Method of determining at least one marking element on a substrate

A method of establishing at least one marking element on a substrate ( 1 ). By means of design data of the substrate ( 1 ) at least a fictitious marking element ( 5 ) on the substrate ( 1 ) is determined. The fictitious marking element ( 5 ) should then be unique for a predefined area of the substra...

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1. Verfasser: VULLINGS HENRICUS J. L. M.,VAN OOSTERHOUT JACOBUSJ. G. M.,HORIJON JOSEPH L
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creator VULLINGS HENRICUS J. L. M.,VAN OOSTERHOUT JACOBUSJ. G. M.,HORIJON JOSEPH L
description A method of establishing at least one marking element on a substrate ( 1 ). By means of design data of the substrate ( 1 ) at least a fictitious marking element ( 5 ) on the substrate ( 1 ) is determined. The fictitious marking element ( 5 ) should then be unique for a predefined area of the substrate ( 1 ). The fictitious marking element is obtained by selecting at least two transitions ( 6, 7, 17, 18 ) of at least one element on the substrate while the transitions ( 6, 7, 17, 18 ) enclose an angle to each other.
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fullrecord <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_CN1765167A</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>CN1765167A</sourcerecordid><originalsourceid>FETCH-epo_espacenet_CN1765167A3</originalsourceid><addsrcrecordid>eNrjZHD0TS3JyE9RyE9TSEktSS3KzczLzEtXSCxRyElNLC5RyM9LVchNLMoGCabmpOam5oHEFBIVikuTikuKEktSeRhY0xJzilN5oTQ3g7yba4izh25qQX58anFBYnJqXmpJvLOfobmZqaGZuaMxYRUAGiwwkA</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>Method of determining at least one marking element on a substrate</title><source>esp@cenet</source><creator>VULLINGS HENRICUS J. L. M.,VAN OOSTERHOUT JACOBUSJ. G. M.,HORIJON JOSEPH L</creator><creatorcontrib>VULLINGS HENRICUS J. L. M.,VAN OOSTERHOUT JACOBUSJ. G. M.,HORIJON JOSEPH L</creatorcontrib><description>A method of establishing at least one marking element on a substrate ( 1 ). By means of design data of the substrate ( 1 ) at least a fictitious marking element ( 5 ) on the substrate ( 1 ) is determined. The fictitious marking element ( 5 ) should then be unique for a predefined area of the substrate ( 1 ). The fictitious marking element is obtained by selecting at least two transitions ( 6, 7, 17, 18 ) of at least one element on the substrate while the transitions ( 6, 7, 17, 18 ) enclose an angle to each other.</description><language>eng</language><subject>CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS ; ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR ; ELECTRICITY ; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS ; PRINTED CIRCUITS</subject><creationdate>2006</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20060426&amp;DB=EPODOC&amp;CC=CN&amp;NR=1765167A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25564,76547</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20060426&amp;DB=EPODOC&amp;CC=CN&amp;NR=1765167A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>VULLINGS HENRICUS J. L. M.,VAN OOSTERHOUT JACOBUSJ. G. M.,HORIJON JOSEPH L</creatorcontrib><title>Method of determining at least one marking element on a substrate</title><description>A method of establishing at least one marking element on a substrate ( 1 ). By means of design data of the substrate ( 1 ) at least a fictitious marking element ( 5 ) on the substrate ( 1 ) is determined. The fictitious marking element ( 5 ) should then be unique for a predefined area of the substrate ( 1 ). The fictitious marking element is obtained by selecting at least two transitions ( 6, 7, 17, 18 ) of at least one element on the substrate while the transitions ( 6, 7, 17, 18 ) enclose an angle to each other.</description><subject>CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS</subject><subject>ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR</subject><subject>ELECTRICITY</subject><subject>MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS</subject><subject>PRINTED CIRCUITS</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2006</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZHD0TS3JyE9RyE9TSEktSS3KzczLzEtXSCxRyElNLC5RyM9LVchNLMoGCabmpOam5oHEFBIVikuTikuKEktSeRhY0xJzilN5oTQ3g7yba4izh25qQX58anFBYnJqXmpJvLOfobmZqaGZuaMxYRUAGiwwkA</recordid><startdate>20060426</startdate><enddate>20060426</enddate><creator>VULLINGS HENRICUS J. L. M.,VAN OOSTERHOUT JACOBUSJ. G. M.,HORIJON JOSEPH L</creator><scope>EVB</scope></search><sort><creationdate>20060426</creationdate><title>Method of determining at least one marking element on a substrate</title><author>VULLINGS HENRICUS J. L. M.,VAN OOSTERHOUT JACOBUSJ. G. M.,HORIJON JOSEPH L</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_CN1765167A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2006</creationdate><topic>CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS</topic><topic>ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR</topic><topic>ELECTRICITY</topic><topic>MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS</topic><topic>PRINTED CIRCUITS</topic><toplevel>online_resources</toplevel><creatorcontrib>VULLINGS HENRICUS J. L. M.,VAN OOSTERHOUT JACOBUSJ. G. M.,HORIJON JOSEPH L</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>VULLINGS HENRICUS J. L. M.,VAN OOSTERHOUT JACOBUSJ. G. M.,HORIJON JOSEPH L</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Method of determining at least one marking element on a substrate</title><date>2006-04-26</date><risdate>2006</risdate><abstract>A method of establishing at least one marking element on a substrate ( 1 ). By means of design data of the substrate ( 1 ) at least a fictitious marking element ( 5 ) on the substrate ( 1 ) is determined. The fictitious marking element ( 5 ) should then be unique for a predefined area of the substrate ( 1 ). The fictitious marking element is obtained by selecting at least two transitions ( 6, 7, 17, 18 ) of at least one element on the substrate while the transitions ( 6, 7, 17, 18 ) enclose an angle to each other.</abstract><oa>free_for_read</oa></addata></record>
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subjects CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS
ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
ELECTRICITY
MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
PRINTED CIRCUITS
title Method of determining at least one marking element on a substrate
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2024-12-28T13%3A39%3A44IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=VULLINGS%20HENRICUS%20J.%20L.%20M.,VAN%20OOSTERHOUT%20JACOBUSJ.%20G.%20M.,HORIJON%20JOSEPH%20L&rft.date=2006-04-26&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3ECN1765167A%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true