Common terminal device suitable for multi-model test

The utility model relates to a common terminal device suitable for multi-model testing, and relates to the technical field of testing devices, and the common terminal device comprises a testing mechanism, a tray mechanism, a lifting mechanism and a common docking mechanism. The testing mechanism is...

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Hauptverfasser: WANG DE, YU GUIWEI, SHENG JINGLONG
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creator WANG DE
YU GUIWEI
SHENG JINGLONG
description The utility model relates to a common terminal device suitable for multi-model testing, and relates to the technical field of testing devices, and the common terminal device comprises a testing mechanism, a tray mechanism, a lifting mechanism and a common docking mechanism. The testing mechanism is erected above a to-be-tested machine, the lifting mechanism is arranged on the testing mechanism, the lifting mechanism is connected with the tray mechanism to control the displacement of the tray mechanism, and the to-be-tested machine is arranged on the tray mechanism; the tray mechanism is connected with the testing mechanism through the public docking mechanism; the common docking mechanism comprises a pin docking assembly, the pin docking assembly comprises a pin adapter and a pin pressing piece, and the pin adapter is arranged on the testing mechanism; and the pin pressing piece is arranged on the tray mechanism corresponding to the pin switching piece. According to the invention, multiple models can be quick
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fullrecord <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_CN218412638UU</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>CN218412638UU</sourcerecordid><originalsourceid>FETCH-epo_espacenet_CN218412638UU3</originalsourceid><addsrcrecordid>eNrjZDBxzs_Nzc9TKEktys3MS8xRSEkty0xOVSguzSxJTMpJVUjLL1LILc0pydTNzU9JzQEqLC7hYWBNS8wpTuWF0twMSm6uIc4euqkF-fGpxQWJyal5qSXxzn5GhhYmhkZmxhahocZEKQIAmuotsw</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>Common terminal device suitable for multi-model test</title><source>esp@cenet</source><creator>WANG DE ; YU GUIWEI ; SHENG JINGLONG</creator><creatorcontrib>WANG DE ; YU GUIWEI ; SHENG JINGLONG</creatorcontrib><description>The utility model relates to a common terminal device suitable for multi-model testing, and relates to the technical field of testing devices, and the common terminal device comprises a testing mechanism, a tray mechanism, a lifting mechanism and a common docking mechanism. The testing mechanism is erected above a to-be-tested machine, the lifting mechanism is arranged on the testing mechanism, the lifting mechanism is connected with the tray mechanism to control the displacement of the tray mechanism, and the to-be-tested machine is arranged on the tray mechanism; the tray mechanism is connected with the testing mechanism through the public docking mechanism; the common docking mechanism comprises a pin docking assembly, the pin docking assembly comprises a pin adapter and a pin pressing piece, and the pin adapter is arranged on the testing mechanism; and the pin pressing piece is arranged on the tray mechanism corresponding to the pin switching piece. According to the invention, multiple models can be quick</description><language>chi ; eng</language><subject>MEASURING ; MEASURING ELECTRIC VARIABLES ; MEASURING MAGNETIC VARIABLES ; PHYSICS ; TESTING</subject><creationdate>2023</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20230131&amp;DB=EPODOC&amp;CC=CN&amp;NR=218412638U$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25564,76547</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20230131&amp;DB=EPODOC&amp;CC=CN&amp;NR=218412638U$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>WANG DE</creatorcontrib><creatorcontrib>YU GUIWEI</creatorcontrib><creatorcontrib>SHENG JINGLONG</creatorcontrib><title>Common terminal device suitable for multi-model test</title><description>The utility model relates to a common terminal device suitable for multi-model testing, and relates to the technical field of testing devices, and the common terminal device comprises a testing mechanism, a tray mechanism, a lifting mechanism and a common docking mechanism. The testing mechanism is erected above a to-be-tested machine, the lifting mechanism is arranged on the testing mechanism, the lifting mechanism is connected with the tray mechanism to control the displacement of the tray mechanism, and the to-be-tested machine is arranged on the tray mechanism; the tray mechanism is connected with the testing mechanism through the public docking mechanism; the common docking mechanism comprises a pin docking assembly, the pin docking assembly comprises a pin adapter and a pin pressing piece, and the pin adapter is arranged on the testing mechanism; and the pin pressing piece is arranged on the tray mechanism corresponding to the pin switching piece. According to the invention, multiple models can be quick</description><subject>MEASURING</subject><subject>MEASURING ELECTRIC VARIABLES</subject><subject>MEASURING MAGNETIC VARIABLES</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2023</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZDBxzs_Nzc9TKEktys3MS8xRSEkty0xOVSguzSxJTMpJVUjLL1LILc0pydTNzU9JzQEqLC7hYWBNS8wpTuWF0twMSm6uIc4euqkF-fGpxQWJyal5qSXxzn5GhhYmhkZmxhahocZEKQIAmuotsw</recordid><startdate>20230131</startdate><enddate>20230131</enddate><creator>WANG DE</creator><creator>YU GUIWEI</creator><creator>SHENG JINGLONG</creator><scope>EVB</scope></search><sort><creationdate>20230131</creationdate><title>Common terminal device suitable for multi-model test</title><author>WANG DE ; YU GUIWEI ; SHENG JINGLONG</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_CN218412638UU3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>chi ; eng</language><creationdate>2023</creationdate><topic>MEASURING</topic><topic>MEASURING ELECTRIC VARIABLES</topic><topic>MEASURING MAGNETIC VARIABLES</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>WANG DE</creatorcontrib><creatorcontrib>YU GUIWEI</creatorcontrib><creatorcontrib>SHENG JINGLONG</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>WANG DE</au><au>YU GUIWEI</au><au>SHENG JINGLONG</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Common terminal device suitable for multi-model test</title><date>2023-01-31</date><risdate>2023</risdate><abstract>The utility model relates to a common terminal device suitable for multi-model testing, and relates to the technical field of testing devices, and the common terminal device comprises a testing mechanism, a tray mechanism, a lifting mechanism and a common docking mechanism. The testing mechanism is erected above a to-be-tested machine, the lifting mechanism is arranged on the testing mechanism, the lifting mechanism is connected with the tray mechanism to control the displacement of the tray mechanism, and the to-be-tested machine is arranged on the tray mechanism; the tray mechanism is connected with the testing mechanism through the public docking mechanism; the common docking mechanism comprises a pin docking assembly, the pin docking assembly comprises a pin adapter and a pin pressing piece, and the pin adapter is arranged on the testing mechanism; and the pin pressing piece is arranged on the tray mechanism corresponding to the pin switching piece. According to the invention, multiple models can be quick</abstract><oa>free_for_read</oa></addata></record>
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subjects MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
title Common terminal device suitable for multi-model test
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2024-12-26T09%3A56%3A28IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=WANG%20DE&rft.date=2023-01-31&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3ECN218412638UU%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true