Multi-resistor testing device

A multi-resistor testing device is provided with a horizontal objective table, a vertical support, a detection unit, a sliding guide rail and a vertical driving mechanism, wherein the horizontal objective table is arranged vertical to the vertical support, the detection unit is arranged over the horizontal objective table, one end of the sliding guide rail is fixed to the horizontal objective table, the sliding guide rail penetrates through the detection unit and is movably assembled in the detection unit, and the vertical driving mechanism is fixed to the vertical support and drives the detection unit to move vertically. The detection unit is provided with a substrate and multiple probes assembled on the substrate, the end, exposed out of the substrate, of each substrate makes contact with a resistor of a substrate to be tested, and the other end of the probe is connected with the input end of a detection circuit. The multi-resistor testing device can simultaneously detect multiple resistors via the probes, and is characterized by simple structure, convenient detection, high detection efficiency and accurate results.