OTP burning and upper/lower-limit voltage detecting system of liquid crystal display module

OTP burning and upper/lower-limit voltage detecting system of liquid crystal display module

An OTP burning and upper/lower-limit voltage detecting system of a liquid crystal display module comprises a multi-channel power conversion circuit, an MCU control system, a relay switching circuit controlled by the MCU control system, and a to-be-tested liquid crystal display module testing slot. T...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Hauptverfasser: BEI SHIPENG, ZHANG BENZHEN, WU DI, SHI JIN, XING SHUHUA, LIANG BO
Format: Patent
Sprache:chi ; eng
Schlagworte:
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
container_end_page
container_issue
container_start_page
container_title
container_volume
creator BEI SHIPENG
ZHANG BENZHEN
WU DI
SHI JIN
XING SHUHUA
LIANG BO
description An OTP burning and upper/lower-limit voltage detecting system of a liquid crystal display module comprises a multi-channel power conversion circuit, an MCU control system, a relay switching circuit controlled by the MCU control system, and a to-be-tested liquid crystal display module testing slot. The multi-channel power conversion circuit provides a back-light power supply, a lower-limit working voltage, a normal working voltage, an upper-limit working voltage, an OTP burning voltage and a relay working voltage; and one part of I/O ports inside the MCU control system is used for controlling the relay switching circuit, and the other part is used for communicating with tested liquid crystal display module components in the to-be-tested liquid crystal display module testing slot. Compared with the prior art, the system has the advantage that the system not only can detect performance parameters of the liquid crystal display module under a standard working voltage, but also can detect performance parameters of
format Patent
fullrecord <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_CN203084104UU</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>CN203084104UU</sourcerecordid><originalsourceid>FETCH-epo_espacenet_CN203084104UU3</originalsourceid><addsrcrecordid>eNqNyrsKwkAQQNE0FqL-w2AfXE0K-6BYqUVSWYR1dxIGZh_uQ8nfq-AHWF24nHlxu7RXuOdgyY4grYbsPYYNuxeGkslQgqfjJEcEjQlV-ro4xYQG3ABMj0waVPgcyaApepYTGKcz47KYDZIjrn5dFOvjoW1OJXrXY_RSocXUN-edqMS-3oq666q_0Bv4yjx2</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>OTP burning and upper/lower-limit voltage detecting system of liquid crystal display module</title><source>esp@cenet</source><creator>BEI SHIPENG ; ZHANG BENZHEN ; WU DI ; SHI JIN ; XING SHUHUA ; LIANG BO</creator><creatorcontrib>BEI SHIPENG ; ZHANG BENZHEN ; WU DI ; SHI JIN ; XING SHUHUA ; LIANG BO</creatorcontrib><description>An OTP burning and upper/lower-limit voltage detecting system of a liquid crystal display module comprises a multi-channel power conversion circuit, an MCU control system, a relay switching circuit controlled by the MCU control system, and a to-be-tested liquid crystal display module testing slot. The multi-channel power conversion circuit provides a back-light power supply, a lower-limit working voltage, a normal working voltage, an upper-limit working voltage, an OTP burning voltage and a relay working voltage; and one part of I/O ports inside the MCU control system is used for controlling the relay switching circuit, and the other part is used for communicating with tested liquid crystal display module components in the to-be-tested liquid crystal display module testing slot. Compared with the prior art, the system has the advantage that the system not only can detect performance parameters of the liquid crystal display module under a standard working voltage, but also can detect performance parameters of</description><language>chi ; eng</language><subject>MEASURING ; MEASURING ELECTRIC VARIABLES ; MEASURING MAGNETIC VARIABLES ; PHYSICS ; TESTING</subject><creationdate>2013</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20130724&amp;DB=EPODOC&amp;CC=CN&amp;NR=203084104U$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25562,76317</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20130724&amp;DB=EPODOC&amp;CC=CN&amp;NR=203084104U$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>BEI SHIPENG</creatorcontrib><creatorcontrib>ZHANG BENZHEN</creatorcontrib><creatorcontrib>WU DI</creatorcontrib><creatorcontrib>SHI JIN</creatorcontrib><creatorcontrib>XING SHUHUA</creatorcontrib><creatorcontrib>LIANG BO</creatorcontrib><title>OTP burning and upper/lower-limit voltage detecting