Method for examining and comparing resource information in bottom of computer system
The invention relates to a substratum resource information examining and comparing method in computer system, it includes the reading process of input parameter distribution information, the ending judging process of distribution information after reading, the extraction of relative system substratu...
Gespeichert in:
| 1. Verfasser: | |
|---|---|
| Format: | Patent |
| Sprache: | eng |
| Schlagworte: | |
| Online-Zugang: | Volltext bestellen |
| Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
Schreiben Sie den ersten Kommentar!