Testing mechanism and testing device
The utility model discloses a testing mechanism and a testing device, and relates to the technical field of electrical parameter testing. The first conductive piece comprises a first section and a second section, the first section and the second section are arranged at an included angle and form a f...
Gespeichert in:
| Hauptverfasser: | , |
|---|---|
| Format: | Patent |
| Sprache: | chi ; eng |
| Schlagworte: | |
| Online-Zugang: | Volltext bestellen |
| Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
| container_end_page | |
|---|---|
| container_issue | |
| container_start_page | |
| container_title | |
| container_volume | |
| creator | YANG XURI ZHAO YU |
| description | The utility model discloses a testing mechanism and a testing device, and relates to the technical field of electrical parameter testing. The first conductive piece comprises a first section and a second section, the first section and the second section are arranged at an included angle and form a first included angle, and the first included angle is a non-obtuse angle; the second conductive piece comprises a third section and a fourth section, the third section and the fourth section are arranged in an included angle and form a second included angle, and the second included angle is a non-obtuse angle; the first included angle and the second included angle are oppositely arranged, the two sides of the first elastic piece are fixedly connected with the second section and the fourth section respectively to form an opening so that the electronic element can abut against the surfaces of the second section and the fourth section, and the first elastic piece can make the first section and the third section close t |
| format | Patent |
| fullrecord | <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_CN215986351UU</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>CN215986351UU</sourcerecordid><originalsourceid>FETCH-epo_espacenet_CN215986351UU3</originalsourceid><addsrcrecordid>eNrjZFAJSS0uycxLV8hNTc5IzMsszlVIzEtRKIGKpqSWZSan8jCwpiXmFKfyQmluBiU31xBnD93Ugvz41OKCxOTUvNSSeGc_I0NTSwszY1PD0FBjohQBAGOXJ6M</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>Testing mechanism and testing device</title><source>esp@cenet</source><creator>YANG XURI ; ZHAO YU</creator><creatorcontrib>YANG XURI ; ZHAO YU</creatorcontrib><description>The utility model discloses a testing mechanism and a testing device, and relates to the technical field of electrical parameter testing. The first conductive piece comprises a first section and a second section, the first section and the second section are arranged at an included angle and form a first included angle, and the first included angle is a non-obtuse angle; the second conductive piece comprises a third section and a fourth section, the third section and the fourth section are arranged in an included angle and form a second included angle, and the second included angle is a non-obtuse angle; the first included angle and the second included angle are oppositely arranged, the two sides of the first elastic piece are fixedly connected with the second section and the fourth section respectively to form an opening so that the electronic element can abut against the surfaces of the second section and the fourth section, and the first elastic piece can make the first section and the third section close t</description><language>chi ; eng</language><subject>MEASURING ; MEASURING ELECTRIC VARIABLES ; MEASURING MAGNETIC VARIABLES ; PHYSICS ; TESTING</subject><creationdate>2022</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20220308&DB=EPODOC&CC=CN&NR=215986351U$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,309,781,886,25566,76549</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20220308&DB=EPODOC&CC=CN&NR=215986351U$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>YANG XURI</creatorcontrib><creatorcontrib>ZHAO YU</creatorcontrib><title>Testing mechanism and testing device</title><description>The utility model discloses a testing mechanism and a testing device, and relates to the technical field of electrical parameter testing. The first conductive piece comprises a first section and a second section, the first section and the second section are arranged at an included angle and form a first included angle, and the first included angle is a non-obtuse angle; the second conductive piece comprises a third section and a fourth section, the third section and the fourth section are arranged in an included angle and form a second included angle, and the second included angle is a non-obtuse angle; the first included angle and the second included angle are oppositely arranged, the two sides of the first elastic piece are fixedly connected with the second section and the fourth section respectively to form an opening so that the electronic element can abut against the surfaces of the second section and the fourth section, and the first elastic piece can make the first section and the third section close t</description><subject>MEASURING</subject><subject>MEASURING ELECTRIC VARIABLES</subject><subject>MEASURING MAGNETIC VARIABLES</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2022</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZFAJSS0uycxLV8hNTc5IzMsszlVIzEtRKIGKpqSWZSan8jCwpiXmFKfyQmluBiU31xBnD93Ugvz41OKCxOTUvNSSeGc_I0NTSwszY1PD0FBjohQBAGOXJ6M</recordid><startdate>20220308</startdate><enddate>20220308</enddate><creator>YANG XURI</creator><creator>ZHAO YU</creator><scope>EVB</scope></search><sort><creationdate>20220308</creationdate><title>Testing mechanism and testing device</title><author>YANG XURI ; ZHAO YU</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_CN215986351UU3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>chi ; eng</language><creationdate>2022</creationdate><topic>MEASURING</topic><topic>MEASURING ELECTRIC VARIABLES</topic><topic>MEASURING MAGNETIC VARIABLES</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>YANG XURI</creatorcontrib><creatorcontrib>ZHAO YU</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>YANG XURI</au><au>ZHAO YU</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Testing mechanism and testing device</title><date>2022-03-08</date><risdate>2022</risdate><abstract>The utility model discloses a testing mechanism and a testing device, and relates to the technical field of electrical parameter testing. The first conductive piece comprises a first section and a second section, the first section and the second section are arranged at an included angle and form a first included angle, and the first included angle is a non-obtuse angle; the second conductive piece comprises a third section and a fourth section, the third section and the fourth section are arranged in an included angle and form a second included angle, and the second included angle is a non-obtuse angle; the first included angle and the second included angle are oppositely arranged, the two sides of the first elastic piece are fixedly connected with the second section and the fourth section respectively to form an opening so that the electronic element can abut against the surfaces of the second section and the fourth section, and the first elastic piece can make the first section and the third section close t</abstract><oa>free_for_read</oa></addata></record> |
| fulltext | fulltext_linktorsrc |
| identifier | |
| ispartof | |
| issn | |
| language | chi ; eng |
| recordid | cdi_epo_espacenet_CN215986351UU |
| source | esp@cenet |
| subjects | MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS TESTING |
| title | Testing mechanism and testing device |
| url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2024-12-18T09%3A04%3A25IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=YANG%20XURI&rft.date=2022-03-08&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3ECN215986351UU%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true |