Test wire
The utility model relates to a circuit detection tool, and especially relates to a test wire. A test wire, which cannot ensure good contact of a contact with a tested device and good conductivity in the prior art, is complex in structure, and high in manufacture cost. According to the test wire prov...
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| creator | CHEN XINHE YE JUWEI WENG JUNMEI XU FALIN XU QIAO TAN QINGHUAN HUANG QIANG |
| description | The utility model relates to a circuit detection tool, and especially relates to a test wire. A test wire, which cannot ensure good contact of a contact with a tested device and good conductivity in the prior art, is complex in structure, and high in manufacture cost. According to the test wire provided by the utility model, the contact is provided with an elastic piece which enables the contact to be clamped tightly. In use, the contact is provided with the elastic piece which enables the contact to be clamped tightly, thereby enabling the contact to well contact with the tested device and ensuring good conductivity, so as to detect the tested device. The contact is provided with the elastic piece, so the good contact of the contact with the tested device and good conductivity can still be ensured even if the contact is worn after long-time application. According to the above technical scheme of the utility model, only the contact is provided with the elastic piece which is convenient for tightly clamping th |
| format | Patent |
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A test wire, which cannot ensure good contact of a contact with a tested device and good conductivity in the prior art, is complex in structure, and high in manufacture cost. According to the test wire provided by the utility model, the contact is provided with an elastic piece which enables the contact to be clamped tightly. In use, the contact is provided with the elastic piece which enables the contact to be clamped tightly, thereby enabling the contact to well contact with the tested device and ensuring good conductivity, so as to detect the tested device. The contact is provided with the elastic piece, so the good contact of the contact with the tested device and good conductivity can still be ensured even if the contact is worn after long-time application. According to the above technical scheme of the utility model, only the contact is provided with the elastic piece which is convenient for tightly clamping th</description><language>chi ; eng</language><subject>MEASURING ; MEASURING ELECTRIC VARIABLES ; MEASURING MAGNETIC VARIABLES ; PHYSICS ; TESTING</subject><creationdate>2013</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20131218&DB=EPODOC&CC=CN&NR=203350299U$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25543,76294</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20131218&DB=EPODOC&CC=CN&NR=203350299U$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>CHEN XINHE</creatorcontrib><creatorcontrib>YE JUWEI</creatorcontrib><creatorcontrib>WENG JUNMEI</creatorcontrib><creatorcontrib>XU FALIN</creatorcontrib><creatorcontrib>XU QIAO</creatorcontrib><creatorcontrib>TAN QINGHUAN</creatorcontrib><creatorcontrib>HUANG QIANG</creatorcontrib><title>Test wire</title><description>The utility model relates to a circuit detection tool, and especially relates to a test wire. A test wire, which cannot ensure good contact of a contact with a tested device and good conductivity in the prior art, is complex in structure, and high in manufacture cost. According to the test wire provided by the utility model, the contact is provided with an elastic piece which enables the contact to be clamped tightly. In use, the contact is provided with the elastic piece which enables the contact to be clamped tightly, thereby enabling the contact to well contact with the tested device and ensuring good conductivity, so as to detect the tested device. The contact is provided with the elastic piece, so the good contact of the contact with the tested device and good conductivity can still be ensured even if the contact is worn after long-time application. According to the above technical scheme of the utility model, only the contact is provided with the elastic piece which is convenient for tightly clamping th</description><subject>MEASURING</subject><subject>MEASURING ELECTRIC VARIABLES</subject><subject>MEASURING MAGNETIC VARIABLES</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2013</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZOAMSS0uUSjPLErlYWBNS8wpTuWF0twMSm6uIc4euqkF-fGpxQWJyal5qSXxzn5GBsbGpgZGlpahocZEKQIAy8cdPQ</recordid><startdate>20131218</startdate><enddate>20131218</enddate><creator>CHEN XINHE</creator><creator>YE JUWEI</creator><creator>WENG JUNMEI</creator><creator>XU FALIN</creator><creator>XU QIAO</creator><creator>TAN QINGHUAN</creator><creator>HUANG QIANG</creator><scope>EVB</scope></search><sort><creationdate>20131218</creationdate><title>Test wire</title><author>CHEN XINHE ; YE JUWEI ; WENG JUNMEI ; XU FALIN ; XU QIAO ; TAN QINGHUAN ; HUANG QIANG</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_CN203350299UU3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>chi ; eng</language><creationdate>2013</creationdate><topic>MEASURING</topic><topic>MEASURING ELECTRIC VARIABLES</topic><topic>MEASURING MAGNETIC VARIABLES</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>CHEN XINHE</creatorcontrib><creatorcontrib>YE JUWEI</creatorcontrib><creatorcontrib>WENG JUNMEI</creatorcontrib><creatorcontrib>XU FALIN</creatorcontrib><creatorcontrib>XU QIAO</creatorcontrib><creatorcontrib>TAN QINGHUAN</creatorcontrib><creatorcontrib>HUANG QIANG</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>CHEN XINHE</au><au>YE JUWEI</au><au>WENG JUNMEI</au><au>XU FALIN</au><au>XU QIAO</au><au>TAN QINGHUAN</au><au>HUANG QIANG</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Test wire</title><date>2013-12-18</date><risdate>2013</risdate><abstract>The utility model relates to a circuit detection tool, and especially relates to a test wire. A test wire, which cannot ensure good contact of a contact with a tested device and good conductivity in the prior art, is complex in structure, and high in manufacture cost. According to the test wire provided by the utility model, the contact is provided with an elastic piece which enables the contact to be clamped tightly. In use, the contact is provided with the elastic piece which enables the contact to be clamped tightly, thereby enabling the contact to well contact with the tested device and ensuring good conductivity, so as to detect the tested device. The contact is provided with the elastic piece, so the good contact of the contact with the tested device and good conductivity can still be ensured even if the contact is worn after long-time application. According to the above technical scheme of the utility model, only the contact is provided with the elastic piece which is convenient for tightly clamping th</abstract><oa>free_for_read</oa></addata></record> |
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| language | chi ; eng |
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| subjects | MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS TESTING |
| title | Test wire |
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