In-situ temperature control table of photoelectron spectrometer
The embodiment of the utility model relates to the technical field of photoelectron spectroscopy analysis and testing, in particular to an in-situ temperature control table of a photoelectron spectrometer. According to the in-situ temperature control table of the photoelectron spectrometer provided...
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| creator | YAO WENQING LIU QINGGANG MA JUNGUO YANG LIPING DUAN JIANXIA |
| description | The embodiment of the utility model relates to the technical field of photoelectron spectroscopy analysis and testing, in particular to an in-situ temperature control table of a photoelectron spectrometer. According to the in-situ temperature control table of the photoelectron spectrometer provided by the embodiment of the invention, the liquid nitrogen cooling piece is in contact with the sample holder through the cooling piece embedding hole formed in the bottom surface of the first heating platform so as to exchange heat and realize low-temperature refrigeration; therefore, the sample can be selectively heated according to actual requirements, so that the requirement of sample pretreatment at an ultralow temperature (100K to 373K) and a high temperature (300K to 573K) is met. In addition, the in-situ temperature control table of the photoelectron spectrometer is simple in structure, convenient to disassemble and assemble and low in production and manufacturing cost.
本申请实施例涉及光电子能谱分析测试技术领域，尤其是涉及一种光电子能谱仪原位温控台 |
| format | Patent |
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本申请实施例涉及光电子能谱分析测试技术领域，尤其是涉及一种光电子能谱仪原位温控台</description><language>chi ; eng</language><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES ; MEASURING ; PHYSICS ; TESTING</subject><creationdate>2022</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20220909&DB=EPODOC&CC=CN&NR=217404187U$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25555,76308</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20220909&DB=EPODOC&CC=CN&NR=217404187U$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>YAO WENQING</creatorcontrib><creatorcontrib>LIU QINGGANG</creatorcontrib><creatorcontrib>MA JUNGUO</creatorcontrib><creatorcontrib>YANG LIPING</creatorcontrib><creatorcontrib>DUAN JIANXIA</creatorcontrib><title>In-situ temperature control table of photoelectron spectrometer</title><description>The embodiment of the utility model relates to the technical field of photoelectron spectroscopy analysis and testing, in particular to an in-situ temperature control table of a photoelectron spectrometer. According to the in-situ temperature control table of the photoelectron spectrometer provided by the embodiment of the invention, the liquid nitrogen cooling piece is in contact with the sample holder through the cooling piece embedding hole formed in the bottom surface of the first heating platform so as to exchange heat and realize low-temperature refrigeration; therefore, the sample can be selectively heated according to actual requirements, so that the requirement of sample pretreatment at an ultralow temperature (100K to 373K) and a high temperature (300K to 573K) is met. In addition, the in-situ temperature control table of the photoelectron spectrometer is simple in structure, convenient to disassemble and assemble and low in production and manufacturing cost.
本申请实施例涉及光电子能谱分析测试技术领域，尤其是涉及一种光电子能谱仪原位温控台</description><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</subject><subject>MEASURING</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2022</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZLD3zNMtziwpVShJzS1ILUosKS1KVUjOzyspys9RKElMyklVyE9TKMjIL8lPzUlNBgrnKRQXgBm5qSWpRTwMrGmJOcWpvFCam0HJzTXE2UM3tSA_PrW4IDE5NS-1JN7Zz8jQ3MTAxNDCPDTUmChFAFMDMpY</recordid><startdate>20220909</startdate><enddate>20220909</enddate><creator>YAO WENQING</creator><creator>LIU QINGGANG</creator><creator>MA JUNGUO</creator><creator>YANG LIPING</creator><creator>DUAN JIANXIA</creator><scope>EVB</scope></search><sort><creationdate>20220909</creationdate><title>In-situ temperature control table of photoelectron spectrometer</title><author>YAO WENQING ; LIU QINGGANG ; MA JUNGUO ; YANG LIPING ; DUAN JIANXIA</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_CN217404187UU3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>chi ; eng</language><creationdate>2022</creationdate><topic>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</topic><topic>MEASURING</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>YAO WENQING</creatorcontrib><creatorcontrib>LIU QINGGANG</creatorcontrib><creatorcontrib>MA JUNGUO</creatorcontrib><creatorcontrib>YANG LIPING</creatorcontrib><creatorcontrib>DUAN JIANXIA</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>YAO WENQING</au><au>LIU QINGGANG</au><au>MA JUNGUO</au><au>YANG LIPING</au><au>DUAN JIANXIA</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>In-situ temperature control table of photoelectron spectrometer</title><date>2022-09-09</date><risdate>2022</risdate><abstract>The embodiment of the utility model relates to the technical field of photoelectron spectroscopy analysis and testing, in particular to an in-situ temperature control table of a photoelectron spectrometer. According to the in-situ temperature control table of the photoelectron spectrometer provided by the embodiment of the invention, the liquid nitrogen cooling piece is in contact with the sample holder through the cooling piece embedding hole formed in the bottom surface of the first heating platform so as to exchange heat and realize low-temperature refrigeration; therefore, the sample can be selectively heated according to actual requirements, so that the requirement of sample pretreatment at an ultralow temperature (100K to 373K) and a high temperature (300K to 573K) is met. In addition, the in-situ temperature control table of the photoelectron spectrometer is simple in structure, convenient to disassemble and assemble and low in production and manufacturing cost.
本申请实施例涉及光电子能谱分析测试技术领域，尤其是涉及一种光电子能谱仪原位温控台</abstract><oa>free_for_read</oa></addata></record> |
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| subjects | INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING PHYSICS TESTING |
| title | In-situ temperature control table of photoelectron spectrometer |
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