Utensil is examined to plaque in B post

Utensil is examined to plaque in B post

The utility model discloses an utensil is examined to plaque in B post, including test tool bottom plate, profile detecting body, test tool bottom plate upper end four corners department is provided with the reference block, the last one side of test tool bottom plate is provided with the support co...

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1. Verfasser: LIU ZEYIN
Format: Patent
Sprache:chi ; eng
Schlagworte:
MEASURING
MEASURING ANGLES
MEASURING AREAS
MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS
PHYSICS
TESTING
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description The utility model discloses an utensil is examined to plaque in B post, including test tool bottom plate, profile detecting body, test tool bottom plate upper end four corners department is provided with the reference block, the last one side of test tool bottom plate is provided with the support column, the support column top is provided with the upset and detects the piece, be provided with interior plaque in the upset measuring piece, test tool bottom plate is last to keep away from support column one side is provided with profile detecting body, test tool bottom plate is last to be close to interior plaque with profile detecting body department is provided with part location buckle, the profile detecting body keep away from interior plaque one end is provided with the location baffle,test tool bottom plate is last to keep away from profile detecting body both sides are provided with the buckle controller. Beneficial effect lies in: the utility model discloses can be to realizing the short -term test behin
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subjects MEASURING
MEASURING ANGLES
MEASURING AREAS
MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS
PHYSICS
TESTING
title Utensil is examined to plaque in B post
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