Measuring clock jitter

The invention provides a technique of correcting time data based on a clock signal affected by jitter. The error due to jitter in a time measurement of an event in the clock signal (17) is determined at the time of the event or as an average over a number of events. A measurement is made of a time d...

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1. Verfasser: LEITCH ADAM S
Format: Patent
Sprache:eng
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