Mask pattern for semiconductor device fabrication, method of forming the same, and method of fabricating finely patterned semiconductor device

Provided are a mask pattern including a self-assembled molecular layer, a method of forming the same, and a method of fabricating a semiconductor device. The mask pattern includes a resist pattern formed on a semiconductor substrate and the self-assembled molecular layer formed on at least a sidewal...

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Bibliographische Detailangaben
Hauptverfasser: HAH JUNG-HWAN, KIM HYUN-WOO, HATA MITSUHIRO, SUBRAMANYA KOLAKE M, YOON JIN-YOUNG, WOO SANG-GYUN
Format: Patent
Sprache:eng
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