Direct radiation and scattered radiation measurement method, device, equipment and storage medium
The invention relates to the technical field of radiation measurement, in particular to a direct radiation and scattered radiation measurement method, which comprises the following steps of: measuring a non-shadow region of a uniform ground feature by using an imaging spectrometer to obtain a first...
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| creator | CHEN MENG CHEN LUWEI LIN CHENYIN ZHOU JINGQIANG |
| description | The invention relates to the technical field of radiation measurement, in particular to a direct radiation and scattered radiation measurement method, which comprises the following steps of: measuring a non-shadow region of a uniform ground feature by using an imaging spectrometer to obtain a first voltage; measuring the uniform ground feature shadow area by using the imaging spectrometer to obtain a second voltage; calculating a shadow coefficient according to the first voltage and the second voltage; obtaining a horizontal total irradiance, and taking a product of the horizontal total irradiance and the shadow coefficient as a scattering irradiance; and the solar altitude is obtained, and the direct radiation quantity is calculated according to the solar altitude, the total horizontal irradiance and the scattering irradiance. It can be understood that the technical scheme shown by the invention is not limited by the installation environment, the measurement of the radiation component can be synchronously ca |
| format | Patent |
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| subjects | COLORIMETRY MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT,POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED,VISIBLE OR ULTRA-VIOLET LIGHT MEASURING PHYSICS RADIATION PYROMETRY TESTING |
| title | Direct radiation and scattered radiation measurement method, device, equipment and storage medium |
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