Anchor clamps are used in EBSD test

Anchor clamps are used in EBSD test

The utility model provides an anchor clamps are used in EBSD test, anchor clamps are used in EBSD test includes: the sample platform, the sample platform is used for bearing the test sample, follow onthe upper portion of sample platform the axial of sample platform is provided with the sample portio...

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Hauptverfasser: WANG CHANG, PU ENXIANG, ZHANG SHULAN
Format: Patent
Sprache:chi ; eng
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INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
PHYSICS
TESTING
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creator WANG CHANG
PU ENXIANG
ZHANG SHULAN
description The utility model provides an anchor clamps are used in EBSD test, anchor clamps are used in EBSD test includes: the sample platform, the sample platform is used for bearing the test sample, follow onthe upper portion of sample platform the axial of sample platform is provided with the sample portion of holding of undercut, the sample portion of holding is by L die bed face around the formation of two lateral walls and a slope, form the first interior oblique bottom surface and the interior oblique bottom surface of second of the L die bed face of slope are orthogonal, wherein oblique bottomsurface is 70 with the contained angle that the horizontal direction formed in first, and double -screw bolt, the double -screw bolt is fixed the bottom of sample platform, sample fixed position department that this double -screw bolt detachable installed at scanning electron microscope. The difficult problem of low resolution, image drift, system appearance difficulty was observed to the mirco structure when large deforma
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subjects INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
PHYSICS
TESTING
title Anchor clamps are used in EBSD test
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