Sample placing platform for scanning electron microscope
The utility model relates to the technical field of electron microscopes, and discloses a sample placing platform for a scanning electron microscope. According to the device, a rotating cavity is formed in the containing table, a two-way threaded rod is rotationally connected to one end of the inner...
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| creator | XU TIEFU ZHU ZIJIN ZHUANG QIAN YANG QISONG ZHOU JUN ZHUANG WEI LI XI |
| description | The utility model relates to the technical field of electron microscopes, and discloses a sample placing platform for a scanning electron microscope. According to the device, a rotating cavity is formed in the containing table, a two-way threaded rod is rotationally connected to one end of the inner wall of the rotating cavity, threaded sleeves are connected to the outer portions of the two ends, opposite in thread direction, of the two-way threaded rod in a threaded mode, sliding blocks are welded to the tops of the threaded sleeves, and sliding grooves allowing the sliding blocks to slide are formed in the top of the containing table; fixing blocks are welded to the tops of the sliding blocks, and the two fixing blocks are driven to move in the approaching direction by rotating the rotating handle, so that a sample placed on the upper surface of the placement table is clamped, the to-be-observed sample is fixed without using a conductive adhesive tape, the cost is saved, and meanwhile, glue is effectively p |
| format | Patent |
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According to the device, a rotating cavity is formed in the containing table, a two-way threaded rod is rotationally connected to one end of the inner wall of the rotating cavity, threaded sleeves are connected to the outer portions of the two ends, opposite in thread direction, of the two-way threaded rod in a threaded mode, sliding blocks are welded to the tops of the threaded sleeves, and sliding grooves allowing the sliding blocks to slide are formed in the top of the containing table; fixing blocks are welded to the tops of the sliding blocks, and the two fixing blocks are driven to move in the approaching direction by rotating the rotating handle, so that a sample placed on the upper surface of the placement table is clamped, the to-be-observed sample is fixed without using a conductive adhesive tape, the cost is saved, and meanwhile, glue is effectively p</description><language>chi ; eng</language><subject>BASIC ELECTRIC ELEMENTS ; ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS ; ELECTRICITY ; INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES ; MEASURING ; PHYSICS ; TESTING</subject><creationdate>2022</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20221227&DB=EPODOC&CC=CN&NR=218160271U$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25543,76293</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20221227&DB=EPODOC&CC=CN&NR=218160271U$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>XU TIEFU</creatorcontrib><creatorcontrib>ZHU ZIJIN</creatorcontrib><creatorcontrib>ZHUANG QIAN</creatorcontrib><creatorcontrib>YANG QISONG</creatorcontrib><creatorcontrib>ZHOU JUN</creatorcontrib><creatorcontrib>ZHUANG WEI</creatorcontrib><creatorcontrib>LI XI</creatorcontrib><title>Sample placing platform for scanning electron microscope</title><description>The utility model relates to the technical field of electron microscopes, and discloses a sample placing platform for a scanning electron microscope. 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| subjects | BASIC ELECTRIC ELEMENTS ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS ELECTRICITY INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING PHYSICS TESTING |
| title | Sample placing platform for scanning electron microscope |
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