Semiconductor chip and automatic test equipment using same

Pin slice circuitry used in automatic test equipment is disclosed. The pin slice circuitry includes a portion implemented using CMOS technology and a portion implemented using bipolar technology. The CMOS portion includes a plurality of timing generator circuits and sigma delta modulator circuitry,...

Ausführliche Beschreibung

Bibliographische Detailangaben

1. Verfasser:	EP. WALKER,RA. SARTSCHEV,JR M. RYAN
Format:	Patent
Sprache:	eng
Schlagworte:	BASIC ELECTRONIC CIRCUITRY CODE CONVERSION IN GENERAL CODING DECODING ELECTRICITY MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS TESTING
Online-Zugang:	Volltext bestellen
Tags:	Tag hinzufügen Keine Tags, Fügen Sie den ersten Tag hinzu!