system of liquid crystal display module</title><description>An OTP burning and upper/lower-limit voltage detecting system of a liquid crystal display module comprises a multi-channel power conversion circuit, an MCU control system, a relay switching circuit controlled by the MCU control system, and a to-be-tested liquid crystal display module testing slot. The multi-channel power conversion circuit provides a back-light power supply, a lower-limit working voltage, a normal working voltage, an upper-limit working voltage, an OTP burning voltage and a relay working voltage; and one part of I/O ports inside the MCU control system is used for controlling the relay switching circuit, and the other part is used for communicating with tested liquid crystal display module components in the to-be-tested liquid crystal display module testing slot. Compared with the prior art, the system has the advantage that the system not only can detect performance parameters of the liquid crystal display module under a standard working voltage, but also can detect performance parameters of</description><subject>MEASURING</subject><subject>MEASURING ELECTRIC VARIABLES</subject><subject>MEASURING MAGNETIC VARIABLES</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2013</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNqNyrsKwkAQQNE0FqL-w2AfXE0K-6BYqUVSWYR1dxIGZh_uQ8nfq-AHWF24nHlxu7RXuOdgyY4grYbsPYYNuxeGkslQgqfjJEcEjQlV-ro4xYQG3ABMj0waVPgcyaApepYTGKcz47KYDZIjrn5dFOvjoW1OJXrXY_RSocXUN-edqMS-3oq666q_0Bv4yjx2</recordid><startdate>20130724</startdate><enddate>20130724</enddate><creator>BEI SHIPENG</creator><creator>ZHANG BENZHEN</creator><creator>WU DI</creator><creator>SHI JIN</creator><creator>XING SHUHUA</creator><creator>LIANG BO</creator><scope>EVB</scope></search><sort><creationdate>20130724</creationdate><title>OTP burning and upper/lower-limit voltage detecting system of liquid crystal display module</title><author>BEI SHIPENG ; ZHANG BENZHEN ; WU DI ; SHI JIN ; XING SHUHUA ; LIANG BO</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_CN203084104UU3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>chi ; eng</language><creationdate>2013</creationdate><topic>MEASURING</topic><topic>MEASURING ELECTRIC VARIABLES</topic><topic>MEASURING MAGNETIC VARIABLES</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>BEI SHIPENG</creatorcontrib><creatorcontrib>ZHANG BENZHEN</creatorcontrib><creatorcontrib>WU DI</creatorcontrib><creatorcontrib>SHI JIN</creatorcontrib><creatorcontrib>XING SHUHUA</creatorcontrib><creatorcontrib>LIANG BO</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>BEI SHIPENG</au><au>ZHANG BENZHEN</au><au>WU DI</au><au>SHI JIN</au><au>XING SHUHUA</au><au>LIANG BO</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>OTP burning and upper/lower-limit voltage detecting system of liquid crystal display module</title><date>2013-07-24</date><risdate>2013</risdate><abstract>An OTP burning and upper/lower-limit voltage detecting system of a liquid crystal display module comprises a multi-channel power conversion circuit, an MCU control system, a relay switching circuit controlled by the MCU control system, and a to-be-tested liquid crystal display module testing slot. The multi-channel power conversion circuit provides a back-light power supply, a lower-limit working voltage, a normal working voltage, an upper-limit working voltage, an OTP burning voltage and a relay working voltage; and one part of I/O ports inside the MCU control system is used for controlling the relay switching circuit, and the other part is used for communicating with tested liquid crystal display module components in the to-be-tested liquid crystal display module testing slot. Compared with the prior art, the system has the advantage that the system not only can detect performance parameters of the liquid crystal display module under a standard working voltage, but also can detect performance parameters of</abstract><oa>free_for_read</oa></addata></record>
fulltext fulltext_linktorsrc
identifier
ispartof
issn
language chi ; eng
recordid cdi_epo_espacenet_CN203084104UU
source esp@cenet
subjects MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
title OTP burning and upper/lower-limit voltage detecting system of liquid crystal display module
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-09T14%3A51%3A24IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=BEI%20SHIPENG&rft.date=2013-07-24&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3ECN203084104UU%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true