Mfg method of contact hole and mfg method of semiconductor element

The method includes following structure: first, forming several conduction structures on substrate provided; next, carrying out step of ion implantation; then, carrying out heat process in order to form lining on sidewall of conduction structure and on surface of substructure uncovered by conduction...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Hauptverfasser: FANGYU YE, JUNZHE CHEN
Format: Patent
Sprache:eng
Schlagworte:
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!