Stop device of chip testing base

Stop device of chip testing base

The utility model discloses a stop device of chip testing base, including charging plate, survey test panel, survey test panel, mainboard and fourth spring, charging plate's upper surface left side isprovided with first tongue, the right side of first tongue is provided with fixed mouthful of c...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
1. Verfasser: YANG GENGHUA
Format: Patent
Sprache:chi ; eng
Schlagworte:
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
container_end_page
container_issue
container_start_page
container_title
container_volume
creator YANG GENGHUA
description The utility model discloses a stop device of chip testing base, including charging plate, survey test panel, survey test panel, mainboard and fourth spring, charging plate's upper surface left side isprovided with first tongue, the right side of first tongue is provided with fixed mouthful of chip, the right side top that the chip is fixed mouthful is provided with first bolt hole, the right sidebelow of first bolt hole is provided with the second tongue, the upper surface left side of surveying test panel is provided with first recess, charging plate is when surveying test panel and assemble, and the test is mouthful fixed through four foxtail holes with fixed mouthful of chip, when avoiding testing the chip, because of the problem of sealed department not tight appearance test error, is provided with the mainboard in test mouthful, charging plate when surveying test panel and assemble, on the chip drops on the mainboard, direct to the mainboard circular telegram test the chip, whenavoiding testing the chip,
format Patent
fullrecord <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_CN207318654UU</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>CN207318654UU</sourcerecordid><originalsourceid>FETCH-epo_espacenet_CN207318654UU3</originalsourceid><addsrcrecordid>eNrjZFAILskvUEhJLctMTlXIT1NIzsgsUChJLS7JzEtXSEosTuVhYE1LzClO5YXS3AxKbq4hzh66qQX58anFBYnJqXmpJfHOfkYG5saGFmamJqGhxkQpAgB2LSWr</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>Stop device of chip testing base</title><source>esp@cenet</source><creator>YANG GENGHUA</creator><creatorcontrib>YANG GENGHUA</creatorcontrib><description>The utility model discloses a stop device of chip testing base, including charging plate, survey test panel, survey test panel, mainboard and fourth spring, charging plate's upper surface left side isprovided with first tongue, the right side of first tongue is provided with fixed mouthful of chip, the right side top that the chip is fixed mouthful is provided with first bolt hole, the right sidebelow of first bolt hole is provided with the second tongue, the upper surface left side of surveying test panel is provided with first recess, charging plate is when surveying test panel and assemble, and the test is mouthful fixed through four foxtail holes with fixed mouthful of chip, when avoiding testing the chip, because of the problem of sealed department not tight appearance test error, is provided with the mainboard in test mouthful, charging plate when surveying test panel and assemble, on the chip drops on the mainboard, direct to the mainboard circular telegram test the chip, whenavoiding testing the chip,</description><language>chi ; eng</language><subject>MEASURING ; MEASURING ELECTRIC VARIABLES ; MEASURING MAGNETIC VARIABLES ; PHYSICS ; TESTING</subject><creationdate>2018</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20180504&amp;DB=EPODOC&amp;CC=CN&amp;NR=207318654U$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25564,76547</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20180504&amp;DB=EPODOC&amp;CC=CN&amp;NR=207318654U$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>YANG GENGHUA</creatorcontrib><title>Stop device of chip testing base</title><description>The utility model discloses a stop device of chip testing base, including charging plate, survey test panel, survey test panel, mainboard and fourth spring, charging plate's upper surface left side isprovided with first tongue, the right side of first tongue is provided with fixed mouthful of chip, the right side top that the chip is fixed mouthful is provided with first bolt hole, the right sidebelow of first bolt hole is provided with the second tongue, the upper surface left side of surveying test panel is provided with first recess, charging plate is when surveying test panel and assemble, and the test is mouthful fixed through four foxtail holes with fixed mouthful of chip, when avoiding testing the chip, because of the problem of sealed department not tight appearance test error, is provided with the mainboard in test mouthful, charging plate when surveying test panel and assemble, on the chip drops on the mainboard, direct to the mainboard circular telegram test the chip, whenavoiding testing the chip,</description><subject>MEASURING</subject><subject>MEASURING ELECTRIC VARIABLES</subject><subject>MEASURING MAGNETIC VARIABLES</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2018</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZFAILskvUEhJLctMTlXIT1NIzsgsUChJLS7JzEtXSEosTuVhYE1LzClO5YXS3AxKbq4hzh66qQX58anFBYnJqXmpJfHOfkYG5saGFmamJqGhxkQpAgB2LSWr</recordid><startdate>20180504</startdate><enddate>20180504</enddate><creator>YANG GENGHUA</creator><scope>EVB</scope></search><sort><creationdate>20180504</creationdate><title>Stop device of chip testing base</title><author>YANG GENGHUA</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_CN207318654UU3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>chi ; eng</language><creationdate>2018</creationdate><topic>MEASURING</topic><topic>MEASURING ELECTRIC VARIABLES</topic><topic>MEASURING MAGNETIC VARIABLES</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>YANG GENGHUA</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>YANG GENGHUA</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Stop device of chip testing base</title><date>2018-05-04</date><risdate>2018</risdate><abstract>The utility model discloses a stop device of chip testing base, including charging plate, survey test panel, survey test panel, mainboard and fourth spring, charging plate's upper surface left side isprovided with first tongue, the right side of first tongue is provided with fixed mouthful of chip, the right side top that the chip is fixed mouthful is provided with first bolt hole, the right sidebelow of first bolt hole is provided with the second tongue, the upper surface left side of surveying test panel is provided with first recess, charging plate is when surveying test panel and assemble, and the test is mouthful fixed through four foxtail holes with fixed mouthful of chip, when avoiding testing the chip, because of the problem of sealed department not tight appearance test error, is provided with the mainboard in test mouthful, charging plate when surveying test panel and assemble, on the chip drops on the mainboard, direct to the mainboard circular telegram test the chip, whenavoiding testing the chip,</abstract><oa>free_for_read</oa></addata></record>
fulltext fulltext_linktorsrc
identifier
ispartof
issn
language chi ; eng
recordid cdi_epo_espacenet_CN207318654UU
source esp@cenet
subjects MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
title Stop device of chip testing base
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2024-12-21T04%3A53%3A37IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=YANG%20GENGHUA&rft.date=2018-05-04&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3ECN207318654UU%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true