Full-spectrum high-resolution microscopic spectrum analysis integrated system

Full-spectrum high-resolution microscopic spectrum analysis integrated system

The utility model relates to a full-spectrum high-resolution microscopic spectrum analysis integrated system. The full-spectrum high-resolution microscopic spectrum analysis integrated system comprises a microscope platform, an objective table, a light source system, an imaging system and a computer...

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1. Verfasser: JIANG QUANLIANG
Format: Patent
Sprache:chi ; eng
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INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS
OPTICS
PHYSICS
TESTING
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creator JIANG QUANLIANG
description The utility model relates to a full-spectrum high-resolution microscopic spectrum analysis integrated system. The full-spectrum high-resolution microscopic spectrum analysis integrated system comprises a microscope platform, an objective table, a light source system, an imaging system and a computer control system, the microscope platform has a transmission and reflection dual illumination light path and a 200-2500nm wide spectrum working performance; the objective table is arranged on the microscope platform and comprises a mechanical objective table, a colorimetric objective table and a three-dimensional electrophoresis objective table; the light source system provides a light source for the microscope platform, and the light source system comprises a light emitting device and a monochromator; the imaging system comprises a chromatic aberration-free objective lens imaging device, a digital microscopic camera imaging device and a spectral imaging device. The device disclosed by the utility model can be used
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subjects INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS
OPTICS
PHYSICS
TESTING
title Full-spectrum high-resolution microscopic spectrum analysis integrated system
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