Integrated cell capacity testing device
The utility model provides an integrated cell capacity testing device in the technical field of formation and capacity grading. The integrated cell capacity testing device comprises a frame; the power supply module is arranged in the frame; the press module is arranged in the frame and is connected...
Gespeichert in:
Hauptverfasser: | , , , , , |
---|---|
Format: | Patent |
Sprache: | chi ; eng |
Schlagworte: | |
Online-Zugang: | Volltext bestellen |
Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
container_end_page | |
---|---|
container_issue | |
container_start_page | |
container_title | |
container_volume | |
creator | YOU HUABIAO MAO YUFENG XU XUEWEI GU LUWEI CHEN BING LIU ZUOBIN |
description | The utility model provides an integrated cell capacity testing device in the technical field of formation and capacity grading. The integrated cell capacity testing device comprises a frame; the power supply module is arranged in the frame; the press module is arranged in the frame and is connected with the power supply module; the upper computer is arranged in the frame and is respectively connected with the power supply module and the press machine module; the power supply module comprises a weak current cabinet which is arranged in the frame and is connected with the upper computer; the strong current cabinet is arranged at the top end of the weak current cabinet and is connected with the upper computer; the ACDC power supply module is arranged in the frame and is connected with the strong current cabinet; the DCDC power supply module is arranged in the frame and is connected with the ACDC power supply module; a plurality of power lines are arranged in the frame through the buckle plate; the plurality of c |
format | Patent |
fullrecord | <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_CN218956761UU</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>CN218956761UU</sourcerecordid><originalsourceid>FETCH-epo_espacenet_CN218956761UU3</originalsourceid><addsrcrecordid>eNrjZFD3zCtJTS9KLElNUUhOzclRSE4sSEzOLKlUKEktLsnMS1dISS3LTE7lYWBNS8wpTuWF0twMSm6uIc4euqkF-fGpxUA9qXmpJfHOfkaGFpamZuZmhqGhxkQpAgD76Cjf</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>Integrated cell capacity testing device</title><source>esp@cenet</source><creator>YOU HUABIAO ; MAO YUFENG ; XU XUEWEI ; GU LUWEI ; CHEN BING ; LIU ZUOBIN</creator><creatorcontrib>YOU HUABIAO ; MAO YUFENG ; XU XUEWEI ; GU LUWEI ; CHEN BING ; LIU ZUOBIN</creatorcontrib><description>The utility model provides an integrated cell capacity testing device in the technical field of formation and capacity grading. The integrated cell capacity testing device comprises a frame; the power supply module is arranged in the frame; the press module is arranged in the frame and is connected with the power supply module; the upper computer is arranged in the frame and is respectively connected with the power supply module and the press machine module; the power supply module comprises a weak current cabinet which is arranged in the frame and is connected with the upper computer; the strong current cabinet is arranged at the top end of the weak current cabinet and is connected with the upper computer; the ACDC power supply module is arranged in the frame and is connected with the strong current cabinet; the DCDC power supply module is arranged in the frame and is connected with the ACDC power supply module; a plurality of power lines are arranged in the frame through the buckle plate; the plurality of c</description><language>chi ; eng</language><subject>CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS ; ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR ; ELECTRICITY ; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS ; MEASURING ; MEASURING ELECTRIC VARIABLES ; MEASURING MAGNETIC VARIABLES ; PHYSICS ; PRINTED CIRCUITS ; TESTING</subject><creationdate>2023</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20230502&DB=EPODOC&CC=CN&NR=218956761U$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25543,76294</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20230502&DB=EPODOC&CC=CN&NR=218956761U$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>YOU HUABIAO</creatorcontrib><creatorcontrib>MAO YUFENG</creatorcontrib><creatorcontrib>XU XUEWEI</creatorcontrib><creatorcontrib>GU LUWEI</creatorcontrib><creatorcontrib>CHEN BING</creatorcontrib><creatorcontrib>LIU ZUOBIN</creatorcontrib><title>Integrated cell capacity testing device</title><description>The utility model provides an integrated cell capacity testing device in the technical field of formation and capacity grading. The integrated cell capacity testing device comprises a frame; the power supply module is arranged in the frame; the press