Detection equipment for limited space operation
The utility model discloses a detection device used for limited space operation, comprising an operation mechanism suitable for stretching into a limited space to be detected; the sampling mechanism is arranged on the operating mechanism; and the sampling mechanism is used for smearing and sampling...
Gespeichert in:
| Hauptverfasser: | , , , , , , , |
|---|---|
| Format: | Patent |
| Sprache: | chi ; eng |
| Schlagworte: | |
| Online-Zugang: | Volltext bestellen |
| Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
| container_end_page | |
|---|---|
| container_issue | |
| container_start_page | |
| container_title | |
| container_volume | |
| creator | WU FENGJI XIA YANAN LIU HONGYU DING JUNPING WANG BAOLIANG LIU YONGFENG SU YUQIAN MA SIWEI |
| description | The utility model discloses a detection device used for limited space operation, comprising an operation mechanism suitable for stretching into a limited space to be detected; the sampling mechanism is arranged on the operating mechanism; and the sampling mechanism is used for smearing and sampling the surface to be detected. By means of the arrangement, an operator can directly stretch the sampling mechanism into a to-be-detected limited space through the operating mechanism, namely stretch the sampling mechanism into a to-be-detected tank or bin, so that the operator does not need to directly go into the tank or bin to carry out limited space operation, and safety accidents of the operator are effectively avoided. Meanwhile, the operation process is simple, information is obtained in time, and the operation efficiency is improved.
本实用新型公开了一种用于有限空间作业的检测设备，该检测设备包括：操作机构，适于伸入待检测的有限空间中；采样机构，设置在所述操作机构上；所述采样机构用于对待测表面进行涂抹采样。如此设置，作业人员可以直接通过操作机构将采样机构伸入到待检测的有限空间中，即伸入到待检测的罐、仓中，从而不用直接下罐、仓进行有限空间作业，有效避免人员安全事故的发生。同时，操作流程简单 |
| format | Patent |
| fullrecord | <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_CN217059898UU</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>CN217059898UU</sourcerecordid><originalsourceid>FETCH-epo_espacenet_CN217059898UU3</originalsourceid><addsrcrecordid>eNrjZNB3SS1JTS7JzM9TSC0szSzITc0rUUjLL1LIyczNLElNUSguSExOVcgvSC1KBKniYWBNS8wpTuWF0twMSm6uIc4euqkF-fGpYMV5qSXxzn5GhuYGppYWlhahocZEKQIAr6wsLw</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>Detection equipment for limited space operation</title><source>esp@cenet</source><creator>WU FENGJI ; XIA YANAN ; LIU HONGYU ; DING JUNPING ; WANG BAOLIANG ; LIU YONGFENG ; SU YUQIAN ; MA SIWEI</creator><creatorcontrib>WU FENGJI ; XIA YANAN ; LIU HONGYU ; DING JUNPING ; WANG BAOLIANG ; LIU YONGFENG ; SU YUQIAN ; MA SIWEI</creatorcontrib><description>The utility model discloses a detection device used for limited space operation, comprising an operation mechanism suitable for stretching into a limited space to be detected; the sampling mechanism is arranged on the operating mechanism; and the sampling mechanism is used for smearing and sampling the surface to be detected. By means of the arrangement, an operator can directly stretch the sampling mechanism into a to-be-detected limited space through the operating mechanism, namely stretch the sampling mechanism into a to-be-detected tank or bin, so that the operator does not need to directly go into the tank or bin to carry out limited space operation, and safety accidents of the operator are effectively avoided. Meanwhile, the operation process is simple, information is obtained in time, and the operation efficiency is improved.
本实用新型公开了一种用于有限空间作业的检测设备，该检测设备包括：操作机构，适于伸入待检测的有限空间中；采样机构，设置在所述操作机构上；所述采样机构用于对待测表面进行涂抹采样。如此设置，作业人员可以直接通过操作机构将采样机构伸入到待检测的有限空间中，即伸入到待检测的罐、仓中，从而不用直接下罐、仓进行有限空间作业，有效避免人员安全事故的发生。同时，操作流程简单</description><language>chi ; eng</language><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES ; MEASURING ; PHYSICS ; TESTING</subject><creationdate>2022</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20220726&DB=EPODOC&CC=CN&NR=217059898U$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25542,76289</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20220726&DB=EPODOC&CC=CN&NR=217059898U$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>WU FENGJI</creatorcontrib><creatorcontrib>XIA YANAN</creatorcontrib><creatorcontrib>LIU HONGYU</creatorcontrib><creatorcontrib>DING JUNPING</creatorcontrib><creatorcontrib>WANG BAOLIANG</creatorcontrib><creatorcontrib>LIU YONGFENG</creatorcontrib><creatorcontrib>SU YUQIAN</creatorcontrib><creatorcontrib>MA SIWEI</creatorcontrib><title>Detection equipment for limited space operation</title><description>The utility model discloses a detection device used for limited space operation, comprising an operation mechanism suitable for stretching into a limited space to be detected; the sampling mechanism is arranged on the operating mechanism; and the sampling mechanism is used for smearing and sampling the surface to be detected. By means of the arrangement, an operator can directly stretch the sampling mechanism into a to-be-detected limited space through the operating mechanism, namely stretch the sampling mechanism into a to-be-detected tank or bin, so that the operator does not need to directly go into the tank or bin to carry out limited space operation, and safety accidents of the operator are effectively avoided. Meanwhile, the operation process is simple, information is obtained in time, and the operation efficiency is improved.
