High-resolution multi-wavelength laser intensity distribution detector
The utility model relates to a high-resolution multi-wavelength laser intensity distribution detector. The detector comprises a sampling target surface, a reflector, a narrowband optical filter, a light spot collection device, a network switch and a data processing device. The measuring method is as...
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creator | PANG MIAO GAO XUEYAN HU XIAOYANG ZHOU WENCHAO ZHOU SHAN ZHANG WEI HE JUNZHANG YUAN XUEWEN |
description | The utility model relates to a high-resolution multi-wavelength laser intensity distribution detector. The detector comprises a sampling target surface, a reflector, a narrowband optical filter, a light spot collection device, a network switch and a data processing device. The measuring method is as follows: the sampling target surface carries out diffuse transmission sampling of incident laser, an image collection device carries out image of a sampled light spot through the reflector, then the light spot data is sent to the data processing device through the network switch, the data processing device carries out shape distortion correction and intensity distortion correction of the light spot, and then carries out analysis and processing, and the laser intensity distribution parameter is obtained through calculation. The high-resolution multi-wavelength laser intensity distribution detector can carry out high-resolution and accurate quantitative measurement of multi-wavelength laser intensity distribution at the same time. |
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fullrecord | <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_CN204389019UU</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>CN204389019UU</sourcerecordid><originalsourceid>FETCH-epo_espacenet_CN204389019UU3</originalsourceid><addsrcrecordid>eNqNyrEOgjAQBuAuDkZ9h8a9CYqDzETC5CQzqfALl5Qr6R0a395BH8DpW761qWoaRpcgMSxKke20BCX38k8E8KCjDV6QLLGChfRtexJNdP_uHopOY9qa1cMHwe7nxuyry62sHebYQmbfgaFteT1mp_xcZIeiafK_0gcz-TWv</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>High-resolution multi-wavelength laser intensity distribution detector</title><source>esp@cenet</source><creator>PANG MIAO ; GAO XUEYAN ; HU XIAOYANG ; ZHOU WENCHAO ; ZHOU SHAN ; ZHANG WEI ; HE JUNZHANG ; YUAN XUEWEN</creator><creatorcontrib>PANG MIAO ; GAO XUEYAN ; HU XIAOYANG ; ZHOU WENCHAO ; ZHOU SHAN ; ZHANG WEI ; HE JUNZHANG ; YUAN XUEWEN</creatorcontrib><description>The utility model relates to a high-resolution multi-wavelength laser intensity distribution detector. The detector comprises a sampling target surface, a reflector, a narrowband optical filter, a light spot collection device, a network switch and a data processing device. The measuring method is as follows: the sampling target surface carries out diffuse transmission sampling of incident laser, an image collection device carries out image of a sampled light spot through the reflector, then the light spot data is sent to the data processing device through the network switch, the data processing device carries out shape distortion correction and intensity distortion correction of the light spot, and then carries out analysis and processing, and the laser intensity distribution parameter is obtained through calculation. The high-resolution multi-wavelength laser intensity distribution detector can carry out high-resolution and accurate quantitative measurement of multi-wavelength laser intensity distribution at the same time.</description><language>eng</language><subject>COLORIMETRY ; MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT,POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED,VISIBLE OR ULTRA-VIOLET LIGHT ; MEASURING ; PHYSICS ; RADIATION PYROMETRY ; TESTING</subject><creationdate>2015</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20150610&DB=EPODOC&CC=CN&NR=204389019U$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,777,882,25545,76296</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20150610&DB=EPODOC&CC=CN&NR=204389019U$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>PANG MIAO</creatorcontrib><creatorcontrib>GAO XUEYAN</creatorcontrib><creatorcontrib>HU XIAOYANG</creatorcontrib><creatorcontrib>ZHOU WENCHAO</creatorcontrib><creatorcontrib>ZHOU SHAN</creatorcontrib><creatorcontrib>ZHANG WEI</creatorcontrib><creatorcontrib>HE JUNZHANG</creatorcontrib><creatorcontrib>YUAN XUEWEN</creatorcontrib><title>High-resolution multi-wavelength laser intensity distribution detector</title><description>The utility model relates to a high-resolution multi-wavelength laser intensity distribution detector. The detector comprises a sampling