Test detection table with chip overturning protection function
The utility model discloses a test detection bench with a chip overturn protection function, which belongs to the field of test detection benches and comprises a detection bench body and a detection unit arranged at the upper end of the detection bench body, a left support plate comprises a case and...
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| creator | ZHONG PEIJUN |
| description | The utility model discloses a test detection bench with a chip overturn protection function, which belongs to the field of test detection benches and comprises a detection bench body and a detection unit arranged at the upper end of the detection bench body, a left support plate comprises a case and a first motor arranged in the case, the output end of the first motor penetrates through the case and is connected with a rotating shaft, and the output end of the first motor is connected with the rotating shaft. The other end of the rotating shaft is provided with a limiting piece, a switch is utilized to enable the air cylinder piece A to push the clamping plates to move, the four sets of clamping plates make contact with the side wall of a chip, the chip can be clamped, a second motor is started to work, a lead screw can be rotated, and a threaded block is matched for use; a threaded block can drive a supporting frame, an air cylinder piece B, a connecting block, an air cylinder piece C and a detection probe t |
| format | Patent |
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The other end of the rotating shaft is provided with a limiting piece, a switch is utilized to enable the air cylinder piece A to push the clamping plates to move, the four sets of clamping plates make contact with the side wall of a chip, the chip can be clamped, a second motor is started to work, a lead screw can be rotated, and a threaded block is matched for use; a threaded block can drive a supporting frame, an air cylinder piece B, a connecting block, an air cylinder piece C and a detection probe t</description><language>chi ; eng</language><subject>MEASURING ; MEASURING ELECTRIC VARIABLES ; MEASURING MAGNETIC VARIABLES ; PHYSICS ; TESTING</subject><creationdate>2023</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20230221&DB=EPODOC&CC=CN&NR=218512574U$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25564,76547</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20230221&DB=EPODOC&CC=CN&NR=218512574U$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>ZHONG PEIJUN</creatorcontrib><title>Test detection table with chip overturning protection function</title><description>The utility model discloses a test detection bench with a chip overturn protection function, which belongs to the field of test detection benches and comprises a detection bench body and a detection unit arranged at the upper end of the detection bench body, a left support plate comprises a case and a first motor arranged in the case, the output end of the first motor penetrates through the case and is connected with a rotating shaft, and the output end of the first motor is connected with the rotating shaft. 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| language | chi ; eng |
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| subjects | MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS TESTING |
| title | Test detection table with chip overturning protection function |
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