ATP tester
The embodiment of the utility model provides an ATP tester which includes a test board, and a power interface, an input interface, and an output interface, which are arranged on the test board. A plurality of control circuits are arranged on the test board. The plurality of control circuits are conn...
Gespeichert in:
Hauptverfasser: | , , |
---|---|
Format: | Patent |
Sprache: | eng |
Schlagworte: | |
Online-Zugang: | Volltext bestellen |
Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
container_end_page | |
---|---|
container_issue | |
container_start_page | |
container_title | |
container_volume | |
creator | BING CHENYANG LYU CHUNRONG HOU XIAOBAO |
description | The embodiment of the utility model provides an ATP tester which includes a test board, and a power interface, an input interface, and an output interface, which are arranged on the test board. A plurality of control circuits are arranged on the test board. The plurality of control circuits are connected in parallel so that a plurality of independent detection lines are formed to respectively detect corresponding line interface circuits so as to ensure accuracy of detection result and reduce detection period. |
format | Patent |
fullrecord | <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_CN204287365UU</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>CN204287365UU</sourcerecordid><originalsourceid>FETCH-epo_espacenet_CN204287365UU3</originalsourceid><addsrcrecordid>eNrjZOByDAlQKEktLkkt4mFgTUvMKU7lhdLcDEpuriHOHrqpBfnxqcUFicmpeakl8c5-RgYmRhbmxmamoaHGRCkCANsxHWs</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>ATP tester</title><source>esp@cenet</source><creator>BING CHENYANG ; LYU CHUNRONG ; HOU XIAOBAO</creator><creatorcontrib>BING CHENYANG ; LYU CHUNRONG ; HOU XIAOBAO</creatorcontrib><description>The embodiment of the utility model provides an ATP tester which includes a test board, and a power interface, an input interface, and an output interface, which are arranged on the test board. A plurality of control circuits are arranged on the test board. The plurality of control circuits are connected in parallel so that a plurality of independent detection lines are formed to respectively detect corresponding line interface circuits so as to ensure accuracy of detection result and reduce detection period.</description><language>eng</language><subject>MEASURING ; MEASURING ELECTRIC VARIABLES ; MEASURING MAGNETIC VARIABLES ; PHYSICS ; TESTING ; TESTING STATIC OR DYNAMIC BALANCE OF MACHINES ORSTRUCTURES ; TESTING STRUCTURES OR APPARATUS NOT OTHERWISE PROVIDED FOR</subject><creationdate>2015</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20150422&DB=EPODOC&CC=CN&NR=204287365U$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25563,76318</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20150422&DB=EPODOC&CC=CN&NR=204287365U$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>BING CHENYANG</creatorcontrib><creatorcontrib>LYU CHUNRONG</creatorcontrib><creatorcontrib>HOU XIAOBAO</creatorcontrib><title>ATP tester</title><description>The embodiment of the utility model provides an ATP tester which includes a test board, and a power interface, an input interface, and an output interface, which are arranged on the test board. A plurality of control circuits are arranged on the test board. The plurality of control circuits are connected in parallel so that a plurality of independent detection lines are formed to respectively detect corresponding line interface circuits so as to ensure accuracy of detection result and reduce detection period.</description><subject>MEASURING</subject><subject>MEASURING ELECTRIC VARIABLES</subject><subject>MEASURING MAGNETIC VARIABLES</subject><subject>PHYSICS</subject><subject>TESTING</subject><subject>TESTING STATIC OR DYNAMIC BALANCE OF MACHINES ORSTRUCTURES</subject><subject>TESTING STRUCTURES OR APPARATUS NOT OTHERWISE PROVIDED FOR</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2015</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZOByDAlQKEktLkkt4mFgTUvMKU7lhdLcDEpuriHOHrqpBfnxqcUFicmpeakl8c5-RgYmRhbmxmamoaHGRCkCANsxHWs</recordid><startdate>20150422</startdate><enddate>20150422</enddate><creator>BING CHENYANG</creator><creator>LYU CHUNRONG</creator><creator>HOU XIAOBAO</creator><scope>EVB</scope></search><sort><creationdate>20150422</creationdate><title>ATP tester</title><author>BING CHENYANG ; LYU CHUNRONG ; HOU XIAOBAO</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_CN204287365UU3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2015</creationdate><topic>MEASURING</topic><topic>MEASURING ELECTRIC VARIABLES</topic><topic>MEASURING MAGNETIC VARIABLES</topic><topic>PHYSICS</topic><topic>TESTING</topic><topic>TESTING STATIC OR DYNAMIC BALANCE OF MACHINES ORSTRUCTURES</topic><topic>TESTING STRUCTURES OR APPARATUS NOT OTHERWISE PROVIDED FOR</topic><toplevel>online_resources</toplevel><creatorcontrib>BING CHENYANG</creatorcontrib><creatorcontrib>LYU CHUNRONG</creatorcontrib><creatorcontrib>HOU XIAOBAO</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>BING CHENYANG</au><au>LYU CHUNRONG</au><au>HOU XIAOBAO</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>ATP tester</title><date>2015-04-22</date><risdate>2015</risdate><abstract>The embodiment of the utility model provides an ATP tester which includes a test board, and a power interface, an input interface, and an output interface, which are arranged on the test board. A plurality of control circuits are arranged on the test board. The plurality of control circuits are connected in parallel so that a plurality of independent detection lines are formed to respectively detect corresponding line interface circuits so as to ensure accuracy of detection result and reduce detection period.</abstract><oa>free_for_read</oa></addata></record> |
fulltext | fulltext_linktorsrc |
identifier | |
ispartof | |
issn | |
language | eng |
recordid | cdi_epo_espacenet_CN204287365UU |
source | esp@cenet |
subjects | MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS TESTING TESTING STATIC OR DYNAMIC BALANCE OF MACHINES ORSTRUCTURES TESTING STRUCTURES OR APPARATUS NOT OTHERWISE PROVIDED FOR |
title | ATP tester |
url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-13T08%3A57%3A15IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=BING%20CHENYANG&rft.date=2015-04-22&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3ECN204287365UU%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true |