target surface, a reflector, a narrowband optical filter, a light spot collection device, a network switch and a data processing device. The measuring method is as follows: the sampling target surface carries out diffuse transmission sampling of incident laser, an image collection device carries out image of a sampled light spot through the reflector, then the light spot data is sent to the data processing device through the network switch, the data processing device carries out shape distortion correction and intensity distortion correction of the light spot, and then carries out analysis and processing, and the laser intensity distribution parameter is obtained through calculation. The high-resolution multi-wavelength laser intensity distribution detector can carry out high-resolution and accurate quantitative measurement of multi-wavelength laser intensity distribution at the same time.</description><subject>COLORIMETRY</subject><subject>MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT,POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED,VISIBLE OR ULTRA-VIOLET LIGHT</subject><subject>MEASURING</subject><subject>PHYSICS</subject><subject>RADIATION PYROMETRY</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2015</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNqNyrEOgjAQBuAuDkZ9h8a9CYqDzETC5CQzqfALl5Qr6R0a395BH8DpW761qWoaRpcgMSxKke20BCX38k8E8KCjDV6QLLGChfRtexJNdP_uHopOY9qa1cMHwe7nxuyry62sHebYQmbfgaFteT1mp_xcZIeiafK_0gcz-TWv</recordid><startdate>20150610</startdate><enddate>20150610</enddate><creator>PANG MIAO</creator><creator>GAO XUEYAN</creator><creator>HU XIAOYANG</creator><creator>ZHOU WENCHAO</creator><creator>ZHOU SHAN</creator><creator>ZHANG WEI</creator><creator>HE JUNZHANG</creator><creator>YUAN XUEWEN</creator><scope>EVB</scope></search><sort><creationdate>20150610</creationdate><title>High-resolution multi-wavelength laser intensity distribution detector</title><author>PANG MIAO ; GAO XUEYAN ; HU XIAOYANG ; ZHOU WENCHAO ; ZHOU SHAN ; ZHANG WEI ; HE JUNZHANG ; YUAN XUEWEN</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_CN204389019UU3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2015</creationdate><topic>COLORIMETRY</topic><topic>MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT,POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED,VISIBLE OR ULTRA-VIOLET LIGHT</topic><topic>MEASURING</topic><topic>PHYSICS</topic><topic>RADIATION PYROMETRY</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>PANG MIAO</creatorcontrib><creatorcontrib>GAO XUEYAN</creatorcontrib><creatorcontrib>HU XIAOYANG</creatorcontrib><creatorcontrib>ZHOU WENCHAO</creatorcontrib><creatorcontrib>ZHOU SHAN</creatorcontrib><creatorcontrib>ZHANG WEI</creatorcontrib><creatorcontrib>HE JUNZHANG</creatorcontrib><creatorcontrib>YUAN XUEWEN</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>PANG MIAO</au><au>GAO XUEYAN</au><au>HU XIAOYANG</au><au>ZHOU WENCHAO</au><au>ZHOU SHAN</au><au>ZHANG WEI</au><au>HE JUNZHANG</au><au>YUAN XUEWEN</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>High-resolution multi-wavelength laser intensity distribution detector</title><date>2015-06-10</date><risdate>2015</risdate><abstract>The utility model relates to a high-resolution multi-wavelength laser intensity distribution detector. The detector comprises a sampling target surface, a reflector, a narrowband optical filter, a light spot collection device, a network switch and a data processing device. The measuring method is as follows: the sampling target surface carries out diffuse transmission sampling of incident laser, an image collection device carries out image of a sampled light spot through the reflector, then the light spot data is sent to the data processing device through the network switch, the data processing device carries out shape distortion correction and intensity distortion correction of the light spot, and then carries out analysis and processing, and the laser intensity distribution parameter is obtained through calculation. The high-resolution multi-wavelength laser intensity distribution detector can carry out high-resolution and accurate quantitative measurement of multi-wavelength laser intensity distribution at the same time.</abstract><oa>free_for_read</oa></addata></record> |
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subjects | COLORIMETRY MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT,POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED,VISIBLE OR ULTRA-VIOLET LIGHT MEASURING PHYSICS RADIATION PYROMETRY TESTING |
title | High-resolution multi-wavelength laser intensity distribution detector |
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