Memory bank aging test fixture

Memory bank aging test fixture

The utility model discloses a memory bank aging test fixture, which comprises a test bottom plate, a test mainboard and a test guide assembly, and is characterized in that the test mainboard is arranged on the test bottom plate; the test guide assembly comprises a test frame, a height limiting plate...

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Hauptverfasser: DING JIAQIANG, HE RUN
Format: Patent
Sprache:chi ; eng
Schlagworte:
INFORMATION STORAGE
PHYSICS
STATIC STORES
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creator DING JIAQIANG
HE RUN
description The utility model discloses a memory bank aging test fixture, which comprises a test bottom plate, a test mainboard and a test guide assembly, and is characterized in that the test mainboard is arranged on the test bottom plate; the test guide assembly comprises a test frame, a height limiting plate, a width limiting plate, a guide block and a plug-pull piece, and a mounting hole is formed in the test frame and located above a memory bank plug board of the test mainboard; the height limiting plate and the width limiting plate are arranged in the mounting hole and are positioned on the two sides of the memory bank plug board of the test mainboard; the width limiting plate is arranged above the height limiting plate, and the guide block is arranged at the end part of the width limiting plate; the plug-pull piece is arranged in the guide block in a lever-type penetrating mode, a lifting part is arranged at one end close to the memory bank plug board, and a pressing part is arranged at the other end of the plug-p
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fullrecord <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_CN215376935UU</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>CN215376935UU</sourcerecordid><originalsourceid>FETCH-epo_espacenet_CN215376935UU3</originalsourceid><addsrcrecordid>eNrjZJDzTc3NL6pUSErMy1ZITM_MS1coSS0uUUjLrCgpLUrlYWBNS8wpTuWF0twMSm6uIc4euqkF-fGpxQWJyal5qSXxzn5GhqbG5maWxqahocZEKQIAPa8lTQ</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>Memory bank aging test fixture</title><source>esp@cenet</source><creator>DING JIAQIANG ; HE RUN</creator><creatorcontrib>DING JIAQIANG ; HE RUN</creatorcontrib><description>The utility model discloses a memory bank aging test fixture, which comprises a test bottom plate, a test mainboard and a test guide assembly, and is characterized in that the test mainboard is arranged on the test bottom plate; the test guide assembly comprises a test frame, a height limiting plate, a width limiting plate, a guide block and a plug-pull piece, and a mounting hole is formed in the test frame and located above a memory bank plug board of the test mainboard; the height limiting plate and the width limiting plate are arranged in the mounting hole and are positioned on the two sides of the memory bank plug board of the test mainboard; the width limiting plate is arranged above the height limiting plate, and the guide block is arranged at the end part of the width limiting plate; the plug-pull piece is arranged in the guide block in a lever-type penetrating mode, a lifting part is arranged at one end close to the memory bank plug board, and a pressing part is arranged at the other end of the plug-p</description><language>chi ; eng</language><subject>INFORMATION STORAGE ; PHYSICS ; STATIC STORES</subject><creationdate>2021</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20211231&amp;DB=EPODOC&amp;CC=CN&amp;NR=215376935U$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25564,76547</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20211231&amp;DB=EPODOC&amp;CC=CN&amp;NR=215376935U$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>DING JIAQIANG</creatorcontrib><creatorcontrib>HE RUN</creatorcontrib><title>Memory bank aging test fixture</title><description>The utility model discloses a memory bank aging test fixture, which comprises a test bottom plate, a test mainboard and a test guide assembly, and is characterized in that the test mainboard is arranged on the test bottom plate; the test guide assembly comprises a test frame, a height limiting plate, a width limiting plate, a guide block and a plug-pull piece, and a mounting hole is formed in the test frame and located above a memory bank plug board of the test mainboard; the height limiting plate and the width limiting plate are arranged in the mounting hole and are positioned on the two sides of the memory bank plug board of the test mainboard; the width limiting plate is arranged above the height limiting plate, and the guide block is arranged at the end part of the width limiting plate; the plug-pull piece is arranged in the guide block in a lever-type penetrating mode, a lifting part is arranged at one end close to the memory bank plug board, and a pressing part is arranged at the other end of the plug-p</description><subject>INFORMATION STORAGE</subject><subject>PHYSICS</subject><subject>STATIC STORES</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2021</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZJDzTc3NL6pUSErMy1ZITM_MS1coSS0uUUjLrCgpLUrlYWBNS8wpTuWF0twMSm6uIc4euqkF-fGpxQWJyal5qSXxzn5GhqbG5maWxqahocZEKQIAPa8lTQ</recordid><startdate>20211231</startdate><enddate>20211231</enddate><creator>DING JIAQIANG</creator><creator>HE RUN</creator><scope>EVB</scope></search><sort><creationdate>20211231</creationdate><title>Memory bank aging test fixture</title><author>DING JIAQIANG ; HE RUN</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_CN215376935UU3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>chi ; eng</language><creationdate>2021</creationdate><topic>INFORMATION STORAGE</topic><topic>PHYSICS</topic><topic>STATIC STORES</topic><toplevel>online_resources</toplevel><creatorcontrib>DING JIAQIANG</creatorcontrib><creatorcontrib>HE RUN</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>DING JIAQIANG</au><au>HE RUN</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Memory bank aging test fixture</title><date>2021-12-31</date><risdate>2021</risdate><abstract>The utility model discloses a memory bank aging test fixture, which comprises a test bottom plate, a test mainboard and a test guide assembly, and is characterized in that the test mainboard is arranged on the test bottom plate; the test guide assembly comprises a test frame, a height limiting plate, a width limiting plate, a guide block and a plug-pull piece, and a mounting hole is formed in the test frame and located above a memory bank plug board of the test mainboard; the height limiting plate and the width limiting plate are arranged in the mounting hole and are positioned on the two sides of the memory bank plug board of the test mainboard; the width limiting plate is arranged above the height limiting plate, and the guide block is arranged at the end part of the width limiting plate; the plug-pull piece is arranged in the guide block in a lever-type penetrating mode, a lifting part is arranged at one end close to the memory bank plug board, and a pressing part is arranged at the other end of the plug-p</abstract><oa>free_for_read</oa></addata></record>
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subjects INFORMATION STORAGE
PHYSICS
STATIC STORES
title Memory bank aging test fixture
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2024-12-25T06%3A43%3A59IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=DING%20JIAQIANG&rft.date=2021-12-31&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3ECN215376935UU%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true