Detecting system and method
This invention discloses a test system including a being tested module, a by-pass module and a test module, in which, connection points A and B are set on the being tested module to be connected to turn on the being test module, connection points A1 and A2 are set on the by-pass module to be connect...
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creator | KANGJI,CHU CUI |
description | This invention discloses a test system including a being tested module, a by-pass module and a test module, in which, connection points A and B are set on the being tested module to be connected to turn on the being test module, connection points A1 and A2 are set on the by-pass module to be connected by a connecting path and a control switch is serial to said connecting path, in which, connecting point A1 is connected with the connection point A of the being tested module, connection point B1 is connected with the connection point B of the being tested module, the test module is serial in the supply line of the being tested module to test the current flowing through the being tested module. In testing, the by-pass module is turned on to test the current flowing through the being tested module, thus, the test time is reduced greatly, besides, this invention also discloses a test method. |
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In testing, the by-pass module is turned on to test the current flowing through the being tested module, thus, the test time is reduced greatly, besides, this invention also discloses a test method.</description><language>eng</language><subject>MEASURING ; MEASURING ELECTRIC VARIABLES ; MEASURING MAGNETIC VARIABLES ; PHYSICS ; TESTING ; TESTING STATIC OR DYNAMIC BALANCE OF MACHINES ORSTRUCTURES ; TESTING STRUCTURES OR APPARATUS NOT OTHERWISE PROVIDED FOR</subject><creationdate>2006</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20061108&DB=EPODOC&CC=CN&NR=1858573A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25563,76318</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20061108&DB=EPODOC&CC=CN&NR=1858573A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>KANGJI,CHU CUI</creatorcontrib><title>Detecting system and method</title><description>This invention discloses a test system including a being tested module, a by-pass module and a test module, in which, connection points A and B are set on the being tested module to be connected to turn on the being test module, connection points A1 and A2 are set on the by-pass module to be connected by a connecting path and a control switch is serial to said connecting path, in which, connecting point A1 is connected with the connection point A of the being tested module, connection point B1 is connected with the connection point B of the being tested module, the test module is serial in the supply line of the being tested module to test the current flowing through the being tested module. In testing, the by-pass module is turned on to test the current flowing through the being tested module, thus, the test time is reduced greatly, besides, this invention also discloses a test method.</description><subject>MEASURING</subject><subject>MEASURING ELECTRIC VARIABLES</subject><subject>MEASURING MAGNETIC VARIABLES</subject><subject>PHYSICS</subject><subject>TESTING</subject><subject>TESTING STATIC OR DYNAMIC BALANCE OF MACHINES ORSTRUCTURES</subject><subject>TESTING STRUCTURES OR APPARATUS NOT OTHERWISE PROVIDED FOR</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2006</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZJB2SS1JTS7JzEtXKK4sLknNVUjMS1HITS3JyE_hYWBNS8wpTuWF0twM8m6uIc4euqkF-fGpxQWJyal5qSXxzn6GFqYWpubGjsaEVQAA6-wimA</recordid><startdate>20061108</startdate><enddate>20061108</enddate><creator>KANGJI,CHU CUI</creator><scope>EVB</scope></search><sort><creationdate>20061108</creationdate><title>Detecting system and method</title><author>KANGJI,CHU CUI</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_CN1858573A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2006</creationdate><topic>MEASURING</topic><topic>MEASURING ELECTRIC VARIABLES</topic><topic>MEASURING MAGNETIC VARIABLES</topic><topic>PHYSICS</topic><topic>TESTING</topic><topic>TESTING STATIC OR DYNAMIC BALANCE OF MACHINES ORSTRUCTURES</topic><topic>TESTING STRUCTURES OR APPARATUS NOT OTHERWISE PROVIDED FOR</topic><toplevel>online_resources</toplevel><creatorcontrib>KANGJI,CHU CUI</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>KANGJI,CHU CUI</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Detecting system and method</title><date>2006-11-08</date><risdate>2006</risdate><abstract>This invention discloses a test system including a being tested module, a by-pass module and a test module, in which, connection points A and B are set on the being tested module to be connected to turn on the being test module, connection points A1 and A2 are set on the by-pass module to be connected by a connecting path and a control switch is serial to said connecting path, in which, connecting point A1 is connected with the connection point A of the being tested module, connection point B1 is connected with the connection point B of the being tested module, the test module is serial in the supply line of the being tested module to test the current flowing through the being tested module. In testing, the by-pass module is turned on to test the current flowing through the being tested module, thus, the test time is reduced greatly, besides, this invention also discloses a test method.</abstract><oa>free_for_read</oa></addata></record> |
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subjects | MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS TESTING TESTING STATIC OR DYNAMIC BALANCE OF MACHINES ORSTRUCTURES TESTING STRUCTURES OR APPARATUS NOT OTHERWISE PROVIDED FOR |
title | Detecting system and method |
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