Testing device
The utility model provides a testing device which is used for testing a circuit board. The testing device comprises a base, a testing jig, two moving assemblies, two probe assemblies and a detection module. The test fixture is arranged on the base, the two movement assemblies are both in sliding con...
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| creator | LU HESHEN HU XINGYI LI YUHUI LI JIANLONG LU CHENGXIAN ZHANG DONGWEI DU KANG LIU JINQUAN |
| description | The utility model provides a testing device which is used for testing a circuit board. The testing device comprises a base, a testing jig, two moving assemblies, two probe assemblies and a detection module. The test fixture is arranged on the base, the two movement assemblies are both in sliding connection with the base, and each probe assembly is rotationally connected to one movement assembly and located on the opposite side faces of the two movement assemblies; the detection module is electrically connected with the two probe assemblies and receives detection signals of the two probe assemblies. According to the utility model, the two moving assemblies respectively drive the two probe assemblies to move to the first detection point and the second detection point of the circuit board, so that the two probe assemblies are respectively contacted with the first detection point and the second detection point, and the detection module is used for receiving detection signals of the two probe assemblies. The two p |
| format | Patent |
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The testing device comprises a base, a testing jig, two moving assemblies, two probe assemblies and a detection module. The test fixture is arranged on the base, the two movement assemblies are both in sliding connection with the base, and each probe assembly is rotationally connected to one movement assembly and located on the opposite side faces of the two movement assemblies; the detection module is electrically connected with the two probe assemblies and receives detection signals of the two probe assemblies. According to the utility model, the two moving assemblies respectively drive the two probe assemblies to move to the first detection point and the second detection point of the circuit board, so that the two probe assemblies are respectively contacted with the first detection point and the second detection point, and the detection module is used for receiving detection signals of the two probe assemblies. 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| language | chi ; eng |
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| subjects | MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS TESTING |
| title | Testing device |
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