本实用新型公开了一种用于有限空间作业的检测设备，该检测设备包括：操作机构，适于伸入待检测的有限空间中；采样机构，设置在所述操作机构上；所述采样机构用于对待测表面进行涂抹采样。如此设置，作业人员可以直接通过操作机构将采样机构伸入到待检测的有限空间中，即伸入到待检测的罐、仓中，从而不用直接下罐、仓进行有限空间作业，有效避免人员安全事故的发生。同时，操作流程简单</description><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</subject><subject>MEASURING</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2022</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZNB3SS1JTS7JzM9TSC0szSzITc0rUUjLL1LIyczNLElNUSguSExOVcgvSC1KBKniYWBNS8wpTuWF0twMSm6uIc4euqkF-fGpYMV5qSXxzn5GhuYGppYWlhahocZEKQIAr6wsLw</recordid><startdate>20220726</startdate><enddate>20220726</enddate><creator>WU FENGJI</creator><creator>XIA YANAN</creator><creator>LIU HONGYU</creator><creator>DING JUNPING</creator><creator>WANG BAOLIANG</creator><creator>LIU YONGFENG</creator><creator>SU YUQIAN</creator><creator>MA SIWEI</creator><scope>EVB</scope></search><sort><creationdate>20220726</creationdate><title>Detection equipment for limited space operation</title><author>WU FENGJI ; XIA YANAN ; LIU HONGYU ; DING JUNPING ; WANG BAOLIANG ; LIU YONGFENG ; SU YUQIAN ; MA SIWEI</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_CN217059898UU3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>chi ; eng</language><creationdate>2022</creationdate><topic>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</topic><topic>MEASURING</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>WU FENGJI</creatorcontrib><creatorcontrib>XIA YANAN</creatorcontrib><creatorcontrib>LIU HONGYU</creatorcontrib><creatorcontrib>DING JUNPING</creatorcontrib><creatorcontrib>WANG BAOLIANG</creatorcontrib><creatorcontrib>LIU YONGFENG</creatorcontrib><creatorcontrib>SU YUQIAN</creatorcontrib><creatorcontrib>MA SIWEI</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>WU FENGJI</au><au>XIA YANAN</au><au>LIU HONGYU</au><au>DING JUNPING</au><au>WANG BAOLIANG</au><au>LIU YONGFENG</au><au>SU YUQIAN</au><au>MA SIWEI</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Detection equipment for limited space operation</title><date>2022-07-26</date><risdate>2022</risdate><abstract>The utility model discloses a detection device used for limited space operation, comprising an operation mechanism suitable for stretching into a limited space to be detected; the sampling mechanism is arranged on the operating mechanism; and the sampling mechanism is used for smearing and sampling the surface to be detected. By means of the arrangement, an operator can directly stretch the sampling mechanism into a to-be-detected limited space through the operating mechanism, namely stretch the sampling mechanism into a to-be-detected tank or bin, so that the operator does not need to directly go into the tank or bin to carry out limited space operation, and safety accidents of the operator are effectively avoided. Meanwhile, the operation process is simple, information is obtained in time, and the operation efficiency is improved.
本实用新型公开了一种用于有限空间作业的检测设备，该检测设备包括：操作机构，适于伸入待检测的有限空间中；采样机构，设置在所述操作机构上；所述采样机构用于对待测表面进行涂抹采样。如此设置，作业人员可以直接通过操作机构将采样机构伸入到待检测的有限空间中，即伸入到待检测的罐、仓中，从而不用直接下罐、仓进行有限空间作业，有效避免人员安全事故的发生。同时，操作流程简单</abstract><oa>free_for_read</oa></addata></record> |
| fulltext | fulltext_linktorsrc |
| identifier | |
| ispartof | |
| issn | |
| language | chi ; eng |
| recordid | cdi_epo_espacenet_CN217059898UU |
| source | esp@cenet |
| subjects | INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING PHYSICS TESTING |
| title | Detection equipment for limited space operation |
| url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-02-10T01%3A22%3A59IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=WU%20FENGJI&rft.date=2022-07-26&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3ECN217059898UU%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true |