Clamp for testing steady-state thermal resistance of glass-sealed diode

Clamp for testing steady-state thermal resistance of glass-sealed diode

The utility model discloses a glass-sealed diode steady-state thermal resistance test fixture which comprises a bottom plate, a clamping assembly is arranged above the bottom plate, a sliding assembly is arranged at the lower end of the clamping assembly, a driving assembly is arranged outside the s...

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Hauptverfasser: FU GUANGRONG, LAN SHUYUAN
Format: Patent
Sprache:chi ; eng
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MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
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creator FU GUANGRONG
LAN SHUYUAN
description The utility model discloses a glass-sealed diode steady-state thermal resistance test fixture which comprises a bottom plate, a clamping assembly is arranged above the bottom plate, a sliding assembly is arranged at the lower end of the clamping assembly, a driving assembly is arranged outside the sliding assembly, the sliding assembly is located on the upper surface of the bottom plate, a control assembly is arranged on one side of the outer portion of the bottom plate, and the control assembly is located on the lower surface of the bottom plate. The clamping assembly comprises a placing plate, two sets of pneumatic cylinders, two sets of air pipes and two sets of clamping blocks, and the placing plate is located above the bottom plate; when the clamp is actually needed to be used, the glass-sealed diode needing to be fixed is clamped through the clamping assembly, the effect of clamping and fixing the glass-sealed diodes of different sizes is achieved through the clamping assembly, and when the glass-sealed
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fullrecord <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_CN215641637UU</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>CN215641637UU</sourcerecordid><originalsourceid>FETCH-epo_espacenet_CN215641637UU3</originalsourceid><addsrcrecordid>eNqNyjsOwjAQRVE3FAjYw4jeRQiEBVh8KipSR6P4JVhybMszDbuHggVQXenors3NRV4KTbmSQjSkmUTB_m1FWUH6Ql04UoWEr6QRlCeaI4tYAUd48iF7bM1q4ijY_box--vl6e4WJQ-QwiMSdHCPQ3Pqjk3Xnvu-_Wv6ANasNL8</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>Clamp for testing steady-state thermal resistance of glass-sealed diode</title><source>esp@cenet</source><creator>FU GUANGRONG ; LAN SHUYUAN</creator><creatorcontrib>FU GUANGRONG ; LAN SHUYUAN</creatorcontrib><description>The utility model discloses a glass-sealed diode steady-state thermal resistance test fixture which comprises a bottom plate, a clamping assembly is arranged above the bottom plate, a sliding assembly is arranged at the lower end of the clamping assembly, a driving assembly is arranged outside the sliding assembly, the sliding assembly is located on the upper surface of the bottom plate, a control assembly is arranged on one side of the outer portion of the bottom plate, and the control assembly is located on the lower surface of the bottom plate. The clamping assembly comprises a placing plate, two sets of pneumatic cylinders, two sets of air pipes and two sets of clamping blocks, and the placing plate is located above the bottom plate; when the clamp is actually needed to be used, the glass-sealed diode needing to be fixed is clamped through the clamping assembly, the effect of clamping and fixing the glass-sealed diodes of different sizes is achieved through the clamping assembly, and when the glass-sealed</description><language>chi ; eng</language><subject>MEASURING ; MEASURING ELECTRIC VARIABLES ; MEASURING MAGNETIC VARIABLES ; PHYSICS ; TESTING</subject><creationdate>2022</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20220125&amp;DB=EPODOC&amp;CC=CN&amp;NR=215641637U$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25543,76294</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20220125&amp;DB=EPODOC&amp;CC=CN&amp;NR=215641637U$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>FU GUANGRONG</creatorcontrib><creatorcontrib>LAN SHUYUAN</creatorcontrib><title>Clamp for testing steady-state thermal resistance of glass-sealed diode</title><description>The utility model discloses a glass-sealed diode steady-state thermal resistance test fixture which comprises a bottom plate, a clamping assembly is arranged above the bottom plate, a sliding assembly is arranged at the lower end of the clamping assembly, a driving assembly is arranged outside the sliding assembly, the sliding assembly is located on the upper surface of the bottom plate, a control assembly is arranged on one side of the outer portion of the bottom plate, and the control assembly is located on the lower surface of the bottom plate. The clamping assembly comprises a placing plate, two sets of pneumatic cylinders, two sets of air pipes and two sets of clamping blocks, and the placing plate is located above the bottom plate; when the clamp is actually needed to be used, the glass-sealed diode needing to be fixed is clamped through the clamping assembly, the effect of clamping and fixing the glass-sealed diodes of different sizes is achieved through the clamping assembly, and when the glass-sealed</description><subject>MEASURING</subject><subject>MEASURING ELECTRIC VARIABLES</subject><subject>MEASURING MAGNETIC VARIABLES</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2022</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNqNyjsOwjAQRVE3FAjYw4jeRQiEBVh8KipSR6P4JVhybMszDbuHggVQXenors3NRV4KTbmSQjSkmUTB_m1FWUH6Ql04UoWEr6QRlCeaI4tYAUd48iF7bM1q4ijY_box--vl6e4WJQ-QwiMSdHCPQ3Pqjk3Xnvu-_Wv6ANasNL8</recordid><startdate>20220125</startdate><enddate>20220125</enddate><creator>FU GUANGRONG</creator><creator>LAN SHUYUAN</creator><scope>EVB</scope></search><sort><creationdate>20220125</creationdate><title>Clamp for testing steady-state thermal resistance of glass-sealed diode</title><author>FU GUANGRONG ; LAN SHUYUAN</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_CN215641637UU3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>chi ; eng</language><creationdate>2022</creationdate><topic>MEASURING</topic><topic>MEASURING ELECTRIC VARIABLES</topic><topic>MEASURING MAGNETIC VARIABLES</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>FU GUANGRONG</creatorcontrib><creatorcontrib>LAN SHUYUAN</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>FU GUANGRONG</au><au>LAN SHUYUAN</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Clamp for testing steady-state thermal resistance of glass-sealed diode</title><date>2022-01-25</date><risdate>2022</risdate><abstract>The utility model discloses a glass-sealed diode steady-state thermal resistance test fixture which comprises a bottom plate, a clamping assembly is arranged above the bottom plate, a sliding assembly is arranged at the lower end of the clamping assembly, a driving assembly is arranged outside the sliding assembly, the sliding assembly is located on the upper surface of the bottom plate, a control assembly is arranged on one side of the outer portion of the bottom plate, and the control assembly is located on the lower surface of the bottom plate. The clamping assembly comprises a placing plate, two sets of pneumatic cylinders, two sets of air pipes and two sets of clamping blocks, and the placing plate is located above the bottom plate; when the clamp is actually needed to be used, the glass-sealed diode needing to be fixed is clamped through the clamping assembly, the effect of clamping and fixing the glass-sealed diodes of different sizes is achieved through the clamping assembly, and when the glass-sealed</abstract><oa>free_for_read</oa></addata></record>
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subjects MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
title Clamp for testing steady-state thermal resistance of glass-sealed diode
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-22T08%3A58%3A45IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=FU%20GUANGRONG&rft.date=2022-01-25&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3ECN215641637UU%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true