Automatic opening device safety capability test appearance of parachute
The utility model discloses an automatic opening device safety capability test appearance of parachute, comprising an one -chip microcomputer, the utensil corresponds reset circuit, crystal oscillator circuit and AD conversion sampling circuit in the singlechip, AD conversion sampling circuit be con...
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| creator | WU TENGTENG LI GUANG TANG GUILAN FU ZHEN ZHENG LEI WANG LIHUA HU XU TAN BEI SUN JIANGHUI |
| description | The utility model discloses an automatic opening device safety capability test appearance of parachute, comprising an one -chip microcomputer, the utensil corresponds reset circuit, crystal oscillator circuit and AD conversion sampling circuit in the singlechip, AD conversion sampling circuit be connected with a pressure sensor, the singlechip still is connected with the latch, memory expander circuit has on the latch, furthermore, 8255 external tapping expander circuit still have on the singlechip, 8255 be equipped with LED digital display and keyboard scan part on the piece external tapping expander circuit, and be connected with the power module who is used for providing the power on the singlechip.
本实用新型公开了种降落伞自动打开装置安全性能测试仪，包括单片机，所述单片机内具对应复位电路、晶振电路、以及A/D转换采样电路，所述的A/D转换采样电路连接有个压力传感器，所述单片机还连接有锁存器，所述锁存器上具有存储器扩展电路；进步，所述单片机上还具有8255片外接口扩展电路，所述8255片外接口扩展电路上设有LED数码显示屏和键盘扫描部分，且单片机上连接有用于提供电源的电源模块。 |
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本实用新型公开了种降落伞自动打开装置安全性能测试仪，包括单片机，所述单片机内具对应复位电路、晶振电路、以及A/D转换采样电路，所述的A/D转换采样电路连接有个压力传感器，所述单片机还连接有锁存器，所述锁存器上具有存储器扩展电路；进步，所述单片机上还具有8255片外接口扩展电路，所述8255片外接口扩展电路上设有LED数码显示屏和键盘扫描部分，且单片机上连接有用于提供电源的电源模块。</description><language>chi ; eng</language><subject>MEASURING ; MEASURING ELECTRIC VARIABLES ; MEASURING MAGNETIC VARIABLES ; PHYSICS ; TESTING</subject><creationdate>2016</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20161109&DB=EPODOC&CC=CN&NR=205679698U$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25543,76293</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20161109&DB=EPODOC&CC=CN&NR=205679698U$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>WU TENGTENG</creatorcontrib><creatorcontrib>LI GUANG</creatorcontrib><creatorcontrib>TANG GUILAN</creatorcontrib><creatorcontrib>FU ZHEN</creatorcontrib><creatorcontrib>ZHENG LEI</creatorcontrib><creatorcontrib>WANG LIHUA</creatorcontrib><creatorcontrib>HU XU</creatorcontrib><creatorcontrib>TAN BEI</creatorcontrib><creatorcontrib>SUN JIANGHUI</creatorcontrib><title>Automatic opening device safety capability test appearance of parachute</title><description>The utility model discloses an automatic opening device safety capability test appearance of parachute, comprising an one -chip microcomputer, the utensil corresponds reset circuit, crystal oscillator circuit and AD conversion sampling circuit in the singlechip, AD conversion sampling circuit be connected with a pressure sensor, the singlechip still is connected with the latch, memory expander circuit has on the latch, furthermore, 8255 external tapping expander circuit still have on the singlechip, 8255 be equipped with LED digital display and keyboard scan part on the piece external tapping expander circuit, and be connected with the power module who is used for providing the power on the singlechip.
