Quality management system of print substrate
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| creator | KIYOMI ATSUSHI,MORIHIRO ITARU,KISHIMOTO MAKOTO,HIRAOKA YOSHIAKI,NAKADA KOSHIRO |
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| fullrecord | <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_CN1816275A</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>CN1816275A</sourcerecordid><originalsourceid>FETCH-epo_espacenet_CN1816275A3</originalsourceid><addsrcrecordid>eNrjZNAJLE3MySypVMhNzEtMT81NzStRKK4sLknNVchPUygoygTxS5OKS4oSS1J5GFjTEnOKU3mhNDeDvJtriLOHbmpBfnxqcUFicmpeakm8s5-hhaGZkbmpozFhFQAkiSl1</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>Quality management system of print substrate</title><source>esp@cenet</source><creator>KIYOMI ATSUSHI,MORIHIRO ITARU,KISHIMOTO MAKOTO,HIRAOKA YOSHIAKI,NAKADA KOSHIRO</creator><creatorcontrib>KIYOMI ATSUSHI,MORIHIRO ITARU,KISHIMOTO MAKOTO,HIRAOKA YOSHIAKI,NAKADA KOSHIRO</creatorcontrib><language>eng</language><subject>CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS ; ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR ; ELECTRICITY ; INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES ; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS ; MEASURING ; PHYSICS ; PRINTED CIRCUITS ; TESTING</subject><creationdate>2006</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20060809&DB=EPODOC&CC=CN&NR=1816275A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,777,882,25545,76296</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20060809&DB=EPODOC&CC=CN&NR=1816275A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>KIYOMI ATSUSHI,MORIHIRO ITARU,KISHIMOTO MAKOTO,HIRAOKA YOSHIAKI,NAKADA KOSHIRO</creatorcontrib><title>Quality management system of print substrate</title><subject>CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS</subject><subject>ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR</subject><subject>ELECTRICITY</subject><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</subject><subject>MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS</subject><subject>MEASURING</subject><subject>PHYSICS</subject><subject>PRINTED CIRCUITS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2006</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZNAJLE3MySypVMhNzEtMT81NzStRKK4sLknNVchPUygoygTxS5OKS4oSS1J5GFjTEnOKU3mhNDeDvJtriLOHbmpBfnxqcUFicmpeakm8s5-hhaGZkbmpozFhFQAkiSl1</recordid><startdate>20060809</startdate><enddate>20060809</enddate><creator>KIYOMI ATSUSHI,MORIHIRO ITARU,KISHIMOTO MAKOTO,HIRAOKA YOSHIAKI,NAKADA KOSHIRO</creator><scope>EVB</scope></search><sort><creationdate>20060809</creationdate><title>Quality management system of print substrate</title><author>KIYOMI ATSUSHI,MORIHIRO ITARU,KISHIMOTO MAKOTO,HIRAOKA YOSHIAKI,NAKADA KOSHIRO</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_CN1816275A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2006</creationdate><topic>CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS</topic><topic>ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR</topic><topic>ELECTRICITY</topic><topic>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</topic><topic>MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS</topic><topic>MEASURING</topic><topic>PHYSICS</topic><topic>PRINTED CIRCUITS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>KIYOMI ATSUSHI,MORIHIRO ITARU,KISHIMOTO MAKOTO,HIRAOKA YOSHIAKI,NAKADA KOSHIRO</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>KIYOMI ATSUSHI,MORIHIRO ITARU,KISHIMOTO MAKOTO,HIRAOKA YOSHIAKI,NAKADA KOSHIRO</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Quality management system of print substrate</title><date>2006-08-09</date><risdate>2006</risdate><oa>free_for_read</oa></addata></record> |
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| language | eng |
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| subjects | CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR ELECTRICITY INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS MEASURING PHYSICS PRINTED CIRCUITS TESTING |
| title | Quality management system of print substrate |
| url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-18T12%3A52%3A53IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=KIYOMI%20ATSUSHI,MORIHIRO%20ITARU,KISHIMOTO%20MAKOTO,HIRAOKA%20YOSHIAKI,NAKADA%20KOSHIRO&rft.date=2006-08-09&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3ECN1816275A%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true |