module is arranged in the frame and is connected with the power supply module; the upper computer is arranged in the frame and is respectively connected with the power supply module and the press machine module; the power supply module comprises a weak current cabinet which is arranged in the frame and is connected with the upper computer; the strong current cabinet is arranged at the top end of the weak current cabinet and is connected with the upper computer; the ACDC power supply module is arranged in the frame and is connected with the strong current cabinet; the DCDC power supply module is arranged in the frame and is connected with the ACDC power supply module; a plurality of power lines are arranged in the frame through the buckle plate; the plurality of c</description><subject>CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS</subject><subject>ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR</subject><subject>ELECTRICITY</subject><subject>MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS</subject><subject>MEASURING</subject><subject>MEASURING ELECTRIC VARIABLES</subject><subject>MEASURING MAGNETIC VARIABLES</subject><subject>PHYSICS</subject><subject>PRINTED CIRCUITS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2023</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZFD3zCtJTS9KLElNUUhOzclRSE4sSEzOLKlUKEktLsnMS1dISS3LTE7lYWBNS8wpTuWF0twMSm6uIc4euqkF-fGpxUA9qXmpJfHOfkaGFpamZuZmhqGhxkQpAgD76Cjf</recordid><startdate>20230502</startdate><enddate>20230502</enddate><creator>YOU HUABIAO</creator><creator>MAO YUFENG</creator><creator>XU XUEWEI</creator><creator>GU LUWEI</creator><creator>CHEN BING</creator><creator>LIU ZUOBIN</creator><scope>EVB</scope></search><sort><creationdate>20230502</creationdate><title>Integrated cell capacity testing device</title><author>YOU HUABIAO ; MAO YUFENG ; XU XUEWEI ; GU LUWEI ; CHEN BING ; LIU ZUOBIN</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_CN218956761UU3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>chi ; eng</language><creationdate>2023</creationdate><topic>CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS</topic><topic>ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR</topic><topic>ELECTRICITY</topic><topic>MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS</topic><topic>MEASURING</topic><topic>MEASURING ELECTRIC VARIABLES</topic><topic>MEASURING MAGNETIC VARIABLES</topic><topic>PHYSICS</topic><topic>PRINTED CIRCUITS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>YOU HUABIAO</creatorcontrib><creatorcontrib>MAO YUFENG</creatorcontrib><creatorcontrib>XU XUEWEI</creatorcontrib><creatorcontrib>GU LUWEI</creatorcontrib><creatorcontrib>CHEN BING</creatorcontrib><creatorcontrib>LIU ZUOBIN</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>YOU HUABIAO</au><au>MAO YUFENG</au><au>XU XUEWEI</au><au>GU LUWEI</au><au>CHEN BING</au><au>LIU ZUOBIN</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Integrated cell capacity testing device</title><date>2023-05-02</date><risdate>2023</risdate><abstract>The utility model provides an integrated cell capacity testing device in the technical field of formation and capacity grading. The integrated cell capacity testing device comprises a frame; the power supply module is arranged in the frame; the press module is arranged in the frame and is connected with the power supply module; the upper computer is arranged in the frame and is respectively connected with the power supply module and the press machine module; the power supply module comprises a weak current cabinet which is arranged in the frame and is connected with the upper computer; the strong current cabinet is arranged at the top end of the weak current cabinet and is connected with the upper computer; the ACDC power supply module is arranged in the frame and is connected with the strong current cabinet; the DCDC power supply module is arranged in the frame and is connected with the ACDC power supply module; a plurality of power lines are arranged in the frame through the buckle plate; the plurality of c</abstract><oa>free_for_read</oa></addata></record> |
fulltext | fulltext_linktorsrc |
identifier | |
ispartof | |
issn | |
language | chi ; eng |
recordid | cdi_epo_espacenet_CN218956761UU |
source | esp@cenet |
subjects | CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR ELECTRICITY MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS PRINTED CIRCUITS TESTING |
title | Integrated cell capacity testing device |
url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-22T17%3A40%3A53IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=YOU%20HUABIAO&rft.date=2023-05-02&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3ECN218956761UU%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true |