Unusual device of short -term test polycrystalline silicon material growth

The utility model discloses an unusual device of short -term test polycrystalline silicon material growth, including main control board, first resistance pen, second resistance pen, display and alarm, the main control board includes first converter, second converter and controller, the first input e...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	LIU CUNJIAN, ZHONG DEJING, XIONG YANRONG
Format:	Patent
Sprache:	chi ; eng
Schlagworte:	MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS TESTING
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