING JIANZHENG</creatorcontrib><creatorcontrib>WANG QINGWEI</creatorcontrib><creatorcontrib>CHEN NAN</creatorcontrib><creatorcontrib>MAO BIN</creatorcontrib><title>Instrument control system inspection device</title><description>The utility model relates to an instrument control system inspection device, which comprises a control box and a wiring board arranged on the control box, the wiring board is electrically connected with the control box, the wiring board is connected with at least one connecting line, the connecting line is electrically connected with a detection instrument, the side surface of the detection instrument is provided with a fixed plate, and the fixed plate is fixedly connected with the control box. The two ends of the outer edge face of the fixing plate are bent towards the detection instrument to form an arc-shaped opening, an inserting cylinder is arranged on the side face, away from the detection instrument, of the fixing plate, a limiting groove is formed in the inner side face of the inserting cylinder in the circumferential direction, a positioning disc with a fixing disc is inserted into the inserting cylinder, and the positioning disc is provided with a protruding ring located in the limiting groove; the</description><subject>ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVEREDIN A SINGLE OTHER SUBCLASS</subject><subject>MEASURING</subject><subject>MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE</subject><subject>MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR</subject><subject>PHYSICS</subject><subject>TARIFF METERING APPARATUS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2023</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZND2zCsuKSrNTc0rUUjOzyspys9RKK4sLknNVcjMKy5ITS7JzM9TSEkty0xO5WFgTUvMKU7lhdLcDEpuriHOHrqpBfnxqcUFicmpeakl8c5-RoaWRkbG5pZmoaHGRCkCABEtKwM</recordid><startdate>20230620</startdate><enddate>20230620</enddate><creator>YUAN PENGRONG</creator><creator>JING JIANZHENG</creator><creator>WANG QINGWEI</creator><creator>CHEN NAN</creator><creator>MAO BIN</creator><scope>EVB</scope></search><sort><creationdate>20230620</creationdate><title>Instrument control system inspection device</title><author>YUAN PENGRONG ; JING JIANZHENG ; WANG QINGWEI ; CHEN NAN ; MAO BIN</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_CN219223796UU3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>chi ; eng</language><creationdate>2023</creationdate><topic>ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVEREDIN A SINGLE OTHER SUBCLASS</topic><topic>MEASURING</topic><topic>MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE</topic><topic>MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR</topic><topic>PHYSICS</topic><topic>TARIFF METERING APPARATUS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>YUAN PENGRONG</creatorcontrib><creatorcontrib>JING JIANZHENG</creatorcontrib><creatorcontrib>WANG QINGWEI</creatorcontrib><creatorcontrib>CHEN NAN</creatorcontrib><creatorcontrib>MAO BIN</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>YUAN PENGRONG</au><au>JING JIANZHENG</au><au>WANG QINGWEI</au><au>CHEN NAN</au><au>MAO BIN</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Instrument control system inspection device</title><date>2023-06-20</date><risdate>2023</risdate><abstract>The utility model relates to an instrument control system inspection device, which comprises a control box and a wiring board arranged on the control box, the wiring board is electrically connected with the control box, the wiring board is connected with at least one connecting line, the connecting line is electrically connected with a detection instrument, the side surface of the detection instrument is provided with a fixed plate, and the fixed plate is fixedly connected with the control box. The two ends of the outer edge face of the fixing plate are bent towards the detection instrument to form an arc-shaped opening, an inserting cylinder is arranged on the side face, away from the detection instrument, of the fixing plate, a limiting groove is formed in the inner side face of the inserting cylinder in the circumferential direction, a positioning disc with a fixing disc is inserted into the inserting cylinder, and the positioning disc is provided with a protruding ring located in the limiting groove; the</abstract><oa>free_for_read</oa></addata></record> |
fulltext | fulltext_linktorsrc |
identifier | |
ispartof | |
issn | |
language | chi ; eng |
recordid | cdi_epo_espacenet_CN219223796UU |
source | esp@cenet |
subjects | ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVEREDIN A SINGLE OTHER SUBCLASS MEASURING MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR PHYSICS TARIFF METERING APPARATUS TESTING |
title | Instrument control system inspection device |
url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2024-12-25T10%3A13%3A15IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=YUAN%20PENGRONG&rft.date=2023-06-20&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3ECN219223796UU%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true |