Power/function integrated test system

The utility model discloses a power/function integrated test system, which comprises a coupling power supply, an integral power meter, three universal meters, an electric insertion core and a signal change-over switch, wherein the signal change-over switch is connected with the electric insertion co...

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Hauptverfasser: PAN YUCEN, SONG CHUNZE, LI YANG, LU SIYUAN, LI ZHICHAO
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Sprache:chi ; eng
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creator PAN YUCEN
SONG CHUNZE
LI YANG
LU SIYUAN
LI ZHICHAO
description The utility model discloses a power/function integrated test system, which comprises a coupling power supply, an integral power meter, three universal meters, an electric insertion core and a signal change-over switch, wherein the signal change-over switch is connected with the electric insertion core, the coupling power supply and the universal meter, the coupling power supply supplies power to the test system, the electric insertion core is used for installing a to-be-tested product, and the same electric insertion core is used for realizing two stations of test power and function. The semiconductor laser power/function test system provided by the utility model is convenient, fast, integrated in test, economical and practical, the number of power/function test personnel is reduced from two to one through the signal change-over switch, and two tests of power and function are simplified to one test. 本实用新型公开一种功率/功能一体化测试系统,包括耦合电源、积分功率计、三台万用表、电插芯和信号切换开关;信号切换开关与电插芯、耦合电源和万用表连接,耦合电源为测试系统供电,电插芯用于安装待测试产品,使用同一电插芯实现测试功
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fullrecord <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_CN211979111UU</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>CN211979111UU</sourcerecordid><originalsourceid>FETCH-epo_espacenet_CN211979111UU3</originalsourceid><addsrcrecordid>eNrjZFANyC9PLdJPK81LLsnMz1PIzCtJTS9KLElNUShJLS5RKK4sLknN5WFgTUvMKU7lhdLcDEpuriHOHrqpBfnxqcUFicmpeakl8c5-RoaGluaWhoaGoaHGRCkCAMR2KG4</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>Power/function integrated test system</title><source>esp@cenet</source><creator>PAN YUCEN ; SONG CHUNZE ; LI YANG ; LU SIYUAN ; LI ZHICHAO</creator><creatorcontrib>PAN YUCEN ; SONG CHUNZE ; LI YANG ; LU SIYUAN ; LI ZHICHAO</creatorcontrib><description>The utility model discloses a power/function integrated test system, which comprises a coupling power supply, an integral power meter, three universal meters, an electric insertion core and a signal change-over switch, wherein the signal change-over switch is connected with the electric insertion core, the coupling power supply and the universal meter, the coupling power supply supplies power to the test system, the electric insertion core is used for installing a to-be-tested product, and the same electric insertion core is used for realizing two stations of test power and function. The semiconductor laser power/function test system provided by the utility model is convenient, fast, integrated in test, economical and practical, the number of power/function test personnel is reduced from two to one through the signal change-over switch, and two tests of power and function are simplified to one test. 本实用新型公开一种功率/功能一体化测试系统,包括耦合电源、积分功率计、三台万用表、电插芯和信号切换开关;信号切换开关与电插芯、耦合电源和万用表连接,耦合电源为测试系统供电,电插芯用于安装待测试产品,使用同一电插芯实现测试功</description><language>chi ; eng</language><subject>MEASURING ; MEASURING ELECTRIC VARIABLES ; MEASURING MAGNETIC VARIABLES ; PHYSICS ; TESTING ; TESTING STATIC OR DYNAMIC BALANCE OF MACHINES ORSTRUCTURES ; TESTING STRUCTURES OR APPARATUS NOT OTHERWISE PROVIDED FOR</subject><creationdate>2020</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20201120&amp;DB=EPODOC&amp;CC=CN&amp;NR=211979111U$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25564,76547</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20201120&amp;DB=EPODOC&amp;CC=CN&amp;NR=211979111U$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>PAN YUCEN</creatorcontrib><creatorcontrib>SONG CHUNZE</creatorcontrib><creatorcontrib>LI YANG</creatorcontrib><creatorcontrib>LU SIYUAN</creatorcontrib><creatorcontrib>LI ZHICHAO</creatorcontrib><title>Power/function integrated test system</title><description>The utility model discloses a