本实用新型公开了种降落伞自动打开装置安全性能测试仪，包括单片机，所述单片机内具对应复位电路、晶振电路、以及A/D转换采样电路，所述的A/D转换采样电路连接有个压力传感器，所述单片机还连接有锁存器，所述锁存器上具有存储器扩展电路；进步，所述单片机上还具有8255片外接口扩展电路，所述8255片外接口扩展电路上设有LED数码显示屏和键盘扫描部分，且单片机上连接有用于提供电源的电源模块。</description><subject>MEASURING</subject><subject>MEASURING ELECTRIC VARIABLES</subject><subject>MEASURING MAGNETIC VARIABLES</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2016</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZHB3LC3Jz00syUxWyC9IzcvMS1dISS3LTE5VKE5MSy2pVEhOLEhMyszJBDJLUotLFBILClITixLzgCry0xQKgMzkjNKSVB4G1rTEnOJUXijNzaDk5hri7KGbWpAfn1pckJicmpdaEu_sZ2RgamZuaWZpERpqTJQiAAi4NUE</recordid><startdate>20161109</startdate><enddate>20161109</enddate><creator>WU TENGTENG</creator><creator>LI GUANG</creator><creator>TANG GUILAN</creator><creator>FU ZHEN</creator><creator>ZHENG LEI</creator><creator>WANG LIHUA</creator><creator>HU XU</creator><creator>TAN BEI</creator><creator>SUN JIANGHUI</creator><scope>EVB</scope></search><sort><creationdate>20161109</creationdate><title>Automatic opening device safety capability test appearance of parachute</title><author>WU TENGTENG ; LI GUANG ; TANG GUILAN ; FU ZHEN ; ZHENG LEI ; WANG LIHUA ; HU XU ; TAN BEI ; SUN JIANGHUI</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_CN205679698UU3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>chi ; eng</language><creationdate>2016</creationdate><topic>MEASURING</topic><topic>MEASURING ELECTRIC VARIABLES</topic><topic>MEASURING MAGNETIC VARIABLES</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>WU TENGTENG</creatorcontrib><creatorcontrib>LI GUANG</creatorcontrib><creatorcontrib>TANG GUILAN</creatorcontrib><creatorcontrib>FU ZHEN</creatorcontrib><creatorcontrib>ZHENG LEI</creatorcontrib><creatorcontrib>WANG LIHUA</creatorcontrib><creatorcontrib>HU XU</creatorcontrib><creatorcontrib>TAN BEI</creatorcontrib><creatorcontrib>SUN JIANGHUI</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>WU TENGTENG</au><au>LI GUANG</au><au>TANG GUILAN</au><au>FU ZHEN</au><au>ZHENG LEI</au><au>WANG LIHUA</au><au>HU XU</au><au>TAN BEI</au><au>SUN JIANGHUI</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Automatic opening device safety capability test appearance of parachute</title><date>2016-11-09</date><risdate>2016</risdate><abstract>The utility model discloses an automatic opening device safety capability test appearance of parachute, comprising an one -chip microcomputer, the utensil corresponds reset circuit, crystal oscillator circuit and AD conversion sampling circuit in the singlechip, AD conversion sampling circuit be connected with a pressure sensor, the singlechip still is connected with the latch, memory expander circuit has on the latch, furthermore, 8255 external tapping expander circuit still have on the singlechip, 8255 be equipped with LED digital display and keyboard scan part on the piece external tapping expander circuit, and be connected with the power module who is used for providing the power on the singlechip.
本实用新型公开了种降落伞自动打开装置安全性能测试仪，包括单片机，所述单片机内具对应复位电路、晶振电路、以及A/D转换采样电路，所述的A/D转换采样电路连接有个压力传感器，所述单片机还连接有锁存器，所述锁存器上具有存储器扩展电路；进步，所述单片机上还具有8255片外接口扩展电路，所述8255片外接口扩展电路上设有LED数码显示屏和键盘扫描部分，且单片机上连接有用于提供电源的电源模块。</abstract><oa>free_for_read</oa></addata></record> |
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| subjects | MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS TESTING |
| title | Automatic opening device safety capability test appearance of parachute |
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