High-efficiency chip testing equipment
The utility model discloses a high-efficiency chip testing device comprising a feeding machine table which is provided with at least one group of feeding moving assembly, material supplementing moving assembly and material supplementing chip assembly; the robot feeding and discharging module compris...
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creator | YE ZHENGXING TANG MIN HE RUN |
description | The utility model discloses a high-efficiency chip testing device comprising a feeding machine table which is provided with at least one group of feeding moving assembly, material supplementing moving assembly and material supplementing chip assembly; the robot feeding and discharging module comprises a feeding and discharging robot, a robot moving assembly and a robot feeding and discharging assembly; at least one group of test machines, each group of test machines comprises at least one group of test modules, and each group of test modules is used for carrying out function test on the chips on the charging tray; and the discharging machine table is provided with at least one set of discharging moving assembly, a tray grabbing assembly and a chip grabbing assembly. According to the utility model, manual labor is replaced by automatic testing, the positioning is accurate, the testing efficiency can be greatly improved, the chip on the whole charging tray can be loaded, unloaded and tested at the same time, an |
format | Patent |
fullrecord | <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_CN215997609UU</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>CN215997609UU</sourcerecordid><originalsourceid>FETCH-epo_espacenet_CN215997609UU3</originalsourceid><addsrcrecordid>eNrjZFDzyEzP0E1NS8tMzkzNS65USM7ILFAoSS0uycxLV0gtLM0syE3NK-FhYE1LzClO5YXS3AxKbq4hzh66qQX58anFBYnJqXmpJfHOfkaGppaW5mYGlqGhxkQpAgDPvyid</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>High-efficiency chip testing equipment</title><source>esp@cenet</source><creator>YE ZHENGXING ; TANG MIN ; HE RUN</creator><creatorcontrib>YE ZHENGXING ; TANG MIN ; HE RUN</creatorcontrib><description>The utility model discloses a high-efficiency chip testing device comprising a feeding machine table which is provided with at least one group of feeding moving assembly, material supplementing moving assembly and material supplementing chip assembly; the robot feeding and discharging module comprises a feeding and discharging robot, a robot moving assembly and a robot feeding and discharging assembly; at least one group of test machines, each group of test machines comprises at least one group of test modules, and each group of test modules is used for carrying out function test on the chips on the charging tray; and the discharging machine table is provided with at least one set of discharging moving assembly, a tray grabbing assembly and a chip grabbing assembly. According to the utility model, manual labor is replaced by automatic testing, the positioning is accurate, the testing efficiency can be greatly improved, the chip on the whole charging tray can be loaded, unloaded and tested at the same time, an</description><language>chi ; eng</language><subject>PERFORMING OPERATIONS ; POSTAL SORTING ; SEPARATING SOLIDS FROM SOLIDS ; SORTING ; SORTING INDIVIDUAL ARTICLES, OR BULK MATERIAL FIT TO BE SORTEDPIECE-MEAL, e.g. BY PICKING ; TRANSPORTING</subject><creationdate>2022</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20220311&DB=EPODOC&CC=CN&NR=215997609U$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25543,76293</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20220311&DB=EPODOC&CC=CN&NR=215997609U$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>YE ZHENGXING</creatorcontrib><creatorcontrib>TANG MIN</creatorcontrib><creatorcontrib>HE RUN</creatorcontrib><title>High-efficiency chip testing equipment</title><description>The utility model discloses a high-efficiency chip testing device comprising a feeding machine table which is provided with at least one group of feeding moving assembly, material supplementing moving assembly and material supplementing chip assembly; the robot feeding and discharging module comprises a feeding and discharging robot, a robot moving assembly and a robot feeding and discharging assembly; at least one group of test machines, each group of test machines comprises at least one group of test modules, and each group of test modules is used for carrying out function test on the chips on the charging tray; and the discharging machine table is provided with at least one set of discharging moving assembly, a tray grabbing assembly and a chip grabbing assembly. According to the utility model, manual labor is replaced by automatic testing, the positioning is accurate, the testing efficiency can be greatly improved, the chip on the whole charging tray can be loaded, unloaded and tested at the same time, an</description><subject>PERFORMING OPERATIONS</subject><subject>POSTAL SORTING</subject><subject>SEPARATING SOLIDS FROM SOLIDS</subject><subject>SORTING</subject><subject>SORTING INDIVIDUAL ARTICLES, OR BULK MATERIAL FIT TO BE SORTEDPIECE-MEAL, e.g. BY PICKING</subject><subject>TRANSPORTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2022</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZFDzyEzP0E1NS8tMzkzNS65USM7ILFAoSS0uycxLV0gtLM0syE3NK-FhYE1LzClO5YXS3AxKbq4hzh66qQX58anFBYnJqXmpJfHOfkaGppaW5mYGlqGhxkQpAgDPvyid</recordid><startdate>20220311</startdate><enddate>20220311</enddate><creator>YE ZHENGXING</creator><creator>TANG MIN</creator><creator>HE RUN</creator><scope>EVB</scope></search><sort><creationdate>20220311</creationdate><title>High-efficiency chip testing equipment</title><author>YE ZHENGXING ; TANG MIN ; HE RUN</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_CN215997609UU3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>chi ; eng</language><creationdate>2022</creationdate><topic>PERFORMING OPERATIONS</topic><topic>POSTAL SORTING</topic><topic>SEPARATING SOLIDS FROM SOLIDS</topic><topic>SORTING</topic><topic>SORTING INDIVIDUAL ARTICLES, OR BULK MATERIAL FIT TO BE SORTEDPIECE-MEAL, e.g. BY PICKING</topic><topic>TRANSPORTING</topic><toplevel>online_resources</toplevel><creatorcontrib>YE ZHENGXING</creatorcontrib><creatorcontrib>TANG MIN</creatorcontrib><creatorcontrib>HE RUN</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>YE ZHENGXING</au><au>TANG MIN</au><au>HE RUN</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>High-efficiency chip testing equipment</title><date>2022-03-11</date><risdate>2022</risdate><abstract>The utility model discloses a high-efficiency chip testing device comprising a feeding machine table which is provided with at least one group of feeding moving assembly, material supplementing moving assembly and material supplementing chip assembly; the robot feeding and discharging module comprises a feeding and discharging robot, a robot moving assembly and a robot feeding and discharging assembly; at least one group of test machines, each group of test machines comprises at least one group of test modules, and each group of test modules is used for carrying out function test on the chips on the charging tray; and the discharging machine table is provided with at least one set of discharging moving assembly, a tray grabbing assembly and a chip grabbing assembly. According to the utility model, manual labor is replaced by automatic testing, the positioning is accurate, the testing efficiency can be greatly improved, the chip on the whole charging tray can be loaded, unloaded and tested at the same time, an</abstract><oa>free_for_read</oa></addata></record> |
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language | chi ; eng |
recordid | cdi_epo_espacenet_CN215997609UU |
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subjects | PERFORMING OPERATIONS POSTAL SORTING SEPARATING SOLIDS FROM SOLIDS SORTING SORTING INDIVIDUAL ARTICLES, OR BULK MATERIAL FIT TO BE SORTEDPIECE-MEAL, e.g. BY PICKING TRANSPORTING |
title | High-efficiency chip testing equipment |
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