power/function integrated test system, which comprises a coupling power supply, an integral power meter, three universal meters, an electric insertion core and a signal change-over switch, wherein the signal change-over switch is connected with the electric insertion core, the coupling power supply and the universal meter, the coupling power supply supplies power to the test system, the electric insertion core is used for installing a to-be-tested product, and the same electric insertion core is used for realizing two stations of test power and function. The semiconductor laser power/function test system provided by the utility model is convenient, fast, integrated in test, economical and practical, the number of power/function test personnel is reduced from two to one through the signal change-over switch, and two tests of power and function are simplified to one test. 本实用新型公开一种功率/功能一体化测试系统,包括耦合电源、积分功率计、三台万用表、电插芯和信号切换开关;信号切换开关与电插芯、耦合电源和万用表连接,耦合电源为测试系统供电,电插芯用于安装待测试产品,使用同一电插芯实现测试功</description><subject>MEASURING</subject><subject>MEASURING ELECTRIC VARIABLES</subject><subject>MEASURING MAGNETIC VARIABLES</subject><subject>PHYSICS</subject><subject>TESTING</subject><subject>TESTING STATIC OR DYNAMIC BALANCE OF MACHINES ORSTRUCTURES</subject><subject>TESTING STRUCTURES OR APPARATUS NOT OTHERWISE PROVIDED FOR</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2020</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZFANyC9PLdJPK81LLsnMz1PIzCtJTS9KLElNUShJLS5RKK4sLknN5WFgTUvMKU7lhdLcDEpuriHOHrqpBfnxqcUFicmpeakl8c5-RoaGluaWhoaGoaHGRCkCAMR2KG4</recordid><startdate>20201120</startdate><enddate>20201120</enddate><creator>PAN YUCEN</creator><creator>SONG CHUNZE</creator><creator>LI YANG</creator><creator>LU SIYUAN</creator><creator>LI ZHICHAO</creator><scope>EVB</scope></search><sort><creationdate>20201120</creationdate><title>Power/function integrated test system</title><author>PAN YUCEN ; SONG CHUNZE ; LI YANG ; LU SIYUAN ; LI ZHICHAO</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_CN211979111UU3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>chi ; eng</language><creationdate>2020</creationdate><topic>MEASURING</topic><topic>MEASURING ELECTRIC VARIABLES</topic><topic>MEASURING MAGNETIC VARIABLES</topic><topic>PHYSICS</topic><topic>TESTING</topic><topic>TESTING STATIC OR DYNAMIC BALANCE OF MACHINES ORSTRUCTURES</topic><topic>TESTING STRUCTURES OR APPARATUS NOT OTHERWISE PROVIDED FOR</topic><toplevel>online_resources</toplevel><creatorcontrib>PAN YUCEN</creatorcontrib><creatorcontrib>SONG CHUNZE</creatorcontrib><creatorcontrib>LI YANG</creatorcontrib><creatorcontrib>LU SIYUAN</creatorcontrib><creatorcontrib>LI ZHICHAO</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>PAN YUCEN</au><au>SONG CHUNZE</au><au>LI YANG</au><au>LU SIYUAN</au><au>LI ZHICHAO</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Power/function integrated test system</title><date>2020-11-20</date><risdate>2020</risdate><abstract>The utility model discloses a power/function integrated test system, which comprises a coupling power supply, an integral power meter, three universal meters, an electric insertion core and a signal change-over switch, wherein the signal change-over switch is connected with the electric insertion core, the coupling power supply and the universal meter, the coupling power supply supplies power to the test system, the electric insertion core is used for installing a to-be-tested product, and the same electric insertion core is used for realizing two stations of test power and function. The semiconductor laser power/function test system provided by the utility model is convenient, fast, integrated in test, economical and practical, the number of power/function test personnel is reduced from two to one through the signal change-over switch, and two tests of power and function are simplified to one test. 本实用新型公开一种功率/功能一体化测试系统,包括耦合电源、积分功率计、三台万用表、电插芯和信号切换开关;信号切换开关与电插芯、耦合电源和万用表连接,耦合电源为测试系统供电,电插芯用于安装待测试产品,使用同一电插芯实现测试功</abstract><oa>free_for_read</oa></addata></record>
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subjects MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
TESTING STATIC OR DYNAMIC BALANCE OF MACHINES ORSTRUCTURES
TESTING STRUCTURES OR APPARATUS NOT OTHERWISE PROVIDED FOR
title Power/function integrated test system
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