Infrared detection light filter
The utility model discloses an infrared detection light filter, including using the base plate of si as raw and other materials to ge, znS are the first filming layer and use C as second coating film layer, just the base plate is located between the first filming layer and the second coating film la...
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| creator | Yu Chuwang Hu Weiqin Wang Jiping Lyu Jing |
| description | The utility model discloses an infrared detection light filter, including using the base plate of si as raw and other materials to ge, znS are the first filming layer and use C as second coating film layer, just the base plate is located between the first filming layer and the second coating film layer. The utility model relates to an infrared detection light filter, it is at the temperature measurement in -process, and improvement SNR that can be great improves the test precision, is suitable for on a large scale popularization and use. This light filter 5%Cut on=5500 400nm, 7500~13500nm, tavg >= 70%, 1500~4000nm, 1.0%, 4000~5000nm of tavg |
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本实用新型公开了种红外检测滤光片，包括以Si为原材料的基板，以Ge、ZnS为第镀膜层和以C为第二镀膜层，且所述基板设于第镀膜层与第二镀膜层之间。本实用新型所得到的红外检测滤光片，其在温度测量过程中，可大大的提高信噪比，提高测试精准度，适合于大范围的推广和使用。该滤光片5％Cut on＝5500±400nm，7500～13500nm，Tavg≥70％，1500～4000nm，Tavg≤0.1％，T≤1.0％，4000～5000nm，Tavg≤0.5％。</description><language>chi ; eng</language><subject>OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS ; OPTICS ; PHYSICS</subject><creationdate>2016</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20160810&DB=EPODOC&CC=CN&NR=205450326U$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25563,76318</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20160810&DB=EPODOC&CC=CN&NR=205450326U$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>Yu Chuwang</creatorcontrib><creatorcontrib>Hu Weiqin</creatorcontrib><creatorcontrib>Wang Jiping</creatorcontrib><creatorcontrib>Lyu Jing</creatorcontrib><title>Infrared detection light filter</title><description>The utility model discloses an infrared detection light filter, including using the base plate of si as raw and other materials to ge, znS are the first filming layer and use C as second coating film layer, just the base plate is located between the first filming layer and the second coating film layer. The utility model relates to an infrared detection light filter, it is at the temperature measurement in -process, and improvement SNR that can be great improves the test precision, is suitable for on a large scale popularization and use. This light filter 5%Cut on=5500 400nm, 7500~13500nm, tavg >= 70%, 1500~4000nm, 1.0%, 4000~5000nm of tavg <= 0.1%, T <=, tavg <= 0.5%.
本实用新型公开了种红外检测滤光片，包括以Si为原材料的基板，以Ge、ZnS为第镀膜层和以C为第二镀膜层，且所述基板设于第镀膜层与第二镀膜层之间。本实用新型所得到的红外检测滤光片，其在温度测量过程中，可大大的提高信噪比，提高测试精准度，适合于大范围的推广和使用。该滤光片5％Cut on＝5500±400nm，7500～13500nm，Tavg≥70％，1500～4000nm，Tavg≤0.1％，T≤1.0％，4000～5000nm，Tavg≤0.5％。</description><subject>OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS</subject><subject>OPTICS</subject><subject>PHYSICS</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2016</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZJD3zEsrSixKTVFISS1JTS7JzM9TyMlMzyhRSMvMKUkt4mFgTUvMKU7lhdLcDEpuriHOHrqpBfnxqcUFicmpeakl8c5-RgamJqYGxkZmoaHGRCkCAHriJbg</recordid><startdate>20160810</startdate><enddate>20160810</enddate><creator>Yu Chuwang</creator><creator>Hu Weiqin</creator><creator>Wang Jiping</creator><creator>Lyu Jing</creator><scope>EVB</scope></search><sort><creationdate>20160810</creationdate><title>Infrared detection light filter</title><author>Yu Chuwang ; Hu Weiqin ; Wang Jiping ; Lyu Jing</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_CN205450326UU3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>chi ; eng</language><creationdate>2016</creationdate><topic>OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS</topic><topic>OPTICS</topic><topic>PHYSICS</topic><toplevel>online_resources</toplevel><creatorcontrib>Yu Chuwang</creatorcontrib><creatorcontrib>Hu Weiqin</creatorcontrib><creatorcontrib>Wang Jiping</creatorcontrib><creatorcontrib>Lyu Jing</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Yu Chuwang</au><au>Hu Weiqin</au><au>Wang Jiping</au><au>Lyu Jing</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Infrared detection light filter</title><date>2016-08-10</date><risdate>2016</risdate><abstract>The utility model discloses an infrared detection light filter, including using the base plate of si as raw and other materials to ge, znS are the first filming layer and use C as second coating film layer, just the base plate is located between the first filming layer and the second coating film layer. The utility model relates to an infrared detection light filter, it is at the temperature measurement in -process, and improvement SNR that can be great improves the test precision, is suitable for on a large scale popularization and use. This light filter 5%Cut on=5500 400nm, 7500~13500nm, tavg >= 70%, 1500~4000nm, 1.0%, 4000~5000nm of tavg <= 0.1%, T <=, tavg <= 0.5%.
本实用新型公开了种红外检测滤光片，包括以Si为原材料的基板，以Ge、ZnS为第镀膜层和以C为第二镀膜层，且所述基板设于第镀膜层与第二镀膜层之间。本实用新型所得到的红外检测滤光片，其在温度测量过程中，可大大的提高信噪比，提高测试精准度，适合于大范围的推广和使用。该滤光片5％Cut on＝5500±400nm，7500～13500nm，Tavg≥70％，1500～4000nm，Tavg≤0.1％，T≤1.0％，4000～5000nm，Tavg≤0.5％。</abstract><oa>free_for_read</oa></addata></record> |
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| title | Infrared detection light filter |
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