Testing device for infrared proximity and ambient light brightness inductive sensor
The utility model discloses a testing device for an infrared proximity and ambient light brightness inductive sensor, and relates to the field of chip testing, a light source is arranged in a shading camera obscura of the testing device, a chip to be tested is placed on a testing tool and is located...
Gespeichert in:
| Hauptverfasser: | , |
|---|---|
| Format: | Patent |
| Sprache: | chi ; eng |
| Schlagworte: | |
| Online-Zugang: | Volltext bestellen |
| Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
| container_end_page | |
|---|---|
| container_issue | |
| container_start_page | |
| container_title | |
| container_volume | |
| creator | YAO YUFENG ZHANG HANGANG |
| description | The utility model discloses a testing device for an infrared proximity and ambient light brightness inductive sensor, and relates to the field of chip testing, a light source is arranged in a shading camera obscura of the testing device, a chip to be tested is placed on a testing tool and is located on a direct light path of the light source, and a chip pin of the chip to be tested is connected to a testing machine. When the reflecting plate is driven by the position switching mechanism to be located at the first test position, the reflecting plate is located above the test tool, and the vertical distance between the reflecting plate and the to-be-tested chip is smaller than a preset distance, so that the test of an infrared proximity sensing function can be realized; and when the reflecting plate is located at the second test position under the driving of the position switching mechanism, the reflecting plate is located outside a direct light path from the light source to the test tool, so that the light sou |
| format | Patent |
| fullrecord | <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_CN217403484UU</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>CN217403484UU</sourcerecordid><originalsourceid>FETCH-epo_espacenet_CN217403484UU3</originalsourceid><addsrcrecordid>eNqNyrEKwjAQBuAuDqK-w-EuqA3oXhQnF9u5pM2fetBeSi4WfXsVfACnb_nm2a2EJpaOHCZuQT5EYvHRRjgaY3jywOlFVhzZoWFIop67e6ImfhGofr57tIknkEI0xGU287ZXrH4usvX5VBaXDcZQQ0fbQpDq4rrfHcw2N0dTVflf6Q0bODnu</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>Testing device for infrared proximity and ambient light brightness inductive sensor</title><source>esp@cenet</source><creator>YAO YUFENG ; ZHANG HANGANG</creator><creatorcontrib>YAO YUFENG ; ZHANG HANGANG</creatorcontrib><description>The utility model discloses a testing device for an infrared proximity and ambient light brightness inductive sensor, and relates to the field of chip testing, a light source is arranged in a shading camera obscura of the testing device, a chip to be tested is placed on a testing tool and is located on a direct light path of the light source, and a chip pin of the chip to be tested is connected to a testing machine. When the reflecting plate is driven by the position switching mechanism to be located at the first test position, the reflecting plate is located above the test tool, and the vertical distance between the reflecting plate and the to-be-tested chip is smaller than a preset distance, so that the test of an infrared proximity sensing function can be realized; and when the reflecting plate is located at the second test position under the driving of the position switching mechanism, the reflecting plate is located outside a direct light path from the light source to the test tool, so that the light sou</description><language>chi ; eng</language><subject>ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVEREDIN A SINGLE OTHER SUBCLASS ; MEASURING ; MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE ; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR ; PHYSICS ; TARIFF METERING APPARATUS ; TESTING</subject><creationdate>2022</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20220909&DB=EPODOC&CC=CN&NR=217403484U$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25543,76294</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20220909&DB=EPODOC&CC=CN&NR=217403484U$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>YAO YUFENG</creatorcontrib><creatorcontrib>ZHANG HANGANG</creatorcontrib><title>Testing device for infrared proximity and ambient light brightness inductive sensor</title><description>The utility model discloses a testing device for an infrared proximity and ambient light brightness inductive sensor, and relates to the field of chip testing, a light source is arranged in a shading camera obscura of the testing device, a chip to be tested is placed on a testing tool and is located on a direct light path of the light source, and a chip pin of the chip to be tested is connected to a testing machine. When the reflecting plate is driven by the position switching mechanism to be located at the first test position, the reflecting plate is located above the test tool, and the vertical distance between the reflecting plate and the to-be-tested chip is smaller than a preset distance, so that the test of an infrared proximity sensing function can be realized; and when the reflecting plate is located at the second test position under the driving of the position switching mechanism, the reflecting plate is located outside a direct light path from the light source to the test tool, so that the light sou</description><subject>ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVEREDIN A SINGLE OTHER SUBCLASS</subject><subject>MEASURING</subject><subject>MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE</subject><subject>MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR</subject><subject>PHYSICS</subject><subject>TARIFF METERING APPARATUS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2022</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNqNyrEKwjAQBuAuDqK-w-EuqA3oXhQnF9u5pM2fetBeSi4WfXsVfACnb_nm2a2EJpaOHCZuQT5EYvHRRjgaY3jywOlFVhzZoWFIop67e6ImfhGofr57tIknkEI0xGU287ZXrH4usvX5VBaXDcZQQ0fbQpDq4rrfHcw2N0dTVflf6Q0bODnu</recordid><startdate>20220909</startdate><enddate>20220909</enddate><creator>YAO YUFENG</creator><creator>ZHANG HANGANG</creator><scope>EVB</scope></search><sort><creationdate>20220909</creationdate><title>Testing device for infrared proximity and ambient light brightness inductive sensor</title><author>YAO YUFENG ; ZHANG HANGANG</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_CN217403484UU3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>chi ; eng</language><creationdate>2022</creationdate><topic>ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVEREDIN A SINGLE OTHER SUBCLASS</topic><topic>MEASURING</topic><topic>MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE</topic><topic>MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR</topic><topic>PHYSICS</topic><topic>TARIFF METERING APPARATUS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>YAO YUFENG</creatorcontrib><creatorcontrib>ZHANG HANGANG</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>YAO YUFENG</au><au>ZHANG HANGANG</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Testing device for infrared proximity and ambient light brightness inductive sensor</title><date>2022-09-09</date><risdate>2022</risdate><abstract>The utility model discloses a testing device for an infrared proximity and ambient light brightness inductive sensor, and relates to the field of chip testing, a light source is arranged in a shading camera obscura of the testing device, a chip to be tested is placed on a testing tool and is located on a direct light path of the light source, and a chip pin of the chip to be tested is connected to a testing machine. When the reflecting plate is driven by the position switching mechanism to be located at the first test position, the reflecting plate is located above the test tool, and the vertical distance between the reflecting plate and the to-be-tested chip is smaller than a preset distance, so that the test of an infrared proximity sensing function can be realized; and when the reflecting plate is located at the second test position under the driving of the position switching mechanism, the reflecting plate is located outside a direct light path from the light source to the test tool, so that the light sou</abstract><oa>free_for_read</oa></addata></record> |
| fulltext | fulltext_linktorsrc |
| identifier | |
| ispartof | |
| issn | |
| language | chi ; eng |
| recordid | cdi_epo_espacenet_CN217403484UU |
| source | esp@cenet |
| subjects | ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVEREDIN A SINGLE OTHER SUBCLASS MEASURING MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR PHYSICS TARIFF METERING APPARATUS TESTING |
| title | Testing device for infrared proximity and ambient light brightness inductive sensor |
| url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-23T05%3A53%3A35IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=YAO%20YUFENG&rft.date=2022-09-09&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3ECN217403484UU%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true |