Test probe, test fixture and test system
The utility model discloses a test probe, a test fixture and a test system, the test probe comprises a housing, an elastic member and two probes, the housing has an accommodating space, two opposite ends of the housing have a first opening and a second opening communicated with the accommodating spa...
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| creator | ZHANG DAQUAN XU TAIKUI CHEN MU |
| description | The utility model discloses a test probe, a test fixture and a test system, the test probe comprises a housing, an elastic member and two probes, the housing has an accommodating space, two opposite ends of the housing have a first opening and a second opening communicated with the accommodating space, the elastic member is arranged in the accommodating space, the two probes are respectively arranged at the two opposite ends of the housing, and the first opening and the second opening are communicated with the accommodating space. The probes are arranged in the containing space and abut against the elastic part, the probes penetrate through the first opening and the second opening respectively and extend out of the containing space, at least one probe is a limiting probe, the limiting probe can rotate relative to the shell to adjust impedance of the test probe, the limiting probe is provided with a limiting part, and the limiting part can rotate relative to the shell to adjust impedance of the test probe. The |
| format | Patent |
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The probes are arranged in the containing space and abut against the elastic part, the probes penetrate through the first opening and the second opening respectively and extend out of the containing space, at least one probe is a limiting probe, the limiting probe can rotate relative to the shell to adjust impedance of the test probe, the limiting probe is provided with a limiting part, and the limiting part can rotate relative to the shell to adjust impedance of the test probe. 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| language | chi ; eng |
| recordid | cdi_epo_espacenet_CN215297446UU |
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| subjects | MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS TESTING |
| title | Test probe, test fixture